FR2716716B1 - Ondemètre optique. - Google Patents

Ondemètre optique.

Info

Publication number
FR2716716B1
FR2716716B1 FR9502245A FR9502245A FR2716716B1 FR 2716716 B1 FR2716716 B1 FR 2716716B1 FR 9502245 A FR9502245 A FR 9502245A FR 9502245 A FR9502245 A FR 9502245A FR 2716716 B1 FR2716716 B1 FR 2716716B1
Authority
FR
France
Prior art keywords
optical wavemeter
wavemeter
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR9502245A
Other languages
English (en)
Other versions
FR2716716A1 (fr
Inventor
Nagashima C O Ando Elec Shinya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Publication of FR2716716A1 publication Critical patent/FR2716716A1/fr
Application granted granted Critical
Publication of FR2716716B1 publication Critical patent/FR2716716B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FR9502245A 1994-02-28 1995-02-27 Ondemètre optique. Expired - Lifetime FR2716716B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6054586A JPH07239272A (ja) 1994-02-28 1994-02-28 光波長計

Publications (2)

Publication Number Publication Date
FR2716716A1 FR2716716A1 (fr) 1995-09-01
FR2716716B1 true FR2716716B1 (fr) 1997-05-23

Family

ID=12974826

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9502245A Expired - Lifetime FR2716716B1 (fr) 1994-02-28 1995-02-27 Ondemètre optique.

Country Status (4)

Country Link
US (1) US5486918A (fr)
JP (1) JPH07239272A (fr)
DE (1) DE19506954C2 (fr)
FR (1) FR2716716B1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08101072A (ja) * 1994-09-30 1996-04-16 Ando Electric Co Ltd 光波長計
DE19504444B4 (de) * 1995-02-10 2004-05-13 Carl Zeiss Jena Gmbh Interferometeranordnung mit verstellbarer optischer Weglängendifferenz
US5838438A (en) * 1997-01-17 1998-11-17 University Of Central Florida Method of time-resolving fourier-transform spectroscopy to allow interferogram sampling at unevenly spaced path-length differences.
DE19815241A1 (de) 1998-04-04 1999-10-07 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
EP0982581B1 (fr) * 1998-08-28 2005-04-20 Perkin-Elmer Limited Saisie de données pour la spectroscopie
DE10118392A1 (de) 2001-04-13 2002-11-07 Zeiss Carl System und Verfahren zum Bestimmen einer Position oder/und Orientierung zweier Objekte relativ zueinander sowie Strahlführungsanordnung, Interferometeranordnung und Vorrichtung zum Ändern einer optischen Weglänge zum Einsatz in einem solchen System und Verfahren
JP4751032B2 (ja) * 2004-04-22 2011-08-17 株式会社森精機製作所 変位検出装置
US7342664B1 (en) * 2004-05-06 2008-03-11 Juliusz George Radziszewski Scanning double-beam interferometer

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4026402A (en) * 1975-07-28 1977-05-31 Centronics Data Computer Corporation Incremental line printer
DE3707331A1 (de) * 1987-03-07 1988-09-15 Zeiss Carl Fa Interferometer zur messung von optischen phasendifferenzen
US5123742A (en) * 1989-06-07 1992-06-23 Hitachi Electronics Engineering Co., Ltd. Laser length measuring instrument
JPH063401B2 (ja) * 1989-12-29 1994-01-12 株式会社島津製作所 干渉分光光度計
JP2604052B2 (ja) * 1990-03-29 1997-04-23 アンリツ株式会社 光波長測定装置
US5270790A (en) * 1990-04-18 1993-12-14 Advantest Corporation Moving reflector driving part of a Michelson inteferometer

Also Published As

Publication number Publication date
US5486918A (en) 1996-01-23
DE19506954A1 (de) 1995-08-31
JPH07239272A (ja) 1995-09-12
FR2716716A1 (fr) 1995-09-01
DE19506954C2 (de) 1997-09-18

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