FR2990553B1 - Injection fet complementaire pour une cellule a corps flottant - Google Patents

Injection fet complementaire pour une cellule a corps flottant

Info

Publication number
FR2990553B1
FR2990553B1 FR1254236A FR1254236A FR2990553B1 FR 2990553 B1 FR2990553 B1 FR 2990553B1 FR 1254236 A FR1254236 A FR 1254236A FR 1254236 A FR1254236 A FR 1254236A FR 2990553 B1 FR2990553 B1 FR 2990553B1
Authority
FR
France
Prior art keywords
injection
floating body
body cell
complementary fet
fet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1254236A
Other languages
English (en)
Other versions
FR2990553A1 (fr
Inventor
Franz Hofmann
Richard Ferrant
Carlos Mazure
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soitec SA
Original Assignee
Soitec SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Soitec SA filed Critical Soitec SA
Priority to FR1254236A priority Critical patent/FR2990553B1/fr
Priority to PCT/EP2013/059651 priority patent/WO2013167691A1/fr
Priority to US14/396,665 priority patent/US20150145049A1/en
Priority to CN201380024974.7A priority patent/CN104321872B/zh
Publication of FR2990553A1 publication Critical patent/FR2990553A1/fr
Application granted granted Critical
Publication of FR2990553B1 publication Critical patent/FR2990553B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • H01L27/092Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1203Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/7841Field effect transistors with field effect produced by an insulated gate with floating body, e.g. programmable transistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/20DRAM devices comprising floating-body transistors, e.g. floating-body cells

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Semiconductor Memories (AREA)
FR1254236A 2012-05-09 2012-05-09 Injection fet complementaire pour une cellule a corps flottant Active FR2990553B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR1254236A FR2990553B1 (fr) 2012-05-09 2012-05-09 Injection fet complementaire pour une cellule a corps flottant
PCT/EP2013/059651 WO2013167691A1 (fr) 2012-05-09 2013-05-08 Injection à fet complémentaires pour une cellule à corps flottant
US14/396,665 US20150145049A1 (en) 2012-05-09 2013-05-08 Complementary fet injection for a floating body cell
CN201380024974.7A CN104321872B (zh) 2012-05-09 2013-05-08 用于浮体单元的互补fet注入

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1254236A FR2990553B1 (fr) 2012-05-09 2012-05-09 Injection fet complementaire pour une cellule a corps flottant

Publications (2)

Publication Number Publication Date
FR2990553A1 FR2990553A1 (fr) 2013-11-15
FR2990553B1 true FR2990553B1 (fr) 2015-02-20

Family

ID=46963792

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1254236A Active FR2990553B1 (fr) 2012-05-09 2012-05-09 Injection fet complementaire pour une cellule a corps flottant

Country Status (4)

Country Link
US (1) US20150145049A1 (fr)
CN (1) CN104321872B (fr)
FR (1) FR2990553B1 (fr)
WO (1) WO2013167691A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI835705B (zh) * 2018-04-18 2024-03-11 美商季諾半導體股份有限公司 包括電性浮體電晶體的記憶裝置

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6111778A (en) * 1999-05-10 2000-08-29 International Business Machines Corporation Body contacted dynamic memory
JP3808763B2 (ja) * 2001-12-14 2006-08-16 株式会社東芝 半導体メモリ装置およびその製造方法
JP2003243528A (ja) * 2002-02-13 2003-08-29 Toshiba Corp 半導体装置
US6617637B1 (en) * 2002-11-13 2003-09-09 Ememory Technology Inc. Electrically erasable programmable logic device
US6914825B2 (en) * 2003-04-03 2005-07-05 Ememory Technology Inc. Semiconductor memory device having improved data retention
JP2005175090A (ja) * 2003-12-09 2005-06-30 Toshiba Corp 半導体メモリ装置及びその製造方法
US7391640B2 (en) * 2004-12-10 2008-06-24 Intel Corporation 2-transistor floating-body dram
US7670928B2 (en) * 2006-06-14 2010-03-02 Intel Corporation Ultra-thin oxide bonding for S1 to S1 dual orientation bonding
US20070296034A1 (en) * 2006-06-26 2007-12-27 Hsin-Ming Chen Silicon-on-insulator (soi) memory device
US7768059B2 (en) * 2006-06-26 2010-08-03 Ememory Technology Inc. Nonvolatile single-poly memory device
US7592209B2 (en) * 2006-11-13 2009-09-22 Intel Corporation Integration of a floating body memory on SOI with logic transistors on bulk substrate
US8514622B2 (en) * 2007-11-29 2013-08-20 Zeno Semiconductor, Inc. Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making
US7760548B2 (en) * 2006-11-29 2010-07-20 Yuniarto Widjaja Semiconductor memory having both volatile and non-volatile functionality and method of operating
KR100801707B1 (ko) * 2006-12-13 2008-02-11 삼성전자주식회사 플로팅 바디 메모리 및 그 제조방법
US9230651B2 (en) * 2012-04-08 2016-01-05 Zeno Semiconductor, Inc. Memory device having electrically floating body transitor
JP2008300520A (ja) * 2007-05-30 2008-12-11 Ricoh Co Ltd 半導体装置
US8085594B2 (en) * 2007-06-01 2011-12-27 Micron Technology, Inc. Reading technique for memory cell with electrically floating body transistor
US7847338B2 (en) * 2007-10-24 2010-12-07 Yuniarto Widjaja Semiconductor memory having both volatile and non-volatile functionality and method of operating
US8536628B2 (en) * 2007-11-29 2013-09-17 Micron Technology, Inc. Integrated circuit having memory cell array including barriers, and method of manufacturing same
JP2011009454A (ja) * 2009-06-25 2011-01-13 Renesas Electronics Corp 半導体装置
IT1397228B1 (it) * 2009-12-30 2013-01-04 St Microelectronics Srl Dispositivo di memoria con singolo transistore di selezione
US8582359B2 (en) * 2010-11-16 2013-11-12 Zeno Semiconductor, Inc. Dual-port semiconductor memory and first-in first-out (FIFO) memory having electrically floating body transistor
US8835900B2 (en) * 2011-06-07 2014-09-16 International Business Machines Corporation Highly scaled ETSOI floating body memory and memory circuit
US8658495B2 (en) * 2012-03-08 2014-02-25 Ememory Technology Inc. Method of fabricating erasable programmable single-poly nonvolatile memory

Also Published As

Publication number Publication date
CN104321872B (zh) 2017-10-31
CN104321872A (zh) 2015-01-28
WO2013167691A1 (fr) 2013-11-14
FR2990553A1 (fr) 2013-11-15
US20150145049A1 (en) 2015-05-28

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