GB1320346A - Specimen stages for electron microscopes - Google Patents

Specimen stages for electron microscopes

Info

Publication number
GB1320346A
GB1320346A GB2491670A GB1320346DA GB1320346A GB 1320346 A GB1320346 A GB 1320346A GB 2491670 A GB2491670 A GB 2491670A GB 1320346D A GB1320346D A GB 1320346DA GB 1320346 A GB1320346 A GB 1320346A
Authority
GB
United Kingdom
Prior art keywords
pulley
axis
gimbal
drive
attached
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2491670A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Publication of GB1320346A publication Critical patent/GB1320346A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
GB2491670A 1970-05-22 1970-05-22 Specimen stages for electron microscopes Expired GB1320346A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2491670 1970-05-22

Publications (1)

Publication Number Publication Date
GB1320346A true GB1320346A (en) 1973-06-13

Family

ID=10219287

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2491670A Expired GB1320346A (en) 1970-05-22 1970-05-22 Specimen stages for electron microscopes

Country Status (5)

Country Link
US (1) US3714423A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2125105A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2093572A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB1320346A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
NL (1) NL7106972A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4170737A (en) 1978-07-06 1979-10-09 Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR Top-entry transmission electron microscope
WO1981003580A1 (fr) * 1980-06-09 1981-12-10 Burevestnik Chambre d'echantillons pour instrument de sondage electronique

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6891170B1 (en) 2002-06-17 2005-05-10 Zyvex Corporation Modular manipulation system for manipulating a sample under study with a microscope
US6967335B1 (en) 2002-06-17 2005-11-22 Zyvex Corporation Manipulation system for manipulating a sample under study with a microscope
JP2007506981A (ja) * 2003-09-23 2007-03-22 ザイベックス コーポレーション Ｆｉｂで調製した試料を把持する素子を使用した顕微鏡検査のための方法、システム、および装置
TW200531420A (en) 2004-02-20 2005-09-16 Zyvex Corp Positioning device for microscopic motion
US7319336B2 (en) 2004-02-23 2008-01-15 Zyvex Instruments, Llc Charged particle beam device probe operation
US7326293B2 (en) * 2004-03-26 2008-02-05 Zyvex Labs, Llc Patterned atomic layer epitaxy
US7786442B2 (en) * 2004-06-18 2010-08-31 General Electric Company Method and apparatus for ion source positioning and adjustment
KR102083193B1 (ko) * 2013-11-25 2020-03-02 삼성전자주식회사 로봇 청소기

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1226228B (de) * 1959-07-24 1966-10-06 Max Planck Gesellschaft Bewegbarer Praeparattisch fuer einen Korpus-kularstrahlapparat, insbesondere Elektronen-mikroskop oder Elektronenbeugungsgeraet
DE1572753B2 (de) * 1966-04-06 1971-02-18 Nihon Denshi K K , Tokio Goniometer zur werkstoffanalyse mittels roentgenstrahlen
US3566111A (en) * 1967-06-19 1971-02-23 Siemens Ag Apparatus for varying the detector slit width in fully focusing x-ray spectrometers

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4170737A (en) 1978-07-06 1979-10-09 Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR Top-entry transmission electron microscope
WO1981003580A1 (fr) * 1980-06-09 1981-12-10 Burevestnik Chambre d'echantillons pour instrument de sondage electronique

Also Published As

Publication number Publication date
NL7106972A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1971-11-24
DE2125105A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1971-12-02
FR2093572A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1972-01-28
US3714423A (en) 1973-01-30

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees