SE336409B - - Google Patents

Info

Publication number
SE336409B
SE336409B SE16810/67A SE1681067A SE336409B SE 336409 B SE336409 B SE 336409B SE 16810/67 A SE16810/67 A SE 16810/67A SE 1681067 A SE1681067 A SE 1681067A SE 336409 B SE336409 B SE 336409B
Authority
SE
Sweden
Prior art keywords
signal
intensity
magnification
detector
lens
Prior art date
Application number
SE16810/67A
Other languages
English (en)
Inventor
R Barber
K Loeffler
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SE336409B publication Critical patent/SE336409B/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/08Disposition or mounting of heads or light sources relatively to record carriers
    • G11B7/09Disposition or mounting of heads or light sources relatively to record carriers with provision for moving the light beam or focus plane for the purpose of maintaining alignment of the light beam relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following
    • G11B7/0908Disposition or mounting of heads or light sources relatively to record carriers with provision for moving the light beam or focus plane for the purpose of maintaining alignment of the light beam relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following for focusing only
    • G11B7/0917Focus-error methods other than those covered by G11B7/0909 - G11B7/0916
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/04Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/04Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
    • G11C13/048Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using other optical storage elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/52Arrangements for controlling intensity of ray or beam, e.g. for modulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/82Mounting, supporting, spacing, or insulating electron-optical or ion-optical arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/09Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/21Means for adjusting the focus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/244Detectors; Associated components or circuits therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Electron Sources, Ion Sources (AREA)
SE16810/67A 1966-12-21 1967-12-07 SE336409B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US603556A US3418520A (en) 1966-12-21 1966-12-21 Intensity control system for a particle beam device

Publications (1)

Publication Number Publication Date
SE336409B true SE336409B (xx) 1971-07-05

Family

ID=24415941

Family Applications (1)

Application Number Title Priority Date Filing Date
SE16810/67A SE336409B (xx) 1966-12-21 1967-12-07

Country Status (5)

Country Link
US (1) US3418520A (xx)
CH (1) CH485316A (xx)
DE (1) DE1589982A1 (xx)
GB (1) GB1201176A (xx)
SE (1) SE336409B (xx)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497762A (en) * 1965-11-03 1970-02-24 Minnesota Mining & Mfg Electron beam recording system and apparatus
US3483427A (en) * 1967-11-03 1969-12-09 Minnesota Mining & Mfg Lens for electron beam recorder
US3786305A (en) * 1972-05-15 1974-01-15 Hitachi Ltd Field emission electron gun
FR49798E (fr) * 1972-12-14 1939-07-17 Régulateur pour l'admission d'air additionnel aux moteurs à combustion interne
US7342817B2 (en) * 2005-04-06 2008-03-11 Hewlett-Packard Development Company, L.P. System and method for writing data using an electron beam
DE102018120630B3 (de) * 2018-08-23 2019-10-31 Carl Zeiss Microscopy Gmbh Verfahren zum Bearbeiten eines Objekts und Programm zur Steuerung eines Partikelstrahlsystems

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2556455A (en) * 1948-03-02 1951-06-12 Rauland Corp Cathode-ray tube focusing system
US2627589A (en) * 1950-10-30 1953-02-03 Rca Corp Focusing of electron optical apparatus

Also Published As

Publication number Publication date
US3418520A (en) 1968-12-24
DE1589982A1 (de) 1970-04-09
GB1201176A (en) 1970-08-05
CH485316A (de) 1970-01-31

Similar Documents

Publication Publication Date Title
US2455532A (en) Light responsive displacement indicator
DE2611734A1 (de) Optische informationsaufzeichnungseinrichtung
KR890007460A (ko) 영상형성장치 및 반도체레이저의 출력제어방법
SE336409B (xx)
US3409799A (en) Automatic focusing system for beam devices
US2582676A (en) Cathode follower photoelectric amplifier circuit
GB1418393A (en) Automatic contrast and dark level control for scanning electron microscopes
US3936756A (en) Field emission electron gun having automatic current control
US2840720A (en) Multiplier phototube stabilizing circuit
US4151417A (en) Electron beam exposure apparatus
US3000286A (en) Apparatus for photographic printing
US3403288A (en) Dynamic intensity corrections circuit
US2728875A (en) Raster size control
US3786305A (en) Field emission electron gun
US2965294A (en) Object counting apparatus
US2711479A (en) Video mapping system
US3701089A (en) Display for multi-channel sonars
GB1097445A (en) Improvements in or relating to methods of and apparatus for echo sounding
US2711483A (en) Discriminator for proportional counters
GB1005824A (en) Spectrometers employing diffraction gratings
US3227887A (en) Object position predictor using function generators
US2463038A (en) Direct current insertion circuit
GB1259997A (en) Method and device for modulating or stabilizing a neutron flux obtained from an ion accelerator
US3296540A (en) Transistor back bias
US3316349A (en) Image orthicon beam control system for automatically optimizing signal-to-noise ratio of the video output