FR2958756B1 - Systeme de test d'un composant electronique haute frequence - Google Patents

Systeme de test d'un composant electronique haute frequence

Info

Publication number
FR2958756B1
FR2958756B1 FR1052697A FR1052697A FR2958756B1 FR 2958756 B1 FR2958756 B1 FR 2958756B1 FR 1052697 A FR1052697 A FR 1052697A FR 1052697 A FR1052697 A FR 1052697A FR 2958756 B1 FR2958756 B1 FR 2958756B1
Authority
FR
France
Prior art keywords
extenders
bga
test system
testing
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1052697A
Other languages
English (en)
Other versions
FR2958756A1 (fr
Inventor
Christian Marot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Group SAS
Original Assignee
European Aeronautic Defence and Space Company EADS France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by European Aeronautic Defence and Space Company EADS France filed Critical European Aeronautic Defence and Space Company EADS France
Priority to FR1052697A priority Critical patent/FR2958756B1/fr
Publication of FR2958756A1 publication Critical patent/FR2958756A1/fr
Application granted granted Critical
Publication of FR2958756B1 publication Critical patent/FR2958756B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

La présente invention concerne un système de test (20) de circuits intégrés (13) encapsulés à l'intérieur de boîtiers (10) de type BGA. L'invention propose un système de test comportant des prolongateurs (23) électriques destinés à raccorder électriquement chacune des billes (15) de connexions du boîtier de type BGA à un dispositif de mesure (24) du système de test. Ledit système est configuré de sorte que les prolongateurs électriques sont respectivement placés en regard des billes de connexions du boîtier BGA. Ces prolongateurs ont pour but de faciliter l'accès à quasiment l'ensemble des billes d'un circuit intégré en boîtier BGA sans nécessité de développer un circuit de test spécifique comme dans l'état de la technique.
FR1052697A 2010-04-09 2010-04-09 Systeme de test d'un composant electronique haute frequence Expired - Fee Related FR2958756B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1052697A FR2958756B1 (fr) 2010-04-09 2010-04-09 Systeme de test d'un composant electronique haute frequence

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1052697A FR2958756B1 (fr) 2010-04-09 2010-04-09 Systeme de test d'un composant electronique haute frequence

Publications (2)

Publication Number Publication Date
FR2958756A1 FR2958756A1 (fr) 2011-10-14
FR2958756B1 true FR2958756B1 (fr) 2013-02-08

Family

ID=43244247

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1052697A Expired - Fee Related FR2958756B1 (fr) 2010-04-09 2010-04-09 Systeme de test d'un composant electronique haute frequence

Country Status (1)

Country Link
FR (1) FR2958756B1 (fr)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6046597A (en) * 1995-10-04 2000-04-04 Oz Technologies, Inc. Test socket for an IC device
US6069481A (en) * 1995-10-31 2000-05-30 Advantest Corporation Socket for measuring a ball grid array semiconductor
KR100393316B1 (ko) * 1996-08-09 2003-09-19 가부시키가이샤 아드반테스트 반도체디바이스시험장치
US6204680B1 (en) * 1997-04-15 2001-03-20 Delaware Capital Formation, Inc. Test socket
US6079987A (en) * 1997-12-26 2000-06-27 Unitechno, Inc. Connector for electronic parts
JP2003050262A (ja) * 2001-08-08 2003-02-21 Hitachi Ltd 高周波ｉｃソケット、半導体試験装置および半導体試験方法ならびに半導体装置の製造方法
JP2003066104A (ja) * 2001-08-22 2003-03-05 Advantest Corp インサートおよびこれを備えた電子部品ハンドリング装置
US8102184B2 (en) * 2006-01-17 2012-01-24 Johnstech International Test contact system for testing integrated circuits with packages having an array of signal and power contacts
WO2008123608A1 (fr) * 2007-04-04 2008-10-16 Nhk Spring Co., Ltd. Support de contact conducteur et unité de contact conducteur

Also Published As

Publication number Publication date
FR2958756A1 (fr) 2011-10-14

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