GB1111025A - Improvements in and relating to control systems - Google Patents
Improvements in and relating to control systemsInfo
- Publication number
- GB1111025A GB1111025A GB8336/67A GB833667A GB1111025A GB 1111025 A GB1111025 A GB 1111025A GB 8336/67 A GB8336/67 A GB 8336/67A GB 833667 A GB833667 A GB 833667A GB 1111025 A GB1111025 A GB 1111025A
- Authority
- GB
- United Kingdom
- Prior art keywords
- crystal
- detector
- melt
- crucible
- viewed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
- C30B15/26—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1004—Apparatus with means for measuring, testing, or sensing
- Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1072—Seed pulling including details of means providing product movement [e.g., shaft guides, servo means]
Abstract
1,111,025. Crystal-pulling. INTERNATIONAL BUSINESS MACHINES CORPORATION. 22 Feb., 1967 [1 March, 1966], No. 8336/67- Heading B1S. [Also in Division G1] The growth conditions of a silicon crystal 20 are adjusted according to the output from a detector 30 sensing both visible light and infra-red radiation from the melt 10. Crystal pull, crucible rotation, crystal rotation, and crucible lift may be controlled, the last named in order to maintain constant the distance between the radiating surface and the detector. The detector may be movable for example by programme to monitor different points on the surface of the melt, monitoring of cooler points towards the periphery of the melt giving a larger crystal cross-section. The crucible is heated by an electrical resistance and covered by a belt jar into which impurities may be introduced. The surface may be viewed through polished fused quartz which may be kept free from deposits by a gas shield. Optimum viewing angles are discussed polarising attenuating discs being introduced as necessary in the radiation path. Control may be effected by a combination of a silicon controlled rectifier and a resetting magnetic amplifier. Suitable spectral bands and dimensions of field viewed are exemplified.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US53081966A | 1966-03-01 | 1966-03-01 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1111025A true GB1111025A (en) | 1968-04-24 |
Family
ID=24115116
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8336/67A Expired GB1111025A (en) | 1966-03-01 | 1967-02-22 | Improvements in and relating to control systems |
Country Status (4)
Country | Link |
---|---|
US (1) | US3493770A (en) |
JP (2) | JPS4814873B1 (en) |
FR (1) | FR1522292A (en) |
GB (1) | GB1111025A (en) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4949306B1 (en) * | 1969-08-20 | 1974-12-26 | ||
US3639718A (en) * | 1970-06-15 | 1972-02-01 | Little Inc A | Pressure- and temperature-controlled crystal growing apparatus |
US3740563A (en) * | 1971-06-25 | 1973-06-19 | Monsanto Co | Electroptical system and method for sensing and controlling the diameter and melt level of pulled crystals |
US3865554A (en) * | 1971-09-23 | 1975-02-11 | Little Inc A | Pressure-and temperature-controlled apparatus for large-scale production of crystals by the czochralski technique |
US3761692A (en) * | 1971-10-01 | 1973-09-25 | Texas Instruments Inc | Automated crystal pulling system |
US3882319A (en) * | 1973-10-23 | 1975-05-06 | Motorola Inc | Automatic melt level control for growth of semiconductor crystals |
US3998598A (en) * | 1973-11-23 | 1976-12-21 | Semimetals, Inc. | Automatic diameter control for crystal growing facilities |
DE2420899A1 (en) * | 1974-04-30 | 1975-12-11 | Wacker Chemitronic | METHOD FOR PRODUCING SINGLE CRYSTALLINE GALLIUM ARSENIDE |
US3958129A (en) * | 1974-08-05 | 1976-05-18 | Motorola, Inc. | Automatic crystal diameter control for growth of semiconductor crystals |
US4058429A (en) * | 1975-12-04 | 1977-11-15 | Westinghouse Electric Corporation | Infrared temperature control of Czochralski crystal growth |
US4184907A (en) * | 1977-03-17 | 1980-01-22 | Mobil Tyco Solar Energy Corporation | Control of capillary die shaped crystal growth of silicon and germanium crystals |
US4185076A (en) * | 1977-03-17 | 1980-01-22 | Mobil Tyco Solar Energy Corporation | Apparatus for controlled growth of silicon and germanium crystal ribbons |
US4290835A (en) * | 1978-06-14 | 1981-09-22 | Mobil Tyco Solar Energy Corporation | Method for crystal growth control |
DE2923240A1 (en) * | 1979-06-08 | 1980-12-18 | Leybold Heraeus Gmbh & Co Kg | MEASURING METHOD AND MEASURING ARRANGEMENT FOR THE DIAMETER OF SINGLE CRYSTALS IN PULLING |
US4282184A (en) * | 1979-10-09 | 1981-08-04 | Siltec Corporation | Continuous replenishment of molten semiconductor in a Czochralski-process, single-crystal-growing furnace |
JPS5815098A (en) * | 1981-07-16 | 1983-01-28 | Toshiba Corp | Production of single crystal |
DE3219409C2 (en) * | 1982-05-19 | 1984-10-11 | Schweizerische Aluminium Ag, Chippis | Method for determining the rate of oxidation at the surface of a molten metal |
US4511428A (en) * | 1982-07-09 | 1985-04-16 | International Business Machines Corporation | Method of controlling oxygen content and distribution in grown silicon crystals |
US4659423A (en) * | 1986-04-28 | 1987-04-21 | International Business Machines Corporation | Semiconductor crystal growth via variable melt rotation |
US5215620A (en) * | 1989-09-19 | 1993-06-01 | Shin-Etsu Handotai Co. Ltd. | Method for pulling a silicon single crystal by imposing a periodic rotation rate on a constant rotation rate |
US5269875A (en) * | 1989-10-05 | 1993-12-14 | Shin-Etsu Handotai Company, Limited | Method of adjusting concentration of oxygen in silicon single crystal and apparatus for use in the method |
US5037621A (en) * | 1989-11-09 | 1991-08-06 | The United States Of America As Represented By The Secretary Of The Army | System for the in-situ visualization of a solid liquid interface during crystal growth |
JPH0785489B2 (en) * | 1991-02-08 | 1995-09-13 | 信越半導体株式会社 | Single crystal diameter measurement method |
US5593498A (en) * | 1995-06-09 | 1997-01-14 | Memc Electronic Materials, Inc. | Apparatus for rotating a crucible of a crystal pulling machine |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2246907A (en) * | 1940-04-12 | 1941-06-24 | William R Webster | Continuous molding machine |
US2979386A (en) * | 1956-08-02 | 1961-04-11 | Shockley William | Crystal growing apparatus |
NL253106A (en) * | 1960-06-25 | |||
US3291650A (en) * | 1963-12-23 | 1966-12-13 | Gen Motors Corp | Control of crystal size |
US3337303A (en) * | 1965-03-01 | 1967-08-22 | Elmat Corp | Crystal growing apparatus |
-
1966
- 1966-03-01 US US530819A patent/US3493770A/en not_active Expired - Lifetime
-
1967
- 1967-01-23 JP JP42004205A patent/JPS4814873B1/ja active Pending
- 1967-02-14 FR FR8350A patent/FR1522292A/en not_active Expired
- 1967-02-22 GB GB8336/67A patent/GB1111025A/en not_active Expired
-
1972
- 1972-12-05 JP JP47121277A patent/JPS5036341B1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE1619967B2 (en) | 1972-06-08 |
DE1619967A1 (en) | 1970-07-30 |
JPS5036341B1 (en) | 1975-11-22 |
JPS4814873B1 (en) | 1973-05-10 |
FR1522292A (en) | 1968-04-26 |
US3493770A (en) | 1970-02-03 |
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