FR2941802B1 - Procede de detection de composants electroniques atypiques - Google Patents

Procede de detection de composants electroniques atypiques

Info

Publication number
FR2941802B1
FR2941802B1 FR0900424A FR0900424A FR2941802B1 FR 2941802 B1 FR2941802 B1 FR 2941802B1 FR 0900424 A FR0900424 A FR 0900424A FR 0900424 A FR0900424 A FR 0900424A FR 2941802 B1 FR2941802 B1 FR 2941802B1
Authority
FR
France
Prior art keywords
electronic components
detecting atypical
atypical electronic
detecting
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR0900424A
Other languages
English (en)
Other versions
FR2941802A1 (fr
Inventor
Francois Bergeret
Anne Ruiz
Carole Soual
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IPPON INNOVATION, FR
Original Assignee
IPPON
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR0900424A priority Critical patent/FR2941802B1/fr
Application filed by IPPON filed Critical IPPON
Priority to EP10702298A priority patent/EP2391929A1/fr
Priority to US13/146,924 priority patent/US20120053877A1/en
Priority to JP2011546872A priority patent/JP2012516994A/ja
Priority to PCT/EP2010/051235 priority patent/WO2010086456A1/fr
Priority to CN2010800163314A priority patent/CN102388347A/zh
Priority to SG2011065661A priority patent/SG174352A1/en
Publication of FR2941802A1 publication Critical patent/FR2941802A1/fr
Application granted granted Critical
Publication of FR2941802B1 publication Critical patent/FR2941802B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Complex Calculations (AREA)
  • Credit Cards Or The Like (AREA)
FR0900424A 2009-02-02 2009-02-02 Procede de detection de composants electroniques atypiques Active FR2941802B1 (fr)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FR0900424A FR2941802B1 (fr) 2009-02-02 2009-02-02 Procede de detection de composants electroniques atypiques
US13/146,924 US20120053877A1 (en) 2009-02-02 2010-02-02 Method for detecting atypical electronic components
JP2011546872A JP2012516994A (ja) 2009-02-02 2010-02-02 異常な電子コンポーネントを検出するための方法
PCT/EP2010/051235 WO2010086456A1 (fr) 2009-02-02 2010-02-02 Procédé de détection de composants électroniques atypiques
EP10702298A EP2391929A1 (fr) 2009-02-02 2010-02-02 Procédé de détection de composants électroniques atypiques
CN2010800163314A CN102388347A (zh) 2009-02-02 2010-02-02 异型电子器件的检测方法
SG2011065661A SG174352A1 (en) 2009-02-02 2010-02-02 Method for detecting atypical electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0900424A FR2941802B1 (fr) 2009-02-02 2009-02-02 Procede de detection de composants electroniques atypiques

Publications (2)

Publication Number Publication Date
FR2941802A1 FR2941802A1 (fr) 2010-08-06
FR2941802B1 true FR2941802B1 (fr) 2016-09-16

Family

ID=40951656

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0900424A Active FR2941802B1 (fr) 2009-02-02 2009-02-02 Procede de detection de composants electroniques atypiques

Country Status (7)

Country Link
US (1) US20120053877A1 (fr)
EP (1) EP2391929A1 (fr)
JP (1) JP2012516994A (fr)
CN (1) CN102388347A (fr)
FR (1) FR2941802B1 (fr)
SG (1) SG174352A1 (fr)
WO (1) WO2010086456A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9672142B2 (en) 2013-06-06 2017-06-06 International Business Machines Corporation Replacement of suspect or marginally defective computing system components during fulfillment test of build-to-order test phase
CN103615716B (zh) * 2013-08-05 2015-08-19 浙江大学 循环流化床锅炉排烟温度预测系统及方法
JP2016031568A (ja) * 2014-07-28 2016-03-07 株式会社Ihi 異常診断装置、異常診断方法及び異常診断プログラム
WO2019220481A1 (fr) * 2018-05-14 2019-11-21 富士通株式会社 Dispositif, procédé et programme d'acquisition de règles de décision
CN112180251A (zh) * 2020-08-25 2021-01-05 安徽华电宿州发电有限公司 一种基于非凸非光滑优化和图模型的电机故障诊断方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6975944B1 (en) * 1999-09-28 2005-12-13 Alpha Mos Method and apparatus for monitoring materials used in electronics
US20080189575A1 (en) * 2001-05-24 2008-08-07 Emilio Miguelanez Methods and apparatus for data analysis
US8417477B2 (en) * 2001-05-24 2013-04-09 Test Acuity Solutions, Inc. Methods and apparatus for local outlier detection
US7313454B2 (en) * 2005-12-02 2007-12-25 Mks Instruments, Inc. Method and apparatus for classifying manufacturing outputs
CN100447808C (zh) * 2007-01-12 2008-12-31 郑文明 人脸表情图像的分类及语义评判量化方法
US7494829B2 (en) * 2007-04-18 2009-02-24 Texas Instruments Incorporated Identification of outlier semiconductor devices using data-driven statistical characterization
US8041518B2 (en) * 2007-05-08 2011-10-18 Globalfoundries Inc. Determining die test protocols based on process health
JP4368905B2 (ja) * 2007-05-11 2009-11-18 シャープ株式会社 グラフ描画装置および方法、その方法を実行する歩留り解析方法および歩留り向上支援システム、プログラム、並びにコンピュータ読み取り可能な記録媒体
JP2009147015A (ja) * 2007-12-12 2009-07-02 Hitachi Ulsi Systems Co Ltd 半導体装置の検査方法、検査システム及び製造方法
US20090164931A1 (en) * 2007-12-19 2009-06-25 Formfactor, Inc. Method and Apparatus for Managing Test Result Data Generated by a Semiconductor Test System

Also Published As

Publication number Publication date
JP2012516994A (ja) 2012-07-26
CN102388347A (zh) 2012-03-21
FR2941802A1 (fr) 2010-08-06
US20120053877A1 (en) 2012-03-01
EP2391929A1 (fr) 2011-12-07
SG174352A1 (en) 2011-10-28
WO2010086456A1 (fr) 2010-08-05

Similar Documents

Publication Publication Date Title
FR2979736B1 (fr) Procede de detection de messages sia
EP2700009A4 (fr) Analyse de messages électroniques pour la détection de logiciels malveillants
BRPI1012176A2 (pt) aparelho de detecção microbiana automatizado
EP2411793A4 (fr) Dispositif de détection d'un analyte
DK3730045T3 (da) Fremgangsmåde til indføring af en analytsensor
HK1172435A1 (en) Mechanisms for detecting tampering of an electronic device
EP2504702A4 (fr) Dispositifs de détection de composés à analyser
EP2580576A4 (fr) Appareil de détection de molécule unique
IT1391785B1 (it) Sistema elettronico per il rilevamento di un guasto
PL3050974T3 (pl) Sposób detekcji narażonych na wilgoć pasków testowych do moczu
BRPI1016248A2 (pt) aparelho de detecção de anormalidade e rastreamento de veículo
DE112009005292B8 (de) Objekterfassungsvorrichtung
BRPI1007082A2 (pt) sistema de monitoramento de posição
FR2963616B1 (fr) Procede et installation de sechage de boues
GB0906204D0 (en) OFET-based sensor for detecting an analyte
EP2397562A4 (fr) Procédé de détection d'une substance cible à l'aide d'un aptamère
DE112010004949T8 (de) Betriebsbetragerfassungsvorrichtung
BR112014012574A2 (pt) sensor químico, módulo de sensor químico, e, aparelho e método de detecção de substância química
JP2010048806A5 (ja) 流体内検体濃度検知システム
FR2984553B1 (fr) Procede et dispositif de detection de fautes
FR2941802B1 (fr) Procede de detection de composants electroniques atypiques
ZA201203657B (en) An apparatus for detecting signals
BR112012004367A2 (pt) método de detecção de adulteração.
FR2957480B1 (fr) Procede de metallisation de vias borgnes
FR2953248B1 (fr) Portail de detection

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 8

CA Change of address

Effective date: 20160623

CD Change of name or company name

Owner name: IPPON INNOVATION, FR

Effective date: 20160623

PLFP Fee payment

Year of fee payment: 9

PLFP Fee payment

Year of fee payment: 10

PLFP Fee payment

Year of fee payment: 12

PLFP Fee payment

Year of fee payment: 13

PLFP Fee payment

Year of fee payment: 14

PLFP Fee payment

Year of fee payment: 15

PLFP Fee payment

Year of fee payment: 16