FR2596165B1 - Detecteur de radiations ionisantes - Google Patents

Detecteur de radiations ionisantes

Info

Publication number
FR2596165B1
FR2596165B1 FR878703825A FR8703825A FR2596165B1 FR 2596165 B1 FR2596165 B1 FR 2596165B1 FR 878703825 A FR878703825 A FR 878703825A FR 8703825 A FR8703825 A FR 8703825A FR 2596165 B1 FR2596165 B1 FR 2596165B1
Authority
FR
France
Prior art keywords
radiation detector
ionizing radiation
ionizing
detector
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR878703825A
Other languages
English (en)
Other versions
FR2596165A1 (fr
Inventor
Yasutaka Horiba
Yuto Ikeda
Masao Nakaya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bayer Corp
Original Assignee
Miles Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Miles Laboratories Inc filed Critical Miles Laboratories Inc
Publication of FR2596165A1 publication Critical patent/FR2596165A1/fr
Application granted granted Critical
Publication of FR2596165B1 publication Critical patent/FR2596165B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
    • H01L31/118—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation of the surface barrier or shallow PN junction detector type, e.g. surface barrier alpha-particle detectors
    • H01L31/1185—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation of the surface barrier or shallow PN junction detector type, e.g. surface barrier alpha-particle detectors of the shallow PN junction detector type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measurement Of Radiation (AREA)
FR878703825A 1986-03-19 1987-03-19 Detecteur de radiations ionisantes Expired - Lifetime FR2596165B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61062036A JPH06105303B2 (ja) 1986-03-19 1986-03-19 電離放射線検出装置

Publications (2)

Publication Number Publication Date
FR2596165A1 FR2596165A1 (fr) 1987-09-25
FR2596165B1 true FR2596165B1 (fr) 1992-02-28

Family

ID=13188535

Family Applications (1)

Application Number Title Priority Date Filing Date
FR878703825A Expired - Lifetime FR2596165B1 (fr) 1986-03-19 1987-03-19 Detecteur de radiations ionisantes

Country Status (4)

Country Link
US (1) US4804848A (fr)
JP (1) JPH06105303B2 (fr)
DE (1) DE3709076A1 (fr)
FR (1) FR2596165B1 (fr)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5125016B1 (en) * 1983-09-22 1998-02-24 Outokumpu Oy Procedure and measuring apparatus based on x-ray diffraction for measuring stresses
DE3640756A1 (de) * 1986-11-28 1988-06-09 Jetschin Wolf R Nachweisgeraet fuer radioaktive strahlung
US4954709A (en) * 1989-08-16 1990-09-04 Apti, Inc. High resolution directional gamma ray detector
GB9022256D0 (en) * 1990-10-12 1990-11-28 Univ Leicester Direct digital position readout transducer
US6332590B1 (en) * 1998-12-23 2001-12-25 Space Systems/Loral, Inc. Photoemission based spacecraft charging sensor
JP3897245B2 (ja) * 2002-04-24 2007-03-22 三菱重工業株式会社 多層放射線検出器を用いたガンマ線源の距離測定装置
US20060170541A1 (en) * 2003-02-09 2006-08-03 Tompa Gary S Smart portable detection apparatus and method
US7391032B1 (en) * 2005-12-21 2008-06-24 Searete Llc Multi-stage waveform detector
US7601967B2 (en) * 2005-12-21 2009-10-13 Searete Llc Multi-stage waveform detector
US7649180B2 (en) * 2005-12-21 2010-01-19 Searete Llc Multi-stage waveform detector
US7427762B2 (en) * 2005-12-21 2008-09-23 Searete Llc Variable multi-stage waveform detector
US8207907B2 (en) * 2006-02-16 2012-06-26 The Invention Science Fund I Llc Variable metamaterial apparatus
US7649182B2 (en) * 2006-10-26 2010-01-19 Searete Llc Variable multi-stage waveform detector
US20110042575A1 (en) * 2008-04-24 2011-02-24 Sumitomo Heavy Industries, Ltd. Semiconductor Detector Block and Positron Emission Tomography Device Using the Same
JP4634494B2 (ja) * 2008-10-31 2011-02-16 独立行政法人 宇宙航空研究開発機構 放射線源位置検出システム、及び放射線源位置検出用プローブ
US8791418B2 (en) * 2008-12-08 2014-07-29 Micron Technology, Inc. Increasing the spatial resolution of dosimetry sensors
JP5840638B2 (ja) * 2013-03-21 2016-01-06 株式会社東芝 放射線検出装置及び放射線の検出方法
DE102013219821A1 (de) * 2013-09-30 2015-04-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgendetektor
FR3046253A1 (fr) * 2015-12-28 2017-06-30 Airbus Group Sas Dispositif de detection de particules d'un environnement radiatif
US10613248B2 (en) 2017-10-24 2020-04-07 Alert R&D, LLC Passive alerting and locating system
FR3077646B1 (fr) * 2018-02-06 2020-01-17 Ecole Polytechnique Systeme de caracterisation d'un faisceau de particules chargees et machine de production d'un faisceau de particules chargees comprenant un tel systeme

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL6714455A (fr) * 1967-10-25 1969-04-29
US3564245A (en) * 1968-01-24 1971-02-16 Bulova Watch Co Inc Integrated circuit multicell p-n junction radiation detectors with diodes to reduce capacitance of networks
US3715590A (en) * 1971-03-26 1973-02-06 Nasa Micrometeoroid analyzer
DE2255095C2 (de) * 1972-11-10 1986-04-17 Siemens AG, 1000 Berlin und 8000 München Detektor für ionisierende Strahlung
US3891851A (en) * 1974-08-30 1975-06-24 Nasa Impact position detector for outer space particles
US4392057A (en) * 1980-02-22 1983-07-05 National Research Development Corporation Position-sensitive radiation detector
DE3584477D1 (de) * 1984-06-30 1991-11-28 Shimadzu Corp Halbleiterstrahlungsdetektor.
DE3441498A1 (de) * 1984-11-09 1986-05-15 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren und anordnung zur erfassung der position von lichtstrahlen

Also Published As

Publication number Publication date
JPS62217180A (ja) 1987-09-24
JPH06105303B2 (ja) 1994-12-21
DE3709076A1 (de) 1987-12-23
FR2596165A1 (fr) 1987-09-25
US4804848A (en) 1989-02-14

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Legal Events

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D6 Patent endorsed licences of rights
ST Notification of lapse