GB1530502A - Measurement of parameters of semiconductor material - Google Patents

Measurement of parameters of semiconductor material

Info

Publication number
GB1530502A
GB1530502A GB13948/76A GB1394876A GB1530502A GB 1530502 A GB1530502 A GB 1530502A GB 13948/76 A GB13948/76 A GB 13948/76A GB 1394876 A GB1394876 A GB 1394876A GB 1530502 A GB1530502 A GB 1530502A
Authority
GB
United Kingdom
Prior art keywords
semiconductor material
sample
photovoltage
composition
parameters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB13948/76A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Post Office
Original Assignee
Post Office
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Post Office filed Critical Post Office
Priority to GB13948/76A priority Critical patent/GB1530502A/en
Priority to SE7612517A priority patent/SE7612517L/xx
Priority to FR7634170A priority patent/FR2347675A2/fr
Publication of GB1530502A publication Critical patent/GB1530502A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electrolytic Production Of Non-Metals, Compounds, Apparatuses Therefor (AREA)
GB13948/76A 1976-04-06 1976-04-06 Measurement of parameters of semiconductor material Expired GB1530502A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GB13948/76A GB1530502A (en) 1976-04-06 1976-04-06 Measurement of parameters of semiconductor material
SE7612517A SE7612517L (sv) 1976-04-06 1976-11-10 Sett och arrangemang for metning av en forutbestemd parameter hos ett halvledarmaterial
FR7634170A FR2347675A2 (fr) 1976-04-06 1976-11-12 Dispositif et procede de mesure d'un parametre de materiau semi-conducteur

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB13948/76A GB1530502A (en) 1976-04-06 1976-04-06 Measurement of parameters of semiconductor material

Publications (1)

Publication Number Publication Date
GB1530502A true GB1530502A (en) 1978-11-01

Family

ID=10032269

Family Applications (1)

Application Number Title Priority Date Filing Date
GB13948/76A Expired GB1530502A (en) 1976-04-06 1976-04-06 Measurement of parameters of semiconductor material

Country Status (3)

Country Link
FR (1) FR2347675A2 (enExample)
GB (1) GB1530502A (enExample)
SE (1) SE7612517L (enExample)

Also Published As

Publication number Publication date
FR2347675B2 (enExample) 1982-10-08
SE7612517L (sv) 1977-10-07
FR2347675A2 (fr) 1977-11-04

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Legal Events

Date Code Title Description
PS Patent sealed
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PE20 Patent expired after termination of 20 years

Effective date: 19950513