GB1334767A - Electron beam apparatus - Google Patents

Electron beam apparatus

Info

Publication number
GB1334767A
GB1334767A GB3987971A GB3987971A GB1334767A GB 1334767 A GB1334767 A GB 1334767A GB 3987971 A GB3987971 A GB 3987971A GB 3987971 A GB3987971 A GB 3987971A GB 1334767 A GB1334767 A GB 1334767A
Authority
GB
United Kingdom
Prior art keywords
electrode
electron
tube
aug
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3987971A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronic and Associated Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronic and Associated Industries Ltd filed Critical Philips Electronic and Associated Industries Ltd
Publication of GB1334767A publication Critical patent/GB1334767A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/24Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • H01J37/241High voltage power supply or regulation circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/147Arrangements for directing or deflecting the discharge along a desired path

Abstract

1334767 Automatic stabilization of electron beams PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd 25 Aug 1971 [28 Aug 1970] 39879/71 Heading G3R [Also in Division H1] A beam stabilizing arrangement, particularly for an electron microscope, includes a doublefocusing magnetic bending device providing a field perpendicular to the beam. The beam emerging from the bending device is sampled to produce a control signal for application to a beam accelerator. In the system shown, a Van de Graaff generator belt 4 supplies electrons at a high-voltage electrode 5 to an electron gun 7. A beam 8 of electrons is accelerated in a tube by ring electrodes 11 and passes through a diaphragm 17 to a bending magnet 16 including inclined pole plates and magnetic windings, Fig.3 (not shown). The magnet 16 forms an image at its exit end close to a foil or pair of foils 18 which peripherally intercept a small fraction of the beam and scatter it to a detector 19 comprising a diode in which conduction is dependent on electron bombardment. The remainder of the beam passes to an image-forming device 20, Fig.1 (not shown) The detector output is amplified 51 and corrected for beam current and diameter variations before passing to an opto-electronic converter 53 which supplies a photo-amplifier tube 54 controlling a variable voltage source 55 connected between the high voltage electrode 5 and the first electrode 56 of the accelerator tube. The electron gun 7 is connected to the electrode 56 through a constant voltage source 57 and has a current control 58. Stabilization of beam position and velocity is achieved.
GB3987971A 1970-08-28 1971-08-25 Electron beam apparatus Expired GB1334767A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7012758A NL7012758A (en) 1970-08-28 1970-08-28

Publications (1)

Publication Number Publication Date
GB1334767A true GB1334767A (en) 1973-10-24

Family

ID=19810878

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3987971A Expired GB1334767A (en) 1970-08-28 1971-08-25 Electron beam apparatus

Country Status (6)

Country Link
US (1) US3767927A (en)
CA (1) CA943269A (en)
DE (1) DE2138767A1 (en)
FR (1) FR2106023A5 (en)
GB (1) GB1334767A (en)
NL (1) NL7012758A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE221138C (en) * 1971-04-30
NL7416395A (en) * 1974-12-17 1976-06-21 Philips Nv ELECTRONIC MICROSKOP.
CN112996214B (en) * 2021-02-19 2023-07-21 中国科学院近代物理研究所 Magnetic field stability control system and method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE509097A (en) * 1951-02-10
US3012139A (en) * 1960-03-24 1961-12-05 Merlyn L Hanson Automatic mass spectrometer
US3207982A (en) * 1961-04-19 1965-09-21 High Voltage Engineering Corp Apparatus for measuring and displaying the characteristics of beams of charged particles
US3191027A (en) * 1962-08-24 1965-06-22 Exxon Research Engineering Co Mass spectrometer with means to impress a fluctuating component upon the ion stream and means to detect the same
DE1498936B2 (en) * 1963-12-28 1971-01-14 Nihon Densht K K , Tokio Method and device for controlling the exposure time in a mass spectrograph

Also Published As

Publication number Publication date
CA943269A (en) 1974-03-05
US3767927A (en) 1973-10-23
DE2138767A1 (en) 1972-03-02
FR2106023A5 (en) 1972-04-28
NL7012758A (en) 1972-03-01

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee