NL7106972A - - Google Patents
Info
- Publication number
- NL7106972A NL7106972A NL7106972A NL7106972A NL7106972A NL 7106972 A NL7106972 A NL 7106972A NL 7106972 A NL7106972 A NL 7106972A NL 7106972 A NL7106972 A NL 7106972A NL 7106972 A NL7106972 A NL 7106972A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB2491670 | 1970-05-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7106972A true NL7106972A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1971-11-24 |
Family
ID=10219287
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7106972A NL7106972A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1970-05-22 | 1971-05-21 |
Country Status (5)
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4170737A (en) | 1978-07-06 | 1979-10-09 | Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR | Top-entry transmission electron microscope |
| DE3050424A1 (de) * | 1980-06-09 | 1982-07-29 | Burevestnik | Sample chamber for electron-sounding instrument |
| US6891170B1 (en) | 2002-06-17 | 2005-05-10 | Zyvex Corporation | Modular manipulation system for manipulating a sample under study with a microscope |
| US6967335B1 (en) | 2002-06-17 | 2005-11-22 | Zyvex Corporation | Manipulation system for manipulating a sample under study with a microscope |
| JP2007506981A (ja) * | 2003-09-23 | 2007-03-22 | ザイベックス コーポレーション | Ｆｉｂで調製した試料を把持する素子を使用した顕微鏡検査のための方法、システム、および装置 |
| TW200531420A (en) | 2004-02-20 | 2005-09-16 | Zyvex Corp | Positioning device for microscopic motion |
| US7319336B2 (en) | 2004-02-23 | 2008-01-15 | Zyvex Instruments, Llc | Charged particle beam device probe operation |
| US7326293B2 (en) * | 2004-03-26 | 2008-02-05 | Zyvex Labs, Llc | Patterned atomic layer epitaxy |
| US7786442B2 (en) * | 2004-06-18 | 2010-08-31 | General Electric Company | Method and apparatus for ion source positioning and adjustment |
| KR102083193B1 (ko) * | 2013-11-25 | 2020-03-02 | 삼성전자주식회사 | 로봇 청소기 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1226228B (de) * | 1959-07-24 | 1966-10-06 | Max Planck Gesellschaft | Bewegbarer Praeparattisch fuer einen Korpus-kularstrahlapparat, insbesondere Elektronen-mikroskop oder Elektronenbeugungsgeraet |
| DE1572753B2 (de) * | 1966-04-06 | 1971-02-18 | Nihon Denshi K K , Tokio | Goniometer zur werkstoffanalyse mittels roentgenstrahlen |
| US3566111A (en) * | 1967-06-19 | 1971-02-23 | Siemens Ag | Apparatus for varying the detector slit width in fully focusing x-ray spectrometers |
-
1970
- 1970-05-22 GB GB2491670A patent/GB1320346A/en not_active Expired
-
1971
- 1971-05-21 DE DE19712125105 patent/DE2125105A1/de active Pending
- 1971-05-21 US US00145694A patent/US3714423A/en not_active Expired - Lifetime
- 1971-05-21 NL NL7106972A patent/NL7106972A/xx unknown
- 1971-05-21 FR FR7118409A patent/FR2093572A5/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1320346A (en) | 1973-06-13 |
| DE2125105A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1971-12-02 |
| FR2093572A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1972-01-28 |
| US3714423A (en) | 1973-01-30 |