FR2806472B1 - Procede de reglage de la position d'un instrument de mesure lors de la mesure de l'epaisseur de couche avec un fluorescence x - Google Patents

Procede de reglage de la position d'un instrument de mesure lors de la mesure de l'epaisseur de couche avec un fluorescence x

Info

Publication number
FR2806472B1
FR2806472B1 FR0103206A FR0103206A FR2806472B1 FR 2806472 B1 FR2806472 B1 FR 2806472B1 FR 0103206 A FR0103206 A FR 0103206A FR 0103206 A FR0103206 A FR 0103206A FR 2806472 B1 FR2806472 B1 FR 2806472B1
Authority
FR
France
Prior art keywords
measuring
fluorescence
adjusting
layer thickness
measuring instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR0103206A
Other languages
English (en)
Other versions
FR2806472A1 (fr
Inventor
Karl Heinz Kaiser
Volker Rossiger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Helmut Fischer GmbH and Co
Original Assignee
Helmut Fischer GmbH and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer GmbH and Co filed Critical Helmut Fischer GmbH and Co
Publication of FR2806472A1 publication Critical patent/FR2806472A1/fr
Application granted granted Critical
Publication of FR2806472B1 publication Critical patent/FR2806472B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
FR0103206A 2000-03-17 2001-03-09 Procede de reglage de la position d'un instrument de mesure lors de la mesure de l'epaisseur de couche avec un fluorescence x Expired - Lifetime FR2806472B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10013048A DE10013048A1 (de) 2000-03-17 2000-03-17 Verfahren zur Einstellung einer Lage eines Meßgegenstandes bei der Schichtdickenmessung mit Röntgenfluoreszenz

Publications (2)

Publication Number Publication Date
FR2806472A1 FR2806472A1 (fr) 2001-09-21
FR2806472B1 true FR2806472B1 (fr) 2007-11-16

Family

ID=7635117

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0103206A Expired - Lifetime FR2806472B1 (fr) 2000-03-17 2001-03-09 Procede de reglage de la position d'un instrument de mesure lors de la mesure de l'epaisseur de couche avec un fluorescence x

Country Status (8)

Country Link
US (1) US6370221B2 (fr)
JP (1) JP2001304844A (fr)
CN (1) CN1193209C (fr)
CH (1) CH695958A5 (fr)
DE (1) DE10013048A1 (fr)
FR (1) FR2806472B1 (fr)
GB (1) GB2365525B (fr)
HK (1) HK1039172B (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7023954B2 (en) * 2003-09-29 2006-04-04 Jordan Valley Applied Radiation Ltd. Optical alignment of X-ray microanalyzers
DE102005020567A1 (de) * 2005-04-30 2006-11-09 Katz, Elisabeth Verfahren und Vorrichtung zur Online-Bestimmung des Aschegehalts einer auf einem Födermittel geförderten Substanz und Vorrichtung zur Durchführung einer Online-Analyse
JP5235447B2 (ja) * 2008-02-22 2013-07-10 株式会社日立ハイテクサイエンス Ｘ線分析装置及びｘ線分析方法
GB2495868B (en) * 2009-03-18 2013-10-23 Helmut Fischer Gmbh Inst Fur Elektronik Und Messtechnik Measurement stand and method of its electrical control
DE102014102684A1 (de) * 2014-02-28 2015-09-03 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren zur Messung eines Messobjektes mittels Röntgenfluoreszenz
CN104020184B (zh) * 2014-04-04 2017-03-01 苏州三值精密仪器有限公司 一种上照式x荧光光谱仪及其控制方法
CN113791098B (zh) * 2021-11-16 2024-03-26 四川大学 一种多特征表面分析装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3123685A1 (de) * 1980-06-19 1982-03-18 Fuji Electric Co., Ltd., Kawasaki, Kanagawa Verfahren zur wanddicken-messung von rohrfoermigen gegenstaenden
US4860329A (en) * 1986-02-24 1989-08-22 Upa Technology, Inc. X-ray fluorescence thickness measuring device
JPH0682468B2 (ja) * 1987-08-31 1994-10-19 キヤノン株式会社 光学的情報記録再生装置
US4962518A (en) * 1987-12-07 1990-10-09 Twin City International, Inc. Apparatus for measuring the thickness of a coating
EP0325158B1 (fr) * 1988-01-20 1993-08-04 Horiba, Ltd. Appareil radiologique muni d'un moniteur de largeur de rayonnement
US5309495A (en) * 1992-03-18 1994-05-03 Helmut Fischer Positioning device for an x-ray thickness measuring system
JP2696044B2 (ja) * 1992-07-14 1998-01-14 株式会社ミツトヨ 合焦検出方法、これを用いた非接触変位測定方法及び装置
JPH06318340A (ja) * 1993-05-08 1994-11-15 Sony Corp 搬送装置及び組立加工装置
JPH0861943A (ja) * 1994-08-19 1996-03-08 Nippon Steel Corp Ｘ線測定装置
DE19710420C2 (de) * 1997-03-13 2001-07-12 Helmut Fischer Gmbh & Co Verfahren und Vorrichtung zum Messen der Dicken dünner Schichten mittels Röntgenfluoreszenz
JPH11148809A (ja) * 1997-11-13 1999-06-02 Komatsu Ltd 共焦点光学装置及びその検出器アレイの傾き調整方法
JP2000056236A (ja) * 1998-08-05 2000-02-25 Toray Ind Inc 焦点合わせ装置および方法並びに光学定数測定装置および顕微鏡

Also Published As

Publication number Publication date
US20010022829A1 (en) 2001-09-20
US6370221B2 (en) 2002-04-09
CN1314580A (zh) 2001-09-26
DE10013048A1 (de) 2001-09-20
CN1193209C (zh) 2005-03-16
GB2365525B (en) 2004-01-21
GB0105917D0 (en) 2001-04-25
GB2365525A (en) 2002-02-20
FR2806472A1 (fr) 2001-09-21
JP2001304844A (ja) 2001-10-31
HK1039172A1 (en) 2002-04-12
CH695958A5 (de) 2006-10-31
HK1039172B (zh) 2005-09-02

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