GB1289840A - - Google Patents

Info

Publication number
GB1289840A
GB1289840A GB1289840DA GB1289840A GB 1289840 A GB1289840 A GB 1289840A GB 1289840D A GB1289840D A GB 1289840DA GB 1289840 A GB1289840 A GB 1289840A
Authority
GB
United Kingdom
Prior art keywords
tape
devices
vacuum probe
dec
web
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1289840A publication Critical patent/GB1289840A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0611—Sorting devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/3412—Sorting according to other particular properties according to a code applied to the object which indicates a property of the object, e.g. quality class, contents or incorrect indication
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/905—Feeder conveyor holding item by suction
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49004—Electrical device making including measuring or testing of device or component part
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49789—Obtaining plural product pieces from unitary workpiece
    • Y10T29/4979—Breaking through weakened portion

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Replacement Of Web Rolls (AREA)
GB1289840D 1968-12-19 1969-12-15 Expired GB1289840A (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US78520968A 1968-12-19 1968-12-19

Publications (1)

Publication Number Publication Date
GB1289840A true GB1289840A (https=) 1972-09-20

Family

ID=25134766

Family Applications (4)

Application Number Title Priority Date Filing Date
GB1289839D Expired GB1289839A (https=) 1968-12-19 1969-12-15
GB1289837D Expired GB1289837A (https=) 1968-12-19 1969-12-15
GB1289838D Expired GB1289838A (https=) 1968-12-19 1969-12-15
GB1289840D Expired GB1289840A (https=) 1968-12-19 1969-12-15

Family Applications Before (3)

Application Number Title Priority Date Filing Date
GB1289839D Expired GB1289839A (https=) 1968-12-19 1969-12-15
GB1289837D Expired GB1289837A (https=) 1968-12-19 1969-12-15
GB1289838D Expired GB1289838A (https=) 1968-12-19 1969-12-15

Country Status (7)

Country Link
US (1) US3583561A (https=)
JP (1) JPS4840812B1 (https=)
CH (1) CH520941A (https=)
DE (1) DE1962577A1 (https=)
FR (1) FR2026588A1 (https=)
GB (4) GB1289839A (https=)
NL (1) NL6919085A (https=)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3113546A1 (de) * 1980-04-03 1982-02-11 Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto Geraet fuer die automatische herstellung einer folgeanordnung von plaettchenfoermigen elektronischen teilchen
DE3327612A1 (de) * 1982-12-30 1984-07-12 Tokujiro Toyonaka Osaka Okui Verfahren zum halten elektronischer kleinteile
US4575995A (en) * 1980-04-03 1986-03-18 Murata Manufacturing Co., Ltd. Automatic producing apparatus of chip-form electronic parts aggregate
GB2166111A (en) * 1984-10-26 1986-04-30 Usm Corp Tape feeder for electronic components
EP2026644A2 (de) 2007-08-08 2009-02-18 AMPHENOL-TUCHEL ELECTRONICS GmbH Trägerband zur Aufnahme elektronischer Bauteile

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3732002A (en) * 1968-12-19 1973-05-08 M Wiesler Photographic recorder for die sorting system
JPS493315B1 (https=) * 1970-09-28 1974-01-25
JPS539508B2 (https=) * 1971-06-25 1978-04-06
US3720309A (en) * 1971-12-07 1973-03-13 Teledyne Inc Method and apparatus for sorting semiconductor dice
US3811182A (en) * 1972-03-31 1974-05-21 Ibm Object handling fixture, system, and process
US4046985A (en) * 1974-11-25 1977-09-06 International Business Machines Corporation Semiconductor wafer alignment apparatus
CA1044379A (en) * 1974-12-28 1978-12-12 Sony Corporation Wafer transfer device
JPS5336122U (https=) * 1976-09-02 1978-03-30
US4358659A (en) * 1981-07-13 1982-11-09 Mostek Corporation Method and apparatus for focusing a laser beam on an integrated circuit
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
CA1187939A (en) * 1982-09-02 1985-05-28 Sheldon A. Buckler Method and system for testing and sorting batteries
JPS5978538A (ja) * 1982-10-27 1984-05-07 Toshiba Corp ダイボンダ装置
US4510673A (en) * 1983-06-23 1985-04-16 International Business Machines Corporation Laser written chip identification method
GB2182207B (en) * 1985-10-29 1988-12-14 Marconi Instruments Ltd Electrical circuit identification
EP0267306A1 (de) * 1986-11-10 1988-05-18 Schoenelec-PFE GmbH Prüfvorrichtung für gegurtete elektronische Bauelemente
US5640762A (en) * 1988-09-30 1997-06-24 Micron Technology, Inc. Method and apparatus for manufacturing known good semiconductor die
US6219908B1 (en) * 1991-06-04 2001-04-24 Micron Technology, Inc. Method and apparatus for manufacturing known good semiconductor die
US5483174A (en) * 1992-06-10 1996-01-09 Micron Technology, Inc. Temporary connection of semiconductor die using optical alignment techniques
US5448165A (en) * 1993-01-08 1995-09-05 Integrated Device Technology, Inc. Electrically tested and burned-in semiconductor die and method for producing same
US5474640A (en) * 1993-07-19 1995-12-12 Applied Materials, Inc. Apparatus for marking a substrate using ionized gas
JP3079504B2 (ja) * 1995-10-23 2000-08-21 株式会社新川 ウェーハのダイピックアップ方法
US5811314A (en) * 1996-06-07 1998-09-22 General Instrument Of Taiwan, Ltd. Magnetic ink and method for manufacturing and sifting out of defective dice by using the same
US6090237A (en) * 1996-12-03 2000-07-18 Reynolds; Carl V. Apparatus for restraining adhesive overflow in a multilayer substrate assembly during lamination
US5962862A (en) * 1997-08-12 1999-10-05 Micron Technology, Inc. Method and apparatus for verifying the presence or absence of a component
GB2332637B (en) * 1997-12-25 2000-03-08 Matsushita Electric Industrial Co Ltd Apparatus and method for processing
US6259057B1 (en) * 1999-05-11 2001-07-10 Great Computer Corp. Automatically focusing structure of laser sculpturing machine
US20040017602A1 (en) * 2002-03-27 2004-01-29 Bennett Kevin W. Modular optical amplifier assembly with self identifying modules
US6954711B2 (en) * 2003-05-19 2005-10-11 Applied Materials, Inc. Test substrate reclamation method and apparatus
US20070048120A1 (en) * 2005-08-15 2007-03-01 Texas Instruments Incorporated Vacuum shroud for a die attach tool
US7657390B2 (en) * 2005-11-02 2010-02-02 Applied Materials, Inc. Reclaiming substrates having defects and contaminants
GB0617835D0 (en) * 2006-09-11 2006-10-18 Xpeqt Nv Hot testing of semiconductor devices
CN112403944B (zh) * 2020-09-21 2022-09-02 铜陵三佳变压器科技股份有限公司 一种便于维护的微型变压器分选机构
CN113414142B (zh) * 2021-06-07 2022-06-10 浙江启尔机电技术有限公司 一种压电片阻抗特性测量装置及其测量方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2970730A (en) * 1957-01-08 1961-02-07 Motorola Inc Dicing semiconductor wafers
US3216004A (en) * 1961-11-07 1965-11-02 Bell Telephone Labor Inc Optical encoder with complement code storage
DE1427772A1 (de) * 1965-11-23 1968-12-12 Telefunken Patent Verfahren zum Zerlegen einer Halbleiterscheibe in einzelne Halbleiterplaettchen

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3113546A1 (de) * 1980-04-03 1982-02-11 Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto Geraet fuer die automatische herstellung einer folgeanordnung von plaettchenfoermigen elektronischen teilchen
US4575995A (en) * 1980-04-03 1986-03-18 Murata Manufacturing Co., Ltd. Automatic producing apparatus of chip-form electronic parts aggregate
DE3327612A1 (de) * 1982-12-30 1984-07-12 Tokujiro Toyonaka Osaka Okui Verfahren zum halten elektronischer kleinteile
GB2166111A (en) * 1984-10-26 1986-04-30 Usm Corp Tape feeder for electronic components
EP2026644A2 (de) 2007-08-08 2009-02-18 AMPHENOL-TUCHEL ELECTRONICS GmbH Trägerband zur Aufnahme elektronischer Bauteile
DE102007037506A1 (de) 2007-08-08 2009-02-19 Amphenol-Tuchel Electronics Gmbh Trägerband zur Aufnahme elektronischer Bauteile

Also Published As

Publication number Publication date
FR2026588A1 (https=) 1970-09-18
US3583561A (en) 1971-06-08
CH520941A (de) 1972-03-31
NL6919085A (https=) 1970-06-23
GB1289837A (https=) 1972-09-20
GB1289838A (https=) 1972-09-20
GB1289839A (https=) 1972-09-20
JPS4840812B1 (https=) 1973-12-03
DE1962577A1 (de) 1970-08-13

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees