FR2684207B1 - Circuit interpolateur. - Google Patents

Circuit interpolateur.

Info

Publication number
FR2684207B1
FR2684207B1 FR9210362A FR9210362A FR2684207B1 FR 2684207 B1 FR2684207 B1 FR 2684207B1 FR 9210362 A FR9210362 A FR 9210362A FR 9210362 A FR9210362 A FR 9210362A FR 2684207 B1 FR2684207 B1 FR 2684207B1
Authority
FR
France
Prior art keywords
interpolator circuit
interpolator
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9210362A
Other languages
English (en)
Other versions
FR2684207A1 (fr
Inventor
Addison Reichert Peter
Joseph Brown Benjamin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/605,977 external-priority patent/US5321700A/en
Application filed by Teradyne Inc filed Critical Teradyne Inc
Priority to FR9210362A priority Critical patent/FR2684207B1/fr
Publication of FR2684207A1 publication Critical patent/FR2684207A1/fr
Application granted granted Critical
Publication of FR2684207B1 publication Critical patent/FR2684207B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/82—Digital/analogue converters with intermediate conversion to time interval
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/17—Function evaluation by approximation methods, e.g. inter- or extrapolation, smoothing, least mean square method
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06J—HYBRID COMPUTING ARRANGEMENTS
    • G06J1/00—Hybrid computing arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Pure & Applied Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Analysis (AREA)
  • Computational Mathematics (AREA)
  • Algebra (AREA)
  • Databases & Information Systems (AREA)
  • Computer Hardware Design (AREA)
  • Automation & Control Theory (AREA)
  • Evolutionary Computation (AREA)
  • Fuzzy Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9210362A 1990-10-30 1992-08-28 Circuit interpolateur. Expired - Fee Related FR2684207B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9210362A FR2684207B1 (fr) 1990-10-30 1992-08-28 Circuit interpolateur.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/605,977 US5321700A (en) 1989-10-11 1990-10-30 High speed timing generator
FR9210362A FR2684207B1 (fr) 1990-10-30 1992-08-28 Circuit interpolateur.

Publications (2)

Publication Number Publication Date
FR2684207A1 FR2684207A1 (fr) 1993-05-28
FR2684207B1 true FR2684207B1 (fr) 1995-02-10

Family

ID=26229682

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9210362A Expired - Fee Related FR2684207B1 (fr) 1990-10-30 1992-08-28 Circuit interpolateur.

Country Status (1)

Country Link
FR (1) FR2684207B1 (fr)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60117922A (ja) * 1983-11-30 1985-06-25 Toshiba Corp ディジタル・アナログ変換回路
SU1275776A1 (ru) * 1985-07-26 1986-12-07 Предприятие П/Я А-3327 Преобразователь кода во временной интервал
FR2604260B1 (fr) * 1986-09-19 1988-12-30 Draxy Sarl Testeur de circuits electroniques
US4742331A (en) * 1986-12-23 1988-05-03 Analog Devices, Inc. Digital-to-time converter

Also Published As

Publication number Publication date
FR2684207A1 (fr) 1993-05-28

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070629