GB1494118A - Producing charged particles - Google Patents
Producing charged particlesInfo
- Publication number
- GB1494118A GB1494118A GB4256075A GB4256075A GB1494118A GB 1494118 A GB1494118 A GB 1494118A GB 4256075 A GB4256075 A GB 4256075A GB 4256075 A GB4256075 A GB 4256075A GB 1494118 A GB1494118 A GB 1494118A
- Authority
- GB
- United Kingdom
- Prior art keywords
- aperture
- lens
- lens system
- electron
- diaphragm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1494118 Electron or ion beam apparatus LEYBOLD - HERAEUS - VERWALTUNG GmbH 16 Oct 1975 [20 Dec 1974] 42560/75 Heading H1D A lens system 1 for focusing charged particles includes at least one electrostatic or magnetostatic lens and a diaphragm stop 10 interrupting the direct line of sight along the optical axis 5 of the system and having an aperture 11 not intersected by the optical axis, the arrangement being such that an intermediate image 8 is formed substantially in the aperture 11. As shown, the lens system precedes a quadruple mass analyser 15 and receives ions from a bombardment sample 6. The aperture can be defined by a space between the diaphragm and a cylinder of the lens rather than an aperture in the diaphragm, Figs. 2 and 2a (not shown). In Fig. 4 (not shown) the lens system precedes an electron energy analyser. Fig. 5 (not shown) is an electron gun using such a lens system to focus an electron beam and excluding particles evaporated from the beam. Fig. 6 (not shown) is similar to Fig. 3 but only one lens is used and further focusing is achieved by the quadrupole analyser which receives the intermediate image at its entrance aperture.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19742460405 DE2460405A1 (en) | 1974-12-20 | 1974-12-20 | LENS SYSTEM FOR CHARGED PARTICLES |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1494118A true GB1494118A (en) | 1977-12-07 |
Family
ID=5933997
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB4256075A Expired GB1494118A (en) | 1974-12-20 | 1975-10-16 | Producing charged particles |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE2460405A1 (en) |
FR (1) | FR2295562A1 (en) |
GB (1) | GB1494118A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9204524D0 (en) * | 1992-03-03 | 1992-04-15 | Fisons Plc | Mass spectrometer |
-
1974
- 1974-12-20 DE DE19742460405 patent/DE2460405A1/en not_active Withdrawn
-
1975
- 1975-10-16 GB GB4256075A patent/GB1494118A/en not_active Expired
- 1975-12-17 FR FR7538722A patent/FR2295562A1/en active Granted
Also Published As
Publication number | Publication date |
---|---|
DE2460405A1 (en) | 1976-06-24 |
FR2295562B1 (en) | 1981-04-30 |
FR2295562A1 (en) | 1976-07-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |