FR2960978B1 - Comparateur de sequence asynchrone pour circuit d'autotest integre - Google Patents

Comparateur de sequence asynchrone pour circuit d'autotest integre

Info

Publication number
FR2960978B1
FR2960978B1 FR1054446A FR1054446A FR2960978B1 FR 2960978 B1 FR2960978 B1 FR 2960978B1 FR 1054446 A FR1054446 A FR 1054446A FR 1054446 A FR1054446 A FR 1054446A FR 2960978 B1 FR2960978 B1 FR 2960978B1
Authority
FR
France
Prior art keywords
test circuit
integrated self
sequence comparator
asynchronous sequence
asynchronous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1054446A
Other languages
English (en)
Other versions
FR2960978A1 (fr
Inventor
Herve Le-Gall
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Grenoble 2 SAS
Original Assignee
STMicroelectronics Grenoble 2 SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Grenoble 2 SAS filed Critical STMicroelectronics Grenoble 2 SAS
Priority to FR1054446A priority Critical patent/FR2960978B1/fr
Priority to US13/154,378 priority patent/US8572447B2/en
Publication of FR2960978A1 publication Critical patent/FR2960978A1/fr
Application granted granted Critical
Publication of FR2960978B1 publication Critical patent/FR2960978B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31717—Interconnect testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FR1054446A 2010-06-07 2010-06-07 Comparateur de sequence asynchrone pour circuit d'autotest integre Expired - Fee Related FR2960978B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1054446A FR2960978B1 (fr) 2010-06-07 2010-06-07 Comparateur de sequence asynchrone pour circuit d'autotest integre
US13/154,378 US8572447B2 (en) 2010-06-07 2011-06-06 Circuitry for built-in self-test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1054446A FR2960978B1 (fr) 2010-06-07 2010-06-07 Comparateur de sequence asynchrone pour circuit d'autotest integre

Publications (2)

Publication Number Publication Date
FR2960978A1 FR2960978A1 (fr) 2011-12-09
FR2960978B1 true FR2960978B1 (fr) 2013-06-21

Family

ID=43478283

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1054446A Expired - Fee Related FR2960978B1 (fr) 2010-06-07 2010-06-07 Comparateur de sequence asynchrone pour circuit d'autotest integre

Country Status (2)

Country Link
US (1) US8572447B2 (fr)
FR (1) FR2960978B1 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2960977B1 (fr) * 2010-06-07 2012-07-13 St Microelectronics Grenoble 2 Generateur de sequence a sollicitation variable pour circuit d'autotest integre
TW201237758A (en) * 2011-03-15 2012-09-16 Askey Computer Corp Lithium cell simulating device
US8943233B1 (en) 2013-02-22 2015-01-27 Pmc-Sierra Us, Inc. Link negotiation method for enabling communication between serial attached small computer interface (SAS) storage devices
FR3051085B1 (fr) 2016-05-04 2020-02-14 Stmicroelectronics (Rousset) Sas Structure de multiplexeur
FR3051086B1 (fr) 2016-05-04 2019-07-26 Stmicroelectronics (Rousset) Sas Circuit de comptage d'impulsions
FR3051084B1 (fr) 2016-05-04 2019-08-02 Stmicroelectronics (Rousset) Sas Generateur de nombres d'oscillations
US10175296B2 (en) * 2016-12-07 2019-01-08 Intel Corporation Testing a board assembly using test cards
CN109765482A (zh) * 2019-03-11 2019-05-17 世芯电子科技(无锡)有限公司 一种多芯片间高速互连测试方法
US11774496B2 (en) * 2021-03-23 2023-10-03 Indian Institute Of Technology Pseudo-random binary sequences (PRBS) generator for performing on-chip testing and a method thereof
TWI831399B (zh) * 2022-09-30 2024-02-01 創意電子股份有限公司 半導體晶片及序列檢查電路

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1326183A (en) * 1971-01-06 1973-08-08 Saxton D Electrical pulse generators
US4142239A (en) * 1977-06-29 1979-02-27 The United States Of America As Represented By The Secretary Of The Army Apparatus for generating digital streams having variable probabilities of error
US4687980A (en) 1980-10-20 1987-08-18 Eaton Corporation X-Y addressable workpiece positioner and mask aligner using same
US5034906A (en) * 1990-03-30 1991-07-23 Microwave Logic Pseudorandom Binary Sequence delay systems
TW538250B (en) * 2000-04-21 2003-06-21 Ind Tech Res Inst Built-in self-verification circuit applied in system chip design
JP3626105B2 (ja) * 2001-03-05 2005-03-02 Ｎｅｃマイクロシステム株式会社 疑似ランダム信号発生回路
US7610526B2 (en) * 2005-01-24 2009-10-27 Hewlett-Packard Development Company, L.P. On-chip circuitry for bus validation
KR100799018B1 (ko) * 2006-12-27 2008-01-28 주식회사 하이닉스반도체 불휘발성 메모리 소자 및 자기 보상 방법
JP2008180592A (ja) * 2007-01-24 2008-08-07 Nec Electronics Corp テストパターン生成回路及びテスト回路

Also Published As

Publication number Publication date
FR2960978A1 (fr) 2011-12-09
US20110302471A1 (en) 2011-12-08
US8572447B2 (en) 2013-10-29

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20150227