FR2900277B1 - Procede de formation d'une portion monocristalline a base de silicium - Google Patents
Procede de formation d'une portion monocristalline a base de siliciumInfo
- Publication number
- FR2900277B1 FR2900277B1 FR0603453A FR0603453A FR2900277B1 FR 2900277 B1 FR2900277 B1 FR 2900277B1 FR 0603453 A FR0603453 A FR 0603453A FR 0603453 A FR0603453 A FR 0603453A FR 2900277 B1 FR2900277 B1 FR 2900277B1
- Authority
- FR
- France
- Prior art keywords
- silicon
- forming
- monocrystalline portion
- based monocrystalline
- monocrystalline
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02529—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02576—N-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02579—P-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0603453A FR2900277B1 (fr) | 2006-04-19 | 2006-04-19 | Procede de formation d'une portion monocristalline a base de silicium |
US11/788,391 US8158495B2 (en) | 2006-04-19 | 2007-04-18 | Process for forming a silicon-based single-crystal portion |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0603453A FR2900277B1 (fr) | 2006-04-19 | 2006-04-19 | Procede de formation d'une portion monocristalline a base de silicium |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2900277A1 FR2900277A1 (fr) | 2007-10-26 |
FR2900277B1 true FR2900277B1 (fr) | 2008-07-11 |
Family
ID=37714441
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0603453A Expired - Fee Related FR2900277B1 (fr) | 2006-04-19 | 2006-04-19 | Procede de formation d'une portion monocristalline a base de silicium |
Country Status (2)
Country | Link |
---|---|
US (1) | US8158495B2 (fr) |
FR (1) | FR2900277B1 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG11201506367TA (en) | 2013-03-15 | 2015-09-29 | Applied Materials Inc | Apparatus and methods for pulsed photo-excited deposition and etch |
FR3105571B1 (fr) * | 2019-12-18 | 2023-01-13 | Commissariat Energie Atomique | Procédé de formation d’une couche par épitaxie cyclée |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4371421A (en) * | 1981-04-16 | 1983-02-01 | Massachusetts Institute Of Technology | Lateral epitaxial growth by seeded solidification |
JPS5861622A (ja) * | 1981-10-09 | 1983-04-12 | Hitachi Ltd | 単結晶薄膜の製造方法 |
US4461670A (en) * | 1982-05-03 | 1984-07-24 | At&T Bell Laboratories | Process for producing silicon devices |
US4578142A (en) * | 1984-05-10 | 1986-03-25 | Rca Corporation | Method for growing monocrystalline silicon through mask layer |
FR2629636B1 (fr) * | 1988-04-05 | 1990-11-16 | Thomson Csf | Procede de realisation d'une alternance de couches de materiau semiconducteur monocristallin et de couches de materiau isolant |
KR100430404B1 (ko) * | 2001-06-02 | 2004-05-04 | 삼성전자주식회사 | 구조 선택적 에피택시얼 성장 기술 및 선택적 실리콘 식각기술을 사용한 단결정 실리콘 패턴 형성 방법 |
US7186630B2 (en) * | 2002-08-14 | 2007-03-06 | Asm America, Inc. | Deposition of amorphous silicon-containing films |
WO2004081986A2 (fr) * | 2003-03-12 | 2004-09-23 | Asm America Inc. | Procede de planarisation et de reduction de la densite des defauts du silicium germanium |
US7468311B2 (en) * | 2003-09-30 | 2008-12-23 | Tokyo Electron Limited | Deposition of silicon-containing films from hexachlorodisilane |
US7166528B2 (en) * | 2003-10-10 | 2007-01-23 | Applied Materials, Inc. | Methods of selective deposition of heavily doped epitaxial SiGe |
US7132338B2 (en) | 2003-10-10 | 2006-11-07 | Applied Materials, Inc. | Methods to fabricate MOSFET devices using selective deposition process |
US7226842B2 (en) * | 2004-02-17 | 2007-06-05 | Intel Corporation | Fabricating strained channel epitaxial source/drain transistors |
US20060071213A1 (en) * | 2004-10-04 | 2006-04-06 | Ce Ma | Low temperature selective epitaxial growth of silicon germanium layers |
KR100653853B1 (ko) * | 2005-05-24 | 2006-12-05 | 네오폴리((주)) | 비금속 씨드 에피 성장을 이용한 비정질 반도체 박막의결정화 방법 및 이를 이용한 다결정 박막 트랜지스터의제조방법 |
US7364976B2 (en) * | 2006-03-21 | 2008-04-29 | Intel Corporation | Selective etch for patterning a semiconductor film deposited non-selectively |
JP2007329200A (ja) * | 2006-06-06 | 2007-12-20 | Toshiba Corp | 半導体装置の製造方法 |
-
2006
- 2006-04-19 FR FR0603453A patent/FR2900277B1/fr not_active Expired - Fee Related
-
2007
- 2007-04-18 US US11/788,391 patent/US8158495B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US8158495B2 (en) | 2012-04-17 |
US20070254451A1 (en) | 2007-11-01 |
FR2900277A1 (fr) | 2007-10-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20131231 |