FR3061602B1 - Systeme d'identification d'une puce 3d - Google Patents
Systeme d'identification d'une puce 3d Download PDFInfo
- Publication number
- FR3061602B1 FR3061602B1 FR1750011A FR1750011A FR3061602B1 FR 3061602 B1 FR3061602 B1 FR 3061602B1 FR 1750011 A FR1750011 A FR 1750011A FR 1750011 A FR1750011 A FR 1750011A FR 3061602 B1 FR3061602 B1 FR 3061602B1
- Authority
- FR
- France
- Prior art keywords
- chip
- identifying
- components
- output signals
- elementary circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 abstract 2
- 230000001419 dependent effect Effects 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/528—Geometry or layout of the interconnection structure
- H01L23/5283—Cross-sectional geometry
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/10—Processing, recording or transmission of stereoscopic or multi-view image signals
- H04N13/106—Processing image signals
- H04N13/172—Processing image signals image signals comprising non-image signal components, e.g. headers or format information
- H04N13/178—Metadata, e.g. disparity information
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B42—BOOKBINDING; ALBUMS; FILES; SPECIAL PRINTED MATTER
- B42D—BOOKS; BOOK COVERS; LOOSE LEAVES; PRINTED MATTER CHARACTERISED BY IDENTIFICATION OR SECURITY FEATURES; PRINTED MATTER OF SPECIAL FORMAT OR STYLE NOT OTHERWISE PROVIDED FOR; DEVICES FOR USE THEREWITH AND NOT OTHERWISE PROVIDED FOR; MOVABLE-STRIP WRITING OR READING APPARATUS
- B42D25/00—Information-bearing cards or sheet-like structures characterised by identification or security features; Manufacture thereof
- B42D25/30—Identification or security features, e.g. for preventing forgery
- B42D25/305—Associated digital information
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B42—BOOKBINDING; ALBUMS; FILES; SPECIAL PRINTED MATTER
- B42D—BOOKS; BOOK COVERS; LOOSE LEAVES; PRINTED MATTER CHARACTERISED BY IDENTIFICATION OR SECURITY FEATURES; PRINTED MATTER OF SPECIAL FORMAT OR STYLE NOT OTHERWISE PROVIDED FOR; DEVICES FOR USE THEREWITH AND NOT OTHERWISE PROVIDED FOR; MOVABLE-STRIP WRITING OR READING APPARATUS
- B42D25/00—Information-bearing cards or sheet-like structures characterised by identification or security features; Manufacture thereof
- B42D25/40—Manufacture
- B42D25/405—Marking
- B42D25/415—Marking using chemicals
- B42D25/42—Marking using chemicals by photographic processes
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54413—Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/5442—Marks applied to semiconductor devices or parts comprising non digital, non alphanumeric information, e.g. symbols
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54433—Marks applied to semiconductor devices or parts containing identification or tracking information
- H01L2223/5444—Marks applied to semiconductor devices or parts containing identification or tracking information for electrical read out
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Library & Information Science (AREA)
- Geometry (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
L'invention concerne une puce comprenant : au moins deux niveaux semiconducteurs superposés, dans chacun desquels sont formés des circuits élémentaires (58, 59) d'un même type tous connectés à un même noeud d'entrée ; et une pluralité de composants (74), chacun étant adapté à fournir une valeur dépendant d'une différence entre les signaux de sortie de premier et second circuits élémentaires, situés respectivement dans des premier et second niveaux semiconducteurs, les signaux de sortie de la pluralité de composants étant combinés pour former un nombre.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1750011A FR3061602B1 (fr) | 2017-01-02 | 2017-01-02 | Systeme d'identification d'une puce 3d |
US15/681,135 US10075694B2 (en) | 2017-01-02 | 2017-08-18 | System for identifying a 3D chip |
CN201721096616.9U CN207624691U (zh) | 2017-01-02 | 2017-08-30 | 半导体芯片及其半导体系统 |
CN201710761904.XA CN108269783B (zh) | 2017-01-02 | 2017-08-30 | 用于标识3d芯片的系统 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1750011 | 2017-01-02 | ||
FR1750011A FR3061602B1 (fr) | 2017-01-02 | 2017-01-02 | Systeme d'identification d'une puce 3d |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3061602A1 FR3061602A1 (fr) | 2018-07-06 |
FR3061602B1 true FR3061602B1 (fr) | 2019-05-31 |
Family
ID=58228299
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1750011A Expired - Fee Related FR3061602B1 (fr) | 2017-01-02 | 2017-01-02 | Systeme d'identification d'une puce 3d |
Country Status (3)
Country | Link |
---|---|
US (1) | US10075694B2 (fr) |
CN (2) | CN108269783B (fr) |
FR (1) | FR3061602B1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11148675B2 (en) * | 2018-08-06 | 2021-10-19 | Qualcomm Incorporated | Apparatus and method of sharing a sensor in a multiple system on chip environment |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7969163B2 (en) * | 2006-02-23 | 2011-06-28 | Finisar Corporation | Measuring signal propagation and adjustable delays in electronic devices |
JP5482025B2 (ja) * | 2009-08-28 | 2014-04-23 | ソニー株式会社 | 固体撮像装置とその製造方法、及び電子機器 |
TWI443802B (zh) * | 2010-06-22 | 2014-07-01 | Nat Univ Tsing Hua | 三維晶片之突波型態層識別編號檢測器及其方法 |
US8564305B2 (en) * | 2010-06-22 | 2013-10-22 | National Tsing Hua University | Discontinuous type layer-ID detector for 3D-IC and method of the same |
JP5115595B2 (ja) * | 2010-06-23 | 2013-01-09 | 株式会社デンソー | 半導体モジュールの製造方法 |
US7969193B1 (en) * | 2010-07-06 | 2011-06-28 | National Tsing Hua University | Differential sensing and TSV timing control scheme for 3D-IC |
KR101157032B1 (ko) * | 2010-11-17 | 2012-06-21 | 에스케이하이닉스 주식회사 | 반도체 장치 |
US8407656B2 (en) * | 2011-06-24 | 2013-03-26 | International Business Machines Corporation | Method and structure for a transistor having a relatively large threshold voltage variation range and for a random number generator incorporating multiple essentially identical transistors having such a large threshold voltage variation range |
TWI482260B (zh) * | 2012-03-30 | 2015-04-21 | Nat Univ Tsing Hua | 多層三維晶片之層識別電路及其方法 |
US9691760B2 (en) * | 2013-03-12 | 2017-06-27 | Monolithic 3D Inc | Semiconductor device and structure |
FR3045869B1 (fr) * | 2015-12-18 | 2020-02-07 | Stmicroelectronics (Crolles 2) Sas | Routage ameliore pour structure integree tridimensionnelle |
-
2017
- 2017-01-02 FR FR1750011A patent/FR3061602B1/fr not_active Expired - Fee Related
- 2017-08-18 US US15/681,135 patent/US10075694B2/en active Active
- 2017-08-30 CN CN201710761904.XA patent/CN108269783B/zh active Active
- 2017-08-30 CN CN201721096616.9U patent/CN207624691U/zh not_active Withdrawn - After Issue
Also Published As
Publication number | Publication date |
---|---|
CN207624691U (zh) | 2018-07-17 |
US20180192027A1 (en) | 2018-07-05 |
FR3061602A1 (fr) | 2018-07-06 |
US10075694B2 (en) | 2018-09-11 |
CN108269783B (zh) | 2021-06-04 |
CN108269783A (zh) | 2018-07-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 2 |
|
PLSC | Publication of the preliminary search report |
Effective date: 20180706 |
|
PLFP | Fee payment |
Year of fee payment: 4 |
|
ST | Notification of lapse |
Effective date: 20210905 |