GB1448298A - Electron spectrometers for x-ray induced photo-electron spectroscopy - Google Patents
Electron spectrometers for x-ray induced photo-electron spectroscopyInfo
- Publication number
- GB1448298A GB1448298A GB2281374A GB2281374A GB1448298A GB 1448298 A GB1448298 A GB 1448298A GB 2281374 A GB2281374 A GB 2281374A GB 2281374 A GB2281374 A GB 2281374A GB 1448298 A GB1448298 A GB 1448298A
- Authority
- GB
- United Kingdom
- Prior art keywords
- electron
- chamber
- gas
- torr
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/484—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with spherical mirrors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
- H01J35/18—Windows
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Abstract
1448298 X-ray sources GCA CORP 22 May 1974 [23 May 1973] 22813/74 Heading H1D A source of X-rays for bombarding a sample 25 to produce photo-electrons which are subsequently analysed, comprises a chamber 37 into which a gas such as neon can be introduced and a second chamber 40 which is continuously evacuated and contains an electron gun 39 producing an electron beam, having an energy sufficient to eject electrons from a non-valence level in the gas, which beam passes through a fine aperture 43 into chamber 37 where impact with the gas produces X-rays which are transmitted through an aluminium or beryllium window 63. A continuously evacuated intermediate chamber 41 is optional. An electron trap and heat sink can be cooled by the flow of water through ports 51, 53. The pressures in chambers 37, 41, 40 can be respectively 10<SP>-2</SP> to 1 torr, 10<SP>-1</SP> and 10<SP>-5</SP> torr.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US363141A US3870882A (en) | 1973-05-23 | 1973-05-23 | Esca x-ray source |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1448298A true GB1448298A (en) | 1976-09-02 |
Family
ID=23428992
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2281374A Expired GB1448298A (en) | 1973-05-23 | 1974-05-22 | Electron spectrometers for x-ray induced photo-electron spectroscopy |
Country Status (4)
Country | Link |
---|---|
US (1) | US3870882A (en) |
JP (1) | JPS5042790A (en) |
DE (1) | DE2424848A1 (en) |
GB (1) | GB1448298A (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4042827A (en) * | 1973-10-03 | 1977-08-16 | Research Corporation | Stimulated emission X-ray generator |
JPS5937540B2 (en) * | 1974-09-06 | 1984-09-10 | 株式会社日立製作所 | Field emission scanning electron microscope |
US4119855A (en) * | 1977-07-08 | 1978-10-10 | Massachusetts Institute Of Technology | Non vacuum soft x-ray lithographic source |
EP0058137A3 (en) * | 1981-02-09 | 1983-03-16 | Battelle Development Corporation | Apparatus for providing x-rays |
ATE35577T1 (en) * | 1982-04-14 | 1988-07-15 | Battelle Development Corp | X-RAY GENDER. |
DE602005012945D1 (en) * | 2005-07-20 | 2009-04-09 | Zeiss Carl Sms Gmbh | Particle beam exposure system and device for influencing the beam |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2797333A (en) * | 1953-07-24 | 1957-06-25 | Armour Res Found | X-ray source |
US3174036A (en) * | 1961-10-04 | 1965-03-16 | Alexeff Igor | Measurement of ultra high vacua by electron bombardment and vacuum ultra violet radiation measurement |
GB1131143A (en) * | 1964-12-17 | 1968-10-23 | British Cellophane Ltd | An improved x-ray gauging apparatus |
US3602686A (en) * | 1967-04-11 | 1971-08-31 | Westinghouse Electric Corp | Electron-beam apparatus and method of welding with this apparatus |
US3617741A (en) * | 1969-09-02 | 1971-11-02 | Hewlett Packard Co | Electron spectroscopy system with a multiple electrode electron lens |
US3681600A (en) * | 1969-10-24 | 1972-08-01 | Perkin Elmer Corp | Retarding field electron spectrometer |
GB1332207A (en) * | 1971-05-07 | 1973-10-03 | Ass Elect Ind | Apparatus for charged particle spectroscopy |
US3787692A (en) * | 1971-05-17 | 1974-01-22 | Varian Associates | Induced electron emission spectrometer using plural radiation sources |
US3699331A (en) * | 1971-08-27 | 1972-10-17 | Paul W Palmberg | Double pass coaxial cylinder analyzer with retarding spherical grids |
-
1973
- 1973-05-23 US US363141A patent/US3870882A/en not_active Expired - Lifetime
-
1974
- 1974-05-22 DE DE19742424848 patent/DE2424848A1/en active Pending
- 1974-05-22 GB GB2281374A patent/GB1448298A/en not_active Expired
- 1974-05-23 JP JP49057434A patent/JPS5042790A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE2424848A1 (en) | 1974-12-19 |
JPS5042790A (en) | 1975-04-18 |
US3870882A (en) | 1975-03-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |