GB9204524D0 - Mass spectrometer - Google Patents
Mass spectrometerInfo
- Publication number
- GB9204524D0 GB9204524D0 GB929204524A GB9204524A GB9204524D0 GB 9204524 D0 GB9204524 D0 GB 9204524D0 GB 929204524 A GB929204524 A GB 929204524A GB 9204524 A GB9204524 A GB 9204524A GB 9204524 D0 GB9204524 D0 GB 9204524D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- mass spectrometer
- spectrometer
- mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB929204524A GB9204524D0 (en) | 1992-03-03 | 1992-03-03 | Mass spectrometer |
PCT/GB1993/000434 WO1993018540A1 (en) | 1992-03-03 | 1993-03-03 | Mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB929204524A GB9204524D0 (en) | 1992-03-03 | 1992-03-03 | Mass spectrometer |
Publications (1)
Publication Number | Publication Date |
---|---|
GB9204524D0 true GB9204524D0 (en) | 1992-04-15 |
Family
ID=10711367
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB929204524A Pending GB9204524D0 (en) | 1992-03-03 | 1992-03-03 | Mass spectrometer |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB9204524D0 (en) |
WO (1) | WO1993018540A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8450681B2 (en) | 2011-06-08 | 2013-05-28 | Mks Instruments, Inc. | Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets |
US8796620B2 (en) | 2011-06-08 | 2014-08-05 | Mks Instruments, Inc. | Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens |
US8796638B2 (en) | 2011-06-08 | 2014-08-05 | Mks Instruments, Inc. | Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens |
US20240068989A1 (en) * | 2021-01-29 | 2024-02-29 | Atonarp Inc. | Gas analyzing apparatus and control method |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2255302C3 (en) * | 1972-11-11 | 1980-09-11 | Leybold-Heraeus Gmbh, 5000 Koeln | Equipment for secondary ion mass spectroscopy |
DE2460405A1 (en) * | 1974-12-20 | 1976-06-24 | Leybold Heraeus Gmbh & Co Kg | LENS SYSTEM FOR CHARGED PARTICLES |
JPH03194843A (en) * | 1989-12-25 | 1991-08-26 | Hitachi Ltd | Mass spectrometer for ultramicro elemental anlysis using plasma ion source |
-
1992
- 1992-03-03 GB GB929204524A patent/GB9204524D0/en active Pending
-
1993
- 1993-03-03 WO PCT/GB1993/000434 patent/WO1993018540A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO1993018540A1 (en) | 1993-09-16 |
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