GB1042270A - Variable capacitance diodes - Google Patents

Variable capacitance diodes

Info

Publication number
GB1042270A
GB1042270A GB3309564A GB3309564A GB1042270A GB 1042270 A GB1042270 A GB 1042270A GB 3309564 A GB3309564 A GB 3309564A GB 3309564 A GB3309564 A GB 3309564A GB 1042270 A GB1042270 A GB 1042270A
Authority
GB
United Kingdom
Prior art keywords
junction
diffusion
region
alloying
aug
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3309564A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Micronas GmbH
Original Assignee
TDK Micronas GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Micronas GmbH filed Critical TDK Micronas GmbH
Publication of GB1042270A publication Critical patent/GB1042270A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/92Capacitors having potential barriers
    • H01L29/93Variable capacitance diodes, e.g. varactors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Recrystallisation Techniques (AREA)
  • Thyristors (AREA)

Abstract

1,042,270. Semi-conductor devices. INTERMETALL GES FUR METALLURGIE UND ELECTRONIK. Aug. 13, 1964 [Aug. 13, 1963], No. 33095/64. Heading H1K. A variable capacitance PN-junction diode consists of a P+ region surrounded by P material and an N + zone forming a junction of which the central area 3 contacts the P + region and the outer area 4 contacts the P material. The invention also covers the opposite arrangement, with N for P and vice versa. The P+N+ junction 3 provides for a relatively large change in capacitance for a given voltage change and the surrounding junction 4 has a relatively high breakdown voltage. The device shown is a P silicon body-or a P layer on a P+ body, not shown-in which a P+ region has been formed by diffusion or alloying through an oxide mask. If diffusion is used, this may be by the technique of embedding the masked body in a powder of highly doped semi-conductor. The preferred dopant is boron. The N+ zone is formed by diffusion, alloying or epitaxial growth through a new oxide mask 2. In this case the preferred dopant is phosphorous. The second mask, 2, is left in position to protect the junction.
GB3309564A 1963-08-13 1964-08-13 Variable capacitance diodes Expired GB1042270A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEJ0024244 1963-08-13

Publications (1)

Publication Number Publication Date
GB1042270A true GB1042270A (en) 1966-09-14

Family

ID=7201736

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3309564A Expired GB1042270A (en) 1963-08-13 1964-08-13 Variable capacitance diodes

Country Status (3)

Country Link
DE (1) DE1464703B2 (en)
FR (1) FR1390594A (en)
GB (1) GB1042270A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3579278A (en) * 1967-10-12 1971-05-18 Varian Associates Surface barrier diode having a hypersensitive {72 {30 {0 region forming a hypersensitive voltage variable capacitor
US3999212A (en) * 1967-03-03 1976-12-21 Hitachi, Ltd. Field effect semiconductor device having a protective diode

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2405067C2 (en) * 1974-02-02 1982-06-03 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Method for manufacturing a semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3999212A (en) * 1967-03-03 1976-12-21 Hitachi, Ltd. Field effect semiconductor device having a protective diode
US3579278A (en) * 1967-10-12 1971-05-18 Varian Associates Surface barrier diode having a hypersensitive {72 {30 {0 region forming a hypersensitive voltage variable capacitor

Also Published As

Publication number Publication date
FR1390594A (en) 1965-02-26
DE1464703A1 (en) 1968-11-28
DE1464703B2 (en) 1973-04-19

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