GB1000456A - Semiconductor piezoresistance device - Google Patents
Semiconductor piezoresistance deviceInfo
- Publication number
- GB1000456A GB1000456A GB39639/61A GB3963961A GB1000456A GB 1000456 A GB1000456 A GB 1000456A GB 39639/61 A GB39639/61 A GB 39639/61A GB 3963961 A GB3963961 A GB 3963961A GB 1000456 A GB1000456 A GB 1000456A
- Authority
- GB
- United Kingdom
- Prior art keywords
- type
- bar
- active
- regions
- semi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 238000009792 diffusion process Methods 0.000 abstract 3
- 239000000463 material Substances 0.000 abstract 3
- 239000002344 surface layer Substances 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 2
- 230000035945 sensitivity Effects 0.000 abstract 2
- 229910052710 silicon Inorganic materials 0.000 abstract 2
- 239000010703 silicon Substances 0.000 abstract 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 abstract 1
- 230000000694 effects Effects 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 229910052733 gallium Inorganic materials 0.000 abstract 1
- 229910052732 germanium Inorganic materials 0.000 abstract 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
- 230000003993 interaction Effects 0.000 abstract 1
- 239000010410 layer Substances 0.000 abstract 1
- 230000000873 masking effect Effects 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 210000002105 tongue Anatomy 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
- G01L1/2293—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges of the semi-conductor type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
- G01P15/123—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R21/00—Variable-resistance transducers
- H04R21/02—Microphones
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R23/00—Transducers other than those covered by groups H04R9/00 - H04R21/00
- H04R23/006—Transducers other than those covered by groups H04R9/00 - H04R21/00 using solid state devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/50—Devices controlled by mechanical forces, e.g. pressure
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Signal Processing (AREA)
- General Physics & Mathematics (AREA)
- Pressure Sensors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US6949360A | 1960-11-15 | 1960-11-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1000456A true GB1000456A (en) | 1965-08-04 |
Family
ID=22089358
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB39639/61A Expired GB1000456A (en) | 1960-11-15 | 1961-11-06 | Semiconductor piezoresistance device |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB1000456A (enrdf_load_stackoverflow) |
NL (1) | NL271209A (enrdf_load_stackoverflow) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3493912A (en) * | 1966-10-25 | 1970-02-03 | Ether Eng Ltd | Strain responsive transducer means of the diaphragm type |
US4553436A (en) * | 1982-11-09 | 1985-11-19 | Texas Instruments Incorporated | Silicon accelerometer |
EP0269759A1 (en) * | 1986-12-02 | 1988-06-08 | B.E.E. Co. Ltd. | Semiconductor strain gauge |
US4825696A (en) * | 1986-03-20 | 1989-05-02 | Robert Bosch Gmbh | Acceleration detector |
US4955234A (en) * | 1988-05-03 | 1990-09-11 | Robert Bosch Gmbh | Sensor |
US5212986A (en) * | 1990-11-30 | 1993-05-25 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor acceleration sensor including off axis acceleration cancellation |
WO2006055731A1 (en) * | 2004-11-17 | 2006-05-26 | The Regents Of The University Of California | Microelectromechanical systems contact stress sensor |
EP2398264A2 (en) | 2010-06-17 | 2011-12-21 | Vodafone IP Licensing Limited | Fallback between radio access technologies |
-
0
- NL NL271209D patent/NL271209A/xx unknown
-
1961
- 1961-11-06 GB GB39639/61A patent/GB1000456A/en not_active Expired
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3493912A (en) * | 1966-10-25 | 1970-02-03 | Ether Eng Ltd | Strain responsive transducer means of the diaphragm type |
US4553436A (en) * | 1982-11-09 | 1985-11-19 | Texas Instruments Incorporated | Silicon accelerometer |
US4825696A (en) * | 1986-03-20 | 1989-05-02 | Robert Bosch Gmbh | Acceleration detector |
EP0269759A1 (en) * | 1986-12-02 | 1988-06-08 | B.E.E. Co. Ltd. | Semiconductor strain gauge |
US4955234A (en) * | 1988-05-03 | 1990-09-11 | Robert Bosch Gmbh | Sensor |
US5212986A (en) * | 1990-11-30 | 1993-05-25 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor acceleration sensor including off axis acceleration cancellation |
WO2006055731A1 (en) * | 2004-11-17 | 2006-05-26 | The Regents Of The University Of California | Microelectromechanical systems contact stress sensor |
EP2398264A2 (en) | 2010-06-17 | 2011-12-21 | Vodafone IP Licensing Limited | Fallback between radio access technologies |
Also Published As
Publication number | Publication date |
---|---|
NL271209A (enrdf_load_stackoverflow) |
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