GB1431207A - Methods of analyzing line spectra - Google Patents

Methods of analyzing line spectra

Info

Publication number
GB1431207A
GB1431207A GB2892573A GB2892573A GB1431207A GB 1431207 A GB1431207 A GB 1431207A GB 2892573 A GB2892573 A GB 2892573A GB 2892573 A GB2892573 A GB 2892573A GB 1431207 A GB1431207 A GB 1431207A
Authority
GB
United Kingdom
Prior art keywords
intensity
data
peak
line
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2892573A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1431207A publication Critical patent/GB1431207A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
GB2892573A 1972-06-26 1973-06-19 Methods of analyzing line spectra Expired GB1431207A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26611972A 1972-06-26 1972-06-26

Publications (1)

Publication Number Publication Date
GB1431207A true GB1431207A (en) 1976-04-07

Family

ID=23013245

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2892573A Expired GB1431207A (en) 1972-06-26 1973-06-19 Methods of analyzing line spectra

Country Status (6)

Country Link
JP (1) JPS4953094A (hu)
CA (1) CA974651A (hu)
DE (1) DE2332100A1 (hu)
FR (1) FR2191737A5 (hu)
GB (1) GB1431207A (hu)
IT (1) IT1006058B (hu)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2225139A (en) * 1988-11-16 1990-05-23 Atomic Energy Authority Uk Method for spectrum matching
CN105354419A (zh) * 2015-11-02 2016-02-24 中国电子科技集团公司第四十一研究所 一种应用于频谱分析仪中的轨迹处理新方法
CN115112605A (zh) * 2022-07-21 2022-09-27 湖南五凌电力科技有限公司 变压器油光谱的波长矫正方法、计算机设备及存储介质
CN116609370A (zh) * 2023-04-13 2023-08-18 深圳市埃芯半导体科技有限公司 晶圆检测方法和电子设备

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6193936A (ja) * 1984-10-13 1986-05-12 Furukawa Electric Co Ltd:The 放射線による被測定物の組成分析方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2225139A (en) * 1988-11-16 1990-05-23 Atomic Energy Authority Uk Method for spectrum matching
CN105354419A (zh) * 2015-11-02 2016-02-24 中国电子科技集团公司第四十一研究所 一种应用于频谱分析仪中的轨迹处理新方法
CN105354419B (zh) * 2015-11-02 2018-01-30 中国电子科技集团公司第四十一研究所 一种应用于频谱分析仪中的轨迹处理方法
CN115112605A (zh) * 2022-07-21 2022-09-27 湖南五凌电力科技有限公司 变压器油光谱的波长矫正方法、计算机设备及存储介质
CN115112605B (zh) * 2022-07-21 2023-08-08 湖南五凌电力科技有限公司 变压器油光谱的波长矫正方法、计算机设备及存储介质
CN116609370A (zh) * 2023-04-13 2023-08-18 深圳市埃芯半导体科技有限公司 晶圆检测方法和电子设备

Also Published As

Publication number Publication date
CA974651A (en) 1975-09-16
JPS4953094A (hu) 1974-05-23
DE2332100A1 (de) 1974-01-10
FR2191737A5 (hu) 1974-02-01
IT1006058B (it) 1976-09-30

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee