GB1350440A - Apparatus for measuring surface roughness - Google Patents
Apparatus for measuring surface roughnessInfo
- Publication number
- GB1350440A GB1350440A GB2485171A GB2485171A GB1350440A GB 1350440 A GB1350440 A GB 1350440A GB 2485171 A GB2485171 A GB 2485171A GB 2485171 A GB2485171 A GB 2485171A GB 1350440 A GB1350440 A GB 1350440A
- Authority
- GB
- United Kingdom
- Prior art keywords
- beams
- sub
- another
- disclosed
- superimposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003746 surface roughness Effects 0.000 title abstract 2
- 230000001427 coherent effect Effects 0.000 abstract 1
- 238000006073 displacement reaction Methods 0.000 abstract 1
- 230000004048 modification Effects 0.000 abstract 1
- 238000012986 modification Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 230000010287 polarization Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02097—Self-interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7004247A NL7004247A (enrdf_load_stackoverflow) | 1970-03-25 | 1970-03-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1350440A true GB1350440A (en) | 1974-04-18 |
Family
ID=19809670
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2485171A Expired GB1350440A (en) | 1970-03-25 | 1971-04-19 | Apparatus for measuring surface roughness |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPS532076B1 (enrdf_load_stackoverflow) |
FR (1) | FR2088257B2 (enrdf_load_stackoverflow) |
GB (1) | GB1350440A (enrdf_load_stackoverflow) |
NL (1) | NL7004247A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0094835B1 (en) * | 1982-05-17 | 1988-03-30 | National Research Development Corporation | Apparatus for investigation of a surface |
GB2250810A (en) * | 1990-10-24 | 1992-06-17 | Kevin Maurice Buckley | Gravitational interferometry observatory |
WO2005001445A3 (en) * | 2001-12-18 | 2005-12-15 | Massachusetts Inst Technology | Systems and methods for phase measurements |
US9528817B2 (en) | 2001-12-18 | 2016-12-27 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5416883B2 (ja) * | 2003-06-19 | 2014-02-12 | マサチユセツツ・インスチチユート・オブ・テクノロジイ | 位相測定用システムと方法 |
-
1970
- 1970-03-25 NL NL7004247A patent/NL7004247A/xx unknown
-
1971
- 1971-03-22 JP JP1612271A patent/JPS532076B1/ja active Pending
- 1971-03-23 FR FR7110175A patent/FR2088257B2/fr not_active Expired
- 1971-04-19 GB GB2485171A patent/GB1350440A/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0094835B1 (en) * | 1982-05-17 | 1988-03-30 | National Research Development Corporation | Apparatus for investigation of a surface |
GB2250810A (en) * | 1990-10-24 | 1992-06-17 | Kevin Maurice Buckley | Gravitational interferometry observatory |
WO2005001445A3 (en) * | 2001-12-18 | 2005-12-15 | Massachusetts Inst Technology | Systems and methods for phase measurements |
US9528817B2 (en) | 2001-12-18 | 2016-12-27 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
Also Published As
Publication number | Publication date |
---|---|
DE2112229A1 (de) | 1971-10-14 |
FR2088257A2 (enrdf_load_stackoverflow) | 1972-01-07 |
JPS532076B1 (enrdf_load_stackoverflow) | 1978-01-25 |
DE2112229B2 (de) | 1977-05-26 |
NL7004247A (enrdf_load_stackoverflow) | 1971-09-28 |
FR2088257B2 (enrdf_load_stackoverflow) | 1973-06-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |