NL271209A - - Google Patents
Info
- Publication number
- NL271209A NL271209A NL271209DA NL271209A NL 271209 A NL271209 A NL 271209A NL 271209D A NL271209D A NL 271209DA NL 271209 A NL271209 A NL 271209A
- Authority
- NL
- Netherlands
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
- G01L1/2293—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges of the semi-conductor type
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
- G01P15/123—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R21/00—Variable-resistance transducers
- H04R21/02—Microphones
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R23/00—Transducers other than those covered by groups H04R9/00 - H04R21/00
- H04R23/006—Transducers other than those covered by groups H04R9/00 - H04R21/00 using solid state devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/50—Devices controlled by mechanical forces, e.g. pressure
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Signal Processing (AREA)
- General Physics & Mathematics (AREA)
- Pressure Sensors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US6949360A | 1960-11-15 | 1960-11-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL271209A true NL271209A (enrdf_load_stackoverflow) |
Family
ID=22089358
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL271209D NL271209A (enrdf_load_stackoverflow) | 1960-11-15 |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB1000456A (enrdf_load_stackoverflow) |
NL (1) | NL271209A (enrdf_load_stackoverflow) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1155286A (en) * | 1966-10-25 | 1969-06-18 | Ether Eng Ltd | Improvements in or relating to Transducer Devices. |
US4553436A (en) * | 1982-11-09 | 1985-11-19 | Texas Instruments Incorporated | Silicon accelerometer |
DE8607653U1 (de) * | 1986-03-20 | 1987-08-06 | Robert Bosch Gmbh, 7000 Stuttgart | Beschleunigungsaufnehmer |
EP0269759A1 (en) * | 1986-12-02 | 1988-06-08 | B.E.E. Co. Ltd. | Semiconductor strain gauge |
DE3814952A1 (de) * | 1988-05-03 | 1989-11-23 | Bosch Gmbh Robert | Sensor |
JPH0830716B2 (ja) * | 1990-11-30 | 1996-03-27 | 三菱電機株式会社 | 半導体加速度検出装置 |
US7311009B2 (en) * | 2004-11-17 | 2007-12-25 | Lawrence Livermore National Security, Llc | Microelectromechanical systems contact stress sensor |
GB201010186D0 (en) | 2010-06-17 | 2010-07-21 | Vodafone Ip Licensing Ltd | Fallback between radio access technologies |
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0
- NL NL271209D patent/NL271209A/xx unknown
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1961
- 1961-11-06 GB GB39639/61A patent/GB1000456A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB1000456A (en) | 1965-08-04 |