FR2688975B1 - Dispositif interface entre un appareil testeur et une carte de circuit imprime. - Google Patents

Dispositif interface entre un appareil testeur et une carte de circuit imprime.

Info

Publication number
FR2688975B1
FR2688975B1 FR9203485A FR9203485A FR2688975B1 FR 2688975 B1 FR2688975 B1 FR 2688975B1 FR 9203485 A FR9203485 A FR 9203485A FR 9203485 A FR9203485 A FR 9203485A FR 2688975 B1 FR2688975 B1 FR 2688975B1
Authority
FR
France
Prior art keywords
circuit board
printed circuit
interface device
testing apparatus
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9203485A
Other languages
English (en)
Other versions
FR2688975A1 (fr
Inventor
Jerome Galesne
Philippe Caillaud
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TESTELEC
Original Assignee
TESTELEC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TESTELEC filed Critical TESTELEC
Priority to FR9203485A priority Critical patent/FR2688975B1/fr
Publication of FR2688975A1 publication Critical patent/FR2688975A1/fr
Application granted granted Critical
Publication of FR2688975B1 publication Critical patent/FR2688975B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
FR9203485A 1992-03-19 1992-03-19 Dispositif interface entre un appareil testeur et une carte de circuit imprime. Expired - Fee Related FR2688975B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9203485A FR2688975B1 (fr) 1992-03-19 1992-03-19 Dispositif interface entre un appareil testeur et une carte de circuit imprime.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9203485A FR2688975B1 (fr) 1992-03-19 1992-03-19 Dispositif interface entre un appareil testeur et une carte de circuit imprime.

Publications (2)

Publication Number Publication Date
FR2688975A1 FR2688975A1 (fr) 1993-09-24
FR2688975B1 true FR2688975B1 (fr) 1996-10-04

Family

ID=9427982

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9203485A Expired - Fee Related FR2688975B1 (fr) 1992-03-19 1992-03-19 Dispositif interface entre un appareil testeur et une carte de circuit imprime.

Country Status (1)

Country Link
FR (1) FR2688975B1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1266653B1 (it) * 1993-11-02 1997-01-09 Circuit Line Spa Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati
FR2725030A1 (fr) * 1994-09-26 1996-03-29 Tests Electr Electromecaniques Dispositif interface entre un appareil testeur et une carte de circuit imprime
FR2752943B1 (fr) * 1996-08-27 1998-11-27 Int Market Dev Appareil de test de circuits imprimes
US5773988A (en) * 1996-10-29 1998-06-30 Hewlett-Packard Company Standard- and limited-access hybrid test fixture
WO1999049325A1 (fr) * 1998-03-24 1999-09-30 Nit Systems Ltd. Fabrication de dispositif automatique pour test electrique

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2352542A1 (de) * 1973-10-18 1975-04-24 Siemens Ag Kontaktvorrichtung zur pruefung elektrischer baugruppen
US4289367A (en) * 1979-12-10 1981-09-15 John Fluke Mfg. Co., Inc. Spring loaded connector pin
US4463310A (en) * 1980-07-11 1984-07-31 Rca Corporation Apparatus for detecting the presence of components on a printed circuit board
DE3143768C2 (de) * 1981-11-04 1987-04-16 Siemens AG, 1000 Berlin und 8000 München Adapter zur Verbindung von in einer Ebene angeordneten Kontaktpunkten eines Prüflings mit den Anschlüssen einer Prüfeinrichtung
FR2518358A1 (fr) * 1981-12-10 1983-06-17 Everett Charles Inc Tete d'essai actionnee par le vide munie d'une plaque de programmation
DE3719802A1 (de) * 1986-06-20 1987-12-23 Ingun Pruefmittelbau Gmbh Vorrichtung zum pruefen von pruefpunkten einer elektronischen leiterplatte od. dgl. als pruefling mittels kontaktstiften

Also Published As

Publication number Publication date
FR2688975A1 (fr) 1993-09-24

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Legal Events

Date Code Title Description
CL Concession to grant licenses
ST Notification of lapse