GB1463795A - Local surface analysis - Google Patents

Local surface analysis

Info

Publication number
GB1463795A
GB1463795A GB2698375A GB2698375A GB1463795A GB 1463795 A GB1463795 A GB 1463795A GB 2698375 A GB2698375 A GB 2698375A GB 2698375 A GB2698375 A GB 2698375A GB 1463795 A GB1463795 A GB 1463795A
Authority
GB
United Kingdom
Prior art keywords
chamber
particles
surface analysis
rhenium
june
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2698375A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bpifrance Financement SA
Original Assignee
Agence National de Valorisation de la Recherche ANVAR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agence National de Valorisation de la Recherche ANVAR filed Critical Agence National de Valorisation de la Recherche ANVAR
Publication of GB1463795A publication Critical patent/GB1463795A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
GB2698375A 1974-06-28 1975-06-25 Local surface analysis Expired GB1463795A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7422722A FR2279093A1 (fr) 1974-06-28 1974-06-28 Procede et dispositif d'analyse chimique locale des solides

Publications (1)

Publication Number Publication Date
GB1463795A true GB1463795A (en) 1977-02-09

Family

ID=9140694

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2698375A Expired GB1463795A (en) 1974-06-28 1975-06-25 Local surface analysis

Country Status (6)

Country Link
US (1) US4001582A (enExample)
JP (1) JPS5812980B2 (enExample)
CH (1) CH591079A5 (enExample)
DE (1) DE2528596A1 (enExample)
FR (1) FR2279093A1 (enExample)
GB (1) GB1463795A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2157485A (en) * 1984-03-28 1985-10-23 Ion Tech Ltd A method of mass spectrometer analysis

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2739829C2 (de) * 1977-09-03 1986-04-10 Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München Anordnung zur Analyse einer Probenschicht durch Beschuß mit elektromagnetischer Strahlung
JP2640935B2 (ja) * 1983-12-23 1997-08-13 エス・ア−ル・アイ・インタ−ナシヨナル 表面の検査方法および装置
US6995847B2 (en) 2002-05-24 2006-02-07 Honeywell International Inc. Methods and systems for substrate surface evaluation
US20060026807A1 (en) * 2003-08-07 2006-02-09 Carnevali Jeffrey D Quick release mounting apparatus
US20100306941A1 (en) * 2009-06-03 2010-12-09 Hayco Manufacturing Limited Toothbrush

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1402020A (fr) * 1964-04-27 1965-06-11 Csf Perfectionnements aux sources d'ions
GB1210218A (en) * 1967-02-08 1970-10-28 Ass Elect Ind Improvements relating to ion probe target analysis
US3660655A (en) * 1969-09-08 1972-05-02 Ass Elect Ind Ion probe with means for mass analyzing neutral particles sputtered from a specimen
US3864575A (en) * 1970-07-25 1975-02-04 Nujeeb Hashmi Contact ionization ion source
US3770954A (en) * 1971-12-29 1973-11-06 Gen Electric Method and apparatus for analysis of impurities in air and other gases

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2157485A (en) * 1984-03-28 1985-10-23 Ion Tech Ltd A method of mass spectrometer analysis

Also Published As

Publication number Publication date
FR2279093B1 (enExample) 1979-08-03
FR2279093A1 (fr) 1976-02-13
JPS5124292A (en) 1976-02-27
DE2528596A1 (de) 1976-01-15
US4001582A (en) 1977-01-04
JPS5812980B2 (ja) 1983-03-11
CH591079A5 (enExample) 1977-08-31

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee