GB1027909A - Window for x-ray microanalyzers - Google Patents

Window for x-ray microanalyzers

Info

Publication number
GB1027909A
GB1027909A GB33387/64A GB3338764A GB1027909A GB 1027909 A GB1027909 A GB 1027909A GB 33387/64 A GB33387/64 A GB 33387/64A GB 3338764 A GB3338764 A GB 3338764A GB 1027909 A GB1027909 A GB 1027909A
Authority
GB
United Kingdom
Prior art keywords
enclosure
window
rays
opening
soft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB33387/64A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CIE D APPLIC MECANIQUES A L EL
Original Assignee
CIE D APPLIC MECANIQUES A L EL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CIE D APPLIC MECANIQUES A L EL filed Critical CIE D APPLIC MECANIQUES A L EL
Publication of GB1027909A publication Critical patent/GB1027909A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J5/00—Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
    • H01J5/02—Vessels; Containers; Shields associated therewith; Vacuum locks
    • H01J5/18—Windows permeable to X-rays, gamma-rays, or particles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB33387/64A 1963-08-27 1964-08-14 Window for x-ray microanalyzers Expired GB1027909A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR945748A FR1375173A (fr) 1963-08-27 1963-08-27 Fenêtre pour microanalyseurs à rayons x

Publications (1)

Publication Number Publication Date
GB1027909A true GB1027909A (en) 1966-04-27

Family

ID=8811222

Family Applications (1)

Application Number Title Priority Date Filing Date
GB33387/64A Expired GB1027909A (en) 1963-08-27 1964-08-14 Window for x-ray microanalyzers

Country Status (4)

Country Link
US (1) US3319064A (fr)
DE (1) DE1297898B (fr)
FR (1) FR1375173A (fr)
GB (1) GB1027909A (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1205231A (en) * 1966-12-13 1970-09-16 Ass Elect Ind Improvements relating to x-ray and gamma ray apparatus
US3663812A (en) * 1969-02-27 1972-05-16 Mc Donnell Douglas Corp X-ray spectrographic means having fixed analyzing and detecting means
JPS515316B1 (fr) * 1969-09-25 1976-02-19
US4463257A (en) * 1982-08-05 1984-07-31 Tracor Xray Inc. Rotatable support for selectively aligning a window with the channel of a probe
US7618906B2 (en) * 2005-11-17 2009-11-17 Oxford Instruments Analytical Oy Window membrane for detector and analyser devices, and a method for manufacturing a window membrane
US7474730B2 (en) * 2006-10-17 2009-01-06 Oxford Instruments Analytical Oy Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2094103A (en) * 1935-10-12 1937-09-28 Picker X Ray Corp Waite Mfg Roentgen ray control unit
DE962206C (de) * 1954-05-10 1957-04-18 Berthold Schumacher Dipl Phys Apparatur zur spektrochemischen Analyse und zur Strukturanalyse von festen Stoffen, Fluessigkeiten und Gasen mittels Roentgenstrahlen
DE1084044B (de) * 1958-04-01 1960-06-23 Berthold W Schumacher Dipl Phy Satz dynamischer Druckstufen

Also Published As

Publication number Publication date
DE1297898B (de) 1969-06-19
FR1375173A (fr) 1964-10-16
US3319064A (en) 1967-05-09

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