GB1333907A - Microwave induction gauge - Google Patents

Microwave induction gauge

Info

Publication number
GB1333907A
GB1333907A GB3459572A GB3459572A GB1333907A GB 1333907 A GB1333907 A GB 1333907A GB 3459572 A GB3459572 A GB 3459572A GB 3459572 A GB3459572 A GB 3459572A GB 1333907 A GB1333907 A GB 1333907A
Authority
GB
United Kingdom
Prior art keywords
test head
flaws
fin
thickness
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3459572A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lockheed Martin Corp
Original Assignee
Lockheed Aircraft Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Aircraft Corp filed Critical Lockheed Aircraft Corp
Publication of GB1333907A publication Critical patent/GB1333907A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
GB3459572A 1971-08-18 1972-07-24 Microwave induction gauge Expired GB1333907A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US17276871A 1971-08-18 1971-08-18

Publications (1)

Publication Number Publication Date
GB1333907A true GB1333907A (en) 1973-10-17

Family

ID=22629150

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3459572A Expired GB1333907A (en) 1971-08-18 1972-07-24 Microwave induction gauge

Country Status (6)

Country Link
US (1) US3710243A (enExample)
JP (1) JPS4829462A (enExample)
CA (1) CA960752A (enExample)
DE (1) DE2240203A1 (enExample)
FR (1) FR2150189A5 (enExample)
GB (1) GB1333907A (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4166973A (en) * 1978-03-07 1979-09-04 Philip Morris Incorporated Method and system for detection of thin metal layers in packaged articles
SE8000410L (sv) * 1979-01-20 1980-07-21 Lambda Ind Science Ltd Sprickdetektor
JPS57127835A (en) * 1981-01-30 1982-08-09 Matsushita Electric Works Ltd Detecting method of crack in veneer of decorative board wherein veneer is used
DE3107675C2 (de) * 1981-02-28 1985-06-20 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever KG, 5000 Köln Verfahren und Vorrichtung zur elektronischen Messung der Dicke sehr dünner elektrisch leitfähiger Schichten auf nichtleitendem Trägermaterial
JPS6176942A (ja) * 1984-09-22 1986-04-19 Kanzaki Paper Mfg Co Ltd 誘電体シートの配向性又は誘電特性の測定方法
US4739249A (en) * 1987-04-23 1988-04-19 Imatran Voima Oy Method and apparatus for the measurement of the properties of sheet- or foil-like materials of low electrical conductivity
US5348723A (en) * 1990-02-07 1994-09-20 Bandgap Technology Corporation Synthesis of semiconductor grade tungsten hexafluoride
FR2674623B1 (fr) * 1991-03-29 1993-06-04 Alcatel Fibres Optiques Dispositif de mesure en continu et sans contact de l'epaisseur d'une mince couche conductrice sur un support isolant, du genre fibre ou ruban, qui defile.
US5748003A (en) * 1991-07-29 1998-05-05 Colorado State University Research Foundation Microwaves used for determining fatigue and surface crack features on metal surfaces
US5376889A (en) * 1991-10-10 1994-12-27 Hughes Aircraft Company System and method for detecting and locating flaws on or beneath a surface
EP1410991A3 (de) 2002-10-10 2005-12-14 Focke & Co. (GmbH & Co. KG) Verfahren und Vorrichtung zur Überprüfung des Inhalts einer (geschlossenen) Packung
US8525705B1 (en) 2010-05-20 2013-09-03 The United States Of America As Represented By The Secretary Of The Navy Apparatus and method for detecting defects in solid rocket motor propellant

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3628135A (en) * 1969-12-15 1971-12-14 Rank Organisation Ltd Cranked hollow waveguide for measuring moisture content of moving sheet or web material

Also Published As

Publication number Publication date
JPS4829462A (enExample) 1973-04-19
DE2240203A1 (de) 1973-02-22
FR2150189A5 (enExample) 1973-03-30
US3710243A (en) 1973-01-09
CA960752A (en) 1975-01-07

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee