GB0316577D0 - Atomic force microscope - Google Patents

Atomic force microscope

Info

Publication number
GB0316577D0
GB0316577D0 GB0316577A GB0316577A GB0316577D0 GB 0316577 D0 GB0316577 D0 GB 0316577D0 GB 0316577 A GB0316577 A GB 0316577A GB 0316577 A GB0316577 A GB 0316577A GB 0316577 D0 GB0316577 D0 GB 0316577D0
Authority
GB
United Kingdom
Prior art keywords
atomic force
force microscope
microscope
atomic
force
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GB0316577A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Bristol
Original Assignee
University of Bristol
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Bristol filed Critical University of Bristol
Priority to GB0316577A priority Critical patent/GB0316577D0/en
Publication of GB0316577D0 publication Critical patent/GB0316577D0/en
Priority to PCT/GB2004/003065 priority patent/WO2005008679A1/en
Priority to JP2006520002A priority patent/JP4832296B2/ja
Priority to EP04743406A priority patent/EP1644937A1/en
Priority to RU2006104612/28A priority patent/RU2356110C2/ru
Priority to KR1020067000904A priority patent/KR101195729B1/ko
Priority to US10/564,598 priority patent/US7596989B2/en
Priority to CN 200480023496 priority patent/CN100592088C/zh
Priority to IL173090A priority patent/IL173090A/en
Ceased legal-status Critical Current

Links

GB0316577A 2003-07-15 2003-07-15 Atomic force microscope Ceased GB0316577D0 (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
GB0316577A GB0316577D0 (en) 2003-07-15 2003-07-15 Atomic force microscope
PCT/GB2004/003065 WO2005008679A1 (en) 2003-07-15 2004-07-15 Probe for an atomic force microscope
JP2006520002A JP4832296B2 (ja) 2003-07-15 2004-07-15 原子間力顕微鏡用プローブ
EP04743406A EP1644937A1 (en) 2003-07-15 2004-07-15 Probe for an atomic force microscope
RU2006104612/28A RU2356110C2 (ru) 2003-07-15 2004-07-15 Зонд для атомного силового микроскопа
KR1020067000904A KR101195729B1 (ko) 2003-07-15 2004-07-15 원자력 현미경용 탐침 및 그 사용 방법
US10/564,598 US7596989B2 (en) 2003-07-15 2004-07-15 Probe for an atomic force microscope
CN 200480023496 CN100592088C (zh) 2003-07-15 2004-07-15 原子力显微镜探针
IL173090A IL173090A (en) 2003-07-15 2006-01-11 Probe for an atomic force microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0316577A GB0316577D0 (en) 2003-07-15 2003-07-15 Atomic force microscope

Publications (1)

Publication Number Publication Date
GB0316577D0 true GB0316577D0 (en) 2003-08-20

Family

ID=27763882

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0316577A Ceased GB0316577D0 (en) 2003-07-15 2003-07-15 Atomic force microscope

Country Status (2)

Country Link
CN (1) CN100592088C (zh)
GB (1) GB0316577D0 (zh)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2282217B1 (en) * 2009-08-07 2018-01-03 SPECS Surface Nano Analysis GmbH Metal tip for scanning probe applications and method of producing the same
CN102495043B (zh) * 2011-12-14 2013-10-30 中国科学院苏州纳米技术与纳米仿生研究所 半导体材料表面缺陷测量装置及表面缺陷测量方法
WO2015085316A1 (en) * 2013-12-07 2015-06-11 Bruker Nano, Inc. Force measurement with real-time baseline determination
CN103869103B (zh) * 2014-03-27 2016-04-06 上海华力微电子有限公司 原子力显微镜探针装置
CN106716142B (zh) * 2014-12-29 2019-04-09 史拓莱姆有限公司 具有贴附式探针的检测装置
CN105807792B (zh) * 2016-03-09 2018-08-10 西安交通大学 扫描离子电导显微镜的片上化控制器及控制方法
CN107192854B (zh) * 2017-04-18 2020-12-04 天津大学 原子力显微镜的z扫描器和探针装置及探针装置安装器
JP7486820B2 (ja) * 2018-05-25 2024-05-20 モレキュラー・ビスタ・インコーポレイテッド サンプルに対する光誘起力を改善するためにセンサ分子を用いるスキャニングプローブ顕微鏡
CN109297965B (zh) * 2018-11-16 2020-09-29 中山大学 光学成像系统、方法、装置及存储介质
EP3722817B1 (en) * 2019-04-12 2022-05-11 attocube systems AG Active bimodal afm operation for measurements of optical interaction
KR20210150608A (ko) * 2019-05-03 2021-12-10 브루커 나노, 아이엔씨. 토션 윙 프로브 어셈블리
CN110127588B (zh) * 2019-05-22 2022-02-22 季华实验室 用于加工衬底材料的钝化层的探针
CN110954714B (zh) * 2019-12-20 2021-10-19 江苏集萃微纳自动化系统与装备技术研究所有限公司 一种原子力显微镜的探针的刚度实时调节方法
CN111896776B (zh) * 2020-06-30 2021-10-22 中山大学 原子力显微镜探针及其制作方法
CN113624999B (zh) * 2021-08-06 2023-06-23 国家纳米科学中心 低品质因子微悬臂探针、其制备方法及显微镜

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4435635A1 (de) * 1994-10-06 1996-06-05 Inst Physikalische Hochtech Ev Mikrobiegebalken für die atomare Kraftmikroskopie und Verfahren zu seiner Herstellung
JP3210961B2 (ja) * 1997-04-15 2001-09-25 北海道大学長 交換相互作用力の測定装置
US6245204B1 (en) * 1999-03-23 2001-06-12 Molecular Imaging Corporation Vibrating tip conducting probe microscope
US6349591B1 (en) * 2000-01-13 2002-02-26 Universite Pierre & Marie Curie Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation

Also Published As

Publication number Publication date
CN100592088C (zh) 2010-02-24
CN1836290A (zh) 2006-09-20

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)