GB1201176A - Beam intensity control system - Google Patents
Beam intensity control systemInfo
- Publication number
- GB1201176A GB1201176A GB53759/67A GB5375967A GB1201176A GB 1201176 A GB1201176 A GB 1201176A GB 53759/67 A GB53759/67 A GB 53759/67A GB 5375967 A GB5375967 A GB 5375967A GB 1201176 A GB1201176 A GB 1201176A
- Authority
- GB
- United Kingdom
- Prior art keywords
- signal
- intensity
- magnification
- detector
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/08—Disposition or mounting of heads or light sources relatively to record carriers
- G11B7/09—Disposition or mounting of heads or light sources relatively to record carriers with provision for moving the light beam or focus plane for the purpose of maintaining alignment of the light beam relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following
- G11B7/0908—Disposition or mounting of heads or light sources relatively to record carriers with provision for moving the light beam or focus plane for the purpose of maintaining alignment of the light beam relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following for focusing only
- G11B7/0917—Focus-error methods other than those covered by G11B7/0909 - G11B7/0916
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/04—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/04—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
- G11C13/048—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using other optical storage elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/52—Arrangements for controlling intensity of ray or beam, e.g. for modulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/82—Mounting, supporting, spacing, or insulating electron-optical or ion-optical arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/09—Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/21—Means for adjusting the focus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US603556A US3418520A (en) | 1966-12-21 | 1966-12-21 | Intensity control system for a particle beam device |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1201176A true GB1201176A (en) | 1970-08-05 |
Family
ID=24415941
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB53759/67A Expired GB1201176A (en) | 1966-12-21 | 1967-11-27 | Beam intensity control system |
Country Status (5)
Country | Link |
---|---|
US (1) | US3418520A (de) |
CH (1) | CH485316A (de) |
DE (1) | DE1589982A1 (de) |
GB (1) | GB1201176A (de) |
SE (1) | SE336409B (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110858529A (zh) * | 2018-08-23 | 2020-03-03 | 卡尔蔡司显微镜有限责任公司 | 用于加工物体的方法 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3497762A (en) * | 1965-11-03 | 1970-02-24 | Minnesota Mining & Mfg | Electron beam recording system and apparatus |
US3483427A (en) * | 1967-11-03 | 1969-12-09 | Minnesota Mining & Mfg | Lens for electron beam recorder |
US3786305A (en) * | 1972-05-15 | 1974-01-15 | Hitachi Ltd | Field emission electron gun |
FR49798E (fr) * | 1972-12-14 | 1939-07-17 | Régulateur pour l'admission d'air additionnel aux moteurs à combustion interne | |
US7342817B2 (en) * | 2005-04-06 | 2008-03-11 | Hewlett-Packard Development Company, L.P. | System and method for writing data using an electron beam |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2556455A (en) * | 1948-03-02 | 1951-06-12 | Rauland Corp | Cathode-ray tube focusing system |
US2627589A (en) * | 1950-10-30 | 1953-02-03 | Rca Corp | Focusing of electron optical apparatus |
-
1966
- 1966-12-21 US US603556A patent/US3418520A/en not_active Expired - Lifetime
-
1967
- 1967-11-27 GB GB53759/67A patent/GB1201176A/en not_active Expired
- 1967-12-01 DE DE19671589982 patent/DE1589982A1/de active Pending
- 1967-12-07 SE SE16810/67A patent/SE336409B/xx unknown
- 1967-12-20 CH CH1802167A patent/CH485316A/de not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110858529A (zh) * | 2018-08-23 | 2020-03-03 | 卡尔蔡司显微镜有限责任公司 | 用于加工物体的方法 |
Also Published As
Publication number | Publication date |
---|---|
US3418520A (en) | 1968-12-24 |
DE1589982A1 (de) | 1970-04-09 |
CH485316A (de) | 1970-01-31 |
SE336409B (de) | 1971-07-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |