GB1381413A - Methods of testing asynchronous sequential circuits - Google Patents

Methods of testing asynchronous sequential circuits

Info

Publication number
GB1381413A
GB1381413A GB2122273A GB2122273A GB1381413A GB 1381413 A GB1381413 A GB 1381413A GB 2122273 A GB2122273 A GB 2122273A GB 2122273 A GB2122273 A GB 2122273A GB 1381413 A GB1381413 A GB 1381413A
Authority
GB
United Kingdom
Prior art keywords
state
sequence
testing
methods
variables
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2122273A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1381413A publication Critical patent/GB1381413A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
GB2122273A 1972-06-21 1973-05-04 Methods of testing asynchronous sequential circuits Expired GB1381413A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26503572A 1972-06-21 1972-06-21

Publications (1)

Publication Number Publication Date
GB1381413A true GB1381413A (en) 1975-01-22

Family

ID=23008681

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2122273A Expired GB1381413A (en) 1972-06-21 1973-05-04 Methods of testing asynchronous sequential circuits

Country Status (4)

Country Link
JP (1) JPS4952547A (enrdf_load_stackoverflow)
CA (1) CA990405A (enrdf_load_stackoverflow)
GB (1) GB1381413A (enrdf_load_stackoverflow)
IT (1) IT998133B (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0006168A1 (en) * 1978-06-19 1980-01-09 International Business Machines Corporation Method and apparatus for testing fixed function logic circuits
EP0305217A3 (en) * 1987-08-28 1990-10-24 Hewlett-Packard Company An automatic test process for logic devices
US5097468A (en) * 1988-05-03 1992-03-17 Digital Equipment Corporation Testing asynchronous processes
EP0562886A3 (en) * 1992-03-27 1996-11-06 Matsushita Electric Ind Co Ltd Method and apparatus for generating test sequence

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0006168A1 (en) * 1978-06-19 1980-01-09 International Business Machines Corporation Method and apparatus for testing fixed function logic circuits
EP0305217A3 (en) * 1987-08-28 1990-10-24 Hewlett-Packard Company An automatic test process for logic devices
US5097468A (en) * 1988-05-03 1992-03-17 Digital Equipment Corporation Testing asynchronous processes
EP0562886A3 (en) * 1992-03-27 1996-11-06 Matsushita Electric Ind Co Ltd Method and apparatus for generating test sequence
EP1132749A3 (en) * 1992-03-27 2002-02-27 Matsushita Electric Industrial Co., Ltd. Method and apparatus for generating test sequence

Also Published As

Publication number Publication date
JPS4952547A (enrdf_load_stackoverflow) 1974-05-22
CA990405A (en) 1976-06-01
IT998133B (it) 1976-01-20

Similar Documents

Publication Publication Date Title
GB1516817A (en) Arrangements for performing logical operations
GB1525274A (en) Memory arrangements
GB1523859A (en) Apparatus for performing logical operations
GB1512222A (en) Data processing apparatus
GB1381413A (en) Methods of testing asynchronous sequential circuits
US3252097A (en) Marginal checking system
UST930005I4 (en) Total state condition
GB1495838A (en) Synchronous shift register
GB1043642A (en) Method of checking clock-pulse controlled electronic storage members during operation
ES246497A1 (es) APARATO ELÉCTRICO PARA SINCRONIZAR SIMULTáNEAMENTE VARIAS OPERACIONES SUPERPUESTAS
US3274557A (en) Display simulator for computer-aided systems
JPS54154964A (en) Programable counter
GB738605A (en) Improvements in or relating to electronic adding circuits
ES446547A1 (es) Un dispositivo controlado por programa.
US4231099A (en) Digital function generator
GB935411A (en) Logical circuits
JPS52144253A (en) Flip-flop circuit
JPS5222846A (en) Data processing unit
SU763811A1 (ru) Устройство фазовой синхронизации
SE307028B (enrdf_load_stackoverflow)
SU422092A1 (ru) Селектор импульсов
GB1381414A (en) Methods of testing sequential logic circuits
PETRENKO Formation and solution of the equations of state of electronic circuits
JPS6480884A (en) Scan path constituting method
GB1452934A (en) Magnetic bubble multiplying circuit

Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee