GB1424224A - Method and apparatus for the generation and recording of electron diffraction patterns - Google Patents

Method and apparatus for the generation and recording of electron diffraction patterns

Info

Publication number
GB1424224A
GB1424224A GB1691873A GB1691873A GB1424224A GB 1424224 A GB1424224 A GB 1424224A GB 1691873 A GB1691873 A GB 1691873A GB 1691873 A GB1691873 A GB 1691873A GB 1424224 A GB1424224 A GB 1424224A
Authority
GB
United Kingdom
Prior art keywords
specimen
electron
incidence
recording
diffracted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1691873A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronic and Associated Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronic and Associated Industries Ltd filed Critical Philips Electronic and Associated Industries Ltd
Publication of GB1424224A publication Critical patent/GB1424224A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical or photographic arrangements associated with the tube
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295—Electron or ion diffraction tubes
    • H01J37/2955—Electron or ion diffraction tubes using scanning ray

Abstract

1424224 Cathode-ray tubes PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd 9 April 1973 [12 April 1972] 16918/73 Heading H1D Electron diffraction patterns of a selected small part of a specimen are obtained by recording that part of the diffracted beam which is diffracted in a fixed direction, while the direction of incidence on the specimen of the incident electron beam is varied. The beam 12 incident on the specimen P may be rotated through 360 degrees about axis 7 for each of a sequence of angles #; or it may perform a spiral movement; or a normal television frame pattern may be employed, the beam intensity being modulated to produce reduced or zero illumination of the specimen for other than the selected angles of incidence. The diaphragm 15 selects the direction of the diffracted beam for recording, the fact that it coincides with the electron-optical axis of the system minimizing aberration. Suitable electron-optical systems are referred to; known electron microscopes incorporating a deflection system may be employed by suitable adjustment of the lenses. The diffracted beam may be received on a luminescent screen coupled by a fibre optic window to a television camera tube connected to a display tube the scanning of which is synchronized with that of the beam illuminating the specimen. A sequence of scans of the angle of incidence, e.g. 360 degree rotations for different values of #-may be displayed in a corresponding sequence of colours on a colour television display tube.
GB1691873A 1972-04-12 1973-04-09 Method and apparatus for the generation and recording of electron diffraction patterns Expired GB1424224A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7204859A NL7204859A (en) 1972-04-12 1972-04-12

Publications (1)

Publication Number Publication Date
GB1424224A true GB1424224A (en) 1976-02-11

Family

ID=19815829

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1691873A Expired GB1424224A (en) 1972-04-12 1973-04-09 Method and apparatus for the generation and recording of electron diffraction patterns

Country Status (8)

Country Link
CA (1) CA984524A (en)
CH (1) CH569275A5 (en)
DE (1) DE2315130A1 (en)
FR (1) FR2179978B1 (en)
GB (1) GB1424224A (en)
IT (1) IT983000B (en)
NL (1) NL7204859A (en)
SE (1) SE386770B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2198284A (en) * 1986-10-27 1988-06-08 Atomika Tech Physik Gmbh Secondary ion masss spectroscopy to determin the composition of a solid body
GB2221567A (en) * 1988-07-25 1990-02-07 Hitachi Ltd Scanning electron microscope

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4210806A (en) * 1979-01-18 1980-07-01 International Business Machines Corporation High brightness electron probe beam and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1248201A (en) * 1967-07-03 1971-09-29 Nat Res Dev Electron microscopes
GB1284061A (en) * 1970-01-21 1972-08-02 Cambridge Scientific Instr Ltd Electron beam apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2198284A (en) * 1986-10-27 1988-06-08 Atomika Tech Physik Gmbh Secondary ion masss spectroscopy to determin the composition of a solid body
GB2198284B (en) * 1986-10-27 1991-03-20 Atomika Tech Physik Gmbh Determining the composition of a solid body
GB2221567A (en) * 1988-07-25 1990-02-07 Hitachi Ltd Scanning electron microscope
US4983832A (en) * 1988-07-25 1991-01-08 Hitachi, Ltd. Scanning electron microscope
GB2221567B (en) * 1988-07-25 1992-11-11 Hitachi Ltd Scanning electron microscope

Also Published As

Publication number Publication date
DE2315130A1 (en) 1973-10-18
CA984524A (en) 1976-02-24
FR2179978B1 (en) 1978-02-10
SE386770B (en) 1976-08-16
CH569275A5 (en) 1975-11-14
FR2179978A1 (en) 1973-11-23
IT983000B (en) 1974-10-21
NL7204859A (en) 1973-10-16

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee