GB1149606A - Mounting for a semiconductor wafer which is resistant to fatigue caused by thermal stresses - Google Patents

Mounting for a semiconductor wafer which is resistant to fatigue caused by thermal stresses

Info

Publication number
GB1149606A
GB1149606A GB4779/68A GB477968A GB1149606A GB 1149606 A GB1149606 A GB 1149606A GB 4779/68 A GB4779/68 A GB 4779/68A GB 477968 A GB477968 A GB 477968A GB 1149606 A GB1149606 A GB 1149606A
Authority
GB
United Kingdom
Prior art keywords
aluminium
nickel
layer
wafer
resistant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4779/68A
Other languages
English (en)
Inventor
Robert Allen Carnes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of GB1149606A publication Critical patent/GB1149606A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/30—Die-attach connectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/071—Connecting or disconnecting
    • H10W72/073—Connecting or disconnecting of die-attach connectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/071—Connecting or disconnecting
    • H10W72/073—Connecting or disconnecting of die-attach connectors
    • H10W72/07331—Connecting techniques
    • H10W72/07336—Soldering or alloying

Landscapes

  • Chemically Coating (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Die Bonding (AREA)
GB4779/68A 1967-02-27 1968-01-30 Mounting for a semiconductor wafer which is resistant to fatigue caused by thermal stresses Expired GB1149606A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US61863867A 1967-02-27 1967-02-27

Publications (1)

Publication Number Publication Date
GB1149606A true GB1149606A (en) 1969-04-23

Family

ID=24478504

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4779/68A Expired GB1149606A (en) 1967-02-27 1968-01-30 Mounting for a semiconductor wafer which is resistant to fatigue caused by thermal stresses

Country Status (4)

Country Link
BE (1) BE711076A (https=)
FR (1) FR1555176A (https=)
GB (1) GB1149606A (https=)
NL (1) NL6802104A (https=)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0071314A3 (en) * 1981-07-31 1984-04-25 Philips Electronic And Associated Industries Limited Semiconductor devices and a solder for use in such devices
EP0070435A3 (en) * 1981-07-02 1984-11-21 Matsushita Electronics Corporation Semiconductor device comprising a semiconductor substrate bonded to a mounting means
DE3443784A1 (de) * 1983-11-30 1985-07-18 Mitsubishi Denki K.K., Tokio/Tokyo Gate-abschaltthyristor
DE19606101A1 (de) * 1996-02-19 1997-08-21 Siemens Ag Halbleiterkörper mit Lotmaterialschicht
EP1195805A3 (en) * 2000-10-05 2006-06-14 SANYO ELECTRIC Co., Ltd. Heat radiation substrate and semiconductor module
US20070173045A1 (en) 2006-01-23 2007-07-26 Mitsubishi Electric Corporation Method of manufacturing semiconductor device
CN119133096A (zh) * 2024-09-12 2024-12-13 江南大学 一种铜-铝或铝-铝的互连结构及方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH662007A5 (en) * 1983-12-21 1987-08-31 Bbc Brown Boveri & Cie Method of soldering semiconductor components

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0070435A3 (en) * 1981-07-02 1984-11-21 Matsushita Electronics Corporation Semiconductor device comprising a semiconductor substrate bonded to a mounting means
EP0071314A3 (en) * 1981-07-31 1984-04-25 Philips Electronic And Associated Industries Limited Semiconductor devices and a solder for use in such devices
DE3443784A1 (de) * 1983-11-30 1985-07-18 Mitsubishi Denki K.K., Tokio/Tokyo Gate-abschaltthyristor
DE3448379C2 (de) * 1983-11-30 1993-12-16 Mitsubishi Electric Corp Gate-Abschaltthyristor
DE19606101A1 (de) * 1996-02-19 1997-08-21 Siemens Ag Halbleiterkörper mit Lotmaterialschicht
US5901901A (en) * 1996-02-19 1999-05-11 Siemens Aktiengesellschaft Semiconductor assembly with solder material layer and method for soldering the semiconductor assemly
EP1195805A3 (en) * 2000-10-05 2006-06-14 SANYO ELECTRIC Co., Ltd. Heat radiation substrate and semiconductor module
US20070173045A1 (en) 2006-01-23 2007-07-26 Mitsubishi Electric Corporation Method of manufacturing semiconductor device
DE102006062029B4 (de) * 2006-01-23 2010-04-08 Mitsubishi Electric Corp. Verfahren zum Herstellen einer Halbleitervorrichtung
US8183144B2 (en) 2006-01-23 2012-05-22 Mitsubishi Electric Corporation Method of manufacturing semiconductor device
CN119133096A (zh) * 2024-09-12 2024-12-13 江南大学 一种铜-铝或铝-铝的互连结构及方法
CN119133096B (zh) * 2024-09-12 2025-02-28 江南大学 一种铜-铝或铝-铝的互连结构及方法

Also Published As

Publication number Publication date
NL6802104A (https=) 1968-08-28
FR1555176A (https=) 1969-01-24
BE711076A (https=) 1968-08-21

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