FR2733599B1 - Sonde de tension a concordance d'impedance - Google Patents

Sonde de tension a concordance d'impedance

Info

Publication number
FR2733599B1
FR2733599B1 FR9601226A FR9601226A FR2733599B1 FR 2733599 B1 FR2733599 B1 FR 2733599B1 FR 9601226 A FR9601226 A FR 9601226A FR 9601226 A FR9601226 A FR 9601226A FR 2733599 B1 FR2733599 B1 FR 2733599B1
Authority
FR
France
Prior art keywords
impedance matching
voltage probe
matching voltage
probe
impedance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9601226A
Other languages
English (en)
Other versions
FR2733599A1 (fr
Inventor
David J Dascher
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of FR2733599A1 publication Critical patent/FR2733599A1/fr
Application granted granted Critical
Publication of FR2733599B1 publication Critical patent/FR2733599B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9601226A 1995-02-03 1996-02-01 Sonde de tension a concordance d'impedance Expired - Fee Related FR2733599B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/383,803 US5583447A (en) 1995-02-03 1995-02-03 Voltage probe with reverse impedance matching

Publications (2)

Publication Number Publication Date
FR2733599A1 FR2733599A1 (fr) 1996-10-31
FR2733599B1 true FR2733599B1 (fr) 1999-01-22

Family

ID=23514791

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9601226A Expired - Fee Related FR2733599B1 (fr) 1995-02-03 1996-02-01 Sonde de tension a concordance d'impedance

Country Status (5)

Country Link
US (1) US5583447A (fr)
JP (1) JPH08320344A (fr)
DE (1) DE19603642C2 (fr)
FR (1) FR2733599B1 (fr)
GB (1) GB2298049A (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5625299A (en) * 1995-02-03 1997-04-29 Uhling; Thomas F. Multiple lead analog voltage probe with high signal integrity over a wide band width
JPH1064962A (ja) * 1996-08-23 1998-03-06 Mitsubishi Electric Corp マルチポート回路の電気的特性測定用プローブヘッド，及びマルチポート回路の電気的特性測定方法
US6172413B1 (en) 1997-10-09 2001-01-09 Micron Technology, Inc. Chip leads constrained in dielectric media
US5949284A (en) * 1997-11-10 1999-09-07 Tektronix, Inc. CMOS buffer amplifier
US6072356A (en) * 1998-06-08 2000-06-06 Tektronix, Inc. Apparatus for deriving a trigger signal from the AC line
DE60239013D1 (de) * 2001-11-14 2011-03-03 Toshiba Kk Ultrasonograph mit berechnung der brechung von ultraschallwellen
US20060250744A1 (en) * 2005-05-05 2006-11-09 Mctigue Michael T Micro gap method and ESD protection device
US7242202B2 (en) * 2005-05-31 2007-07-10 Agilent Technologies, Inc. Signal probe and probe assembly
US7408406B2 (en) * 2006-05-24 2008-08-05 Tektronix, Inc. Mode selection amplifier circuit usable in a signal acquisition probe
KR100930989B1 (ko) * 2008-06-18 2009-12-10 티에스씨멤시스(주) 전기 검사 장치 및 이의 제조 방법
WO2017120513A1 (fr) * 2016-01-06 2017-07-13 The SETI Institute Alimentation d'antenne refroidie pour réseau de télescopes

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1051903A (fr) * 1963-02-18
US4161692A (en) * 1977-07-18 1979-07-17 Cerprobe Corporation Probe device for integrated circuit wafers
WO1980000101A1 (fr) * 1978-06-21 1980-01-24 Cerprobe Corp Dispositif de sondage et interface pour tranches de circuits integres
US4403183A (en) * 1981-04-10 1983-09-06 Tektronix, Inc. Active voltage probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
US5218293A (en) * 1991-08-30 1993-06-08 Kan David T Passive high-frequency signal probe
GB2263980B (en) * 1992-02-07 1996-04-10 Marconi Gec Ltd Apparatus and method for testing bare dies
US5418470A (en) * 1993-10-22 1995-05-23 Tektronix, Inc. Analog multi-channel probe system
US5629617A (en) * 1995-01-06 1997-05-13 Hewlett-Packard Company Multiplexing electronic test probe

Also Published As

Publication number Publication date
DE19603642C2 (de) 1998-07-30
JPH08320344A (ja) 1996-12-03
FR2733599A1 (fr) 1996-10-31
DE19603642A1 (de) 1996-08-08
GB2298049A (en) 1996-08-21
GB9602238D0 (en) 1996-04-03
US5583447A (en) 1996-12-10

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Legal Events

Date Code Title Description
TP Transmission of property
TP Transmission of property
ST Notification of lapse