FR2583169B1 - Procede et appareil de mesure de capacite - Google Patents
Procede et appareil de mesure de capaciteInfo
- Publication number
- FR2583169B1 FR2583169B1 FR868608456A FR8608456A FR2583169B1 FR 2583169 B1 FR2583169 B1 FR 2583169B1 FR 868608456 A FR868608456 A FR 868608456A FR 8608456 A FR8608456 A FR 8608456A FR 2583169 B1 FR2583169 B1 FR 2583169B1
- Authority
- FR
- France
- Prior art keywords
- measuring method
- capacity measuring
- capacity
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
- G01R17/06—Automatic balancing arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/743,622 US4716361A (en) | 1984-11-05 | 1985-06-11 | Capacitance measuring method and apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2583169A1 FR2583169A1 (fr) | 1986-12-12 |
FR2583169B1 true FR2583169B1 (fr) | 1990-11-16 |
Family
ID=24989496
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR868608456A Expired - Fee Related FR2583169B1 (fr) | 1985-06-11 | 1986-06-11 | Procede et appareil de mesure de capacite |
Country Status (6)
Country | Link |
---|---|
US (1) | US4716361A (fr) |
JP (1) | JPS61288168A (fr) |
CN (1) | CN1008133B (fr) |
DE (1) | DE3619558A1 (fr) |
FR (1) | FR2583169B1 (fr) |
GB (1) | GB2176617B (fr) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4860232A (en) * | 1987-04-22 | 1989-08-22 | Massachusetts Institute Of Technology | Digital technique for precise measurement of variable capacitance |
DE8707954U1 (de) * | 1987-06-04 | 1988-10-06 | Kohler, Hans-Michael, 8022 Zürich | Kapazitiver Messwertaufnehmer |
US4980634A (en) * | 1989-08-15 | 1990-12-25 | Analog Devices, Inc. | Electric power measuring system |
US5113140A (en) * | 1990-06-20 | 1992-05-12 | National Research Council Of Canada | Microprocessor-controlled high-voltage capacitance bridge |
JP3233791B2 (ja) * | 1994-08-25 | 2001-11-26 | 株式会社山武 | 差動容量反転積分器及びこれを用いた静電容量変化量検出装置 |
US5576628A (en) * | 1994-09-30 | 1996-11-19 | Telcom Semiconductor, Inc. | Method and apparatus to measure capacitance |
JP2004184186A (ja) * | 2002-12-02 | 2004-07-02 | Agilent Technologies Japan Ltd | 容量測定システム |
GB2419950A (en) * | 2004-11-09 | 2006-05-10 | Sharp Kk | Capacitance measuring apparatus for LCD touch screen |
US7667468B1 (en) * | 2007-07-24 | 2010-02-23 | Cypress Semiconductor Corporation | Capacitive sensor with ratiometric voltage references |
FR2923020B1 (fr) * | 2007-10-30 | 2009-11-13 | Mge Ups Systems | Procede et dispositif de prediction de defaillances de condensateur electrolytique, convertisseur et alimentation sans interruption equipes d'un tel dispositif |
TWI391678B (zh) * | 2009-09-30 | 2013-04-01 | Raydium Semiconductor Corp | 電容值測量電路與其方法 |
CN103513106A (zh) * | 2012-06-26 | 2014-01-15 | 中兴通讯股份有限公司 | 一种测量方法、测量电路及监控装置 |
US9606155B2 (en) * | 2013-12-18 | 2017-03-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Capacitance measurement circuit and method |
CN104296786B (zh) * | 2014-09-30 | 2017-01-11 | 四川泛华航空仪表电器有限公司 | 数字电桥电容测量模块 |
CN106990296A (zh) * | 2017-05-07 | 2017-07-28 | 长沙方星腾电子科技有限公司 | 一种电容检测电路 |
CN111983328B (zh) * | 2020-06-30 | 2023-05-23 | 上海美仁半导体有限公司 | 一种电容误差测量电路、测量方法、芯片以及家用电器 |
CN113075459B (zh) * | 2021-03-18 | 2023-02-03 | 合肥恒钧检测技术有限公司 | 静电容量检测装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB635674A (en) * | 1948-03-23 | 1950-04-12 | Marconi Instruments Ltd | Improvements in or relating to wheatstone bridge resistance measuring circuits |
GB797542A (en) * | 1955-08-11 | 1958-07-02 | Ass Elect Ind | Improvements relating to bridge network balance detectors |
GB969384A (en) * | 1962-05-25 | 1964-09-09 | Secr Aviation | Analogue-to-digital converters |
GB1085807A (en) * | 1964-09-04 | 1967-10-04 | Kabushikikaisha Tokyo Keiki Se | Analog-to-digital conversion system |
US3984766A (en) * | 1974-10-15 | 1976-10-05 | Bactomatic Inc. | Digital apparatus for rapidly detecting the growth of and identifying micro-biological organisms |
US4080562A (en) * | 1976-03-25 | 1978-03-21 | Gull Airborne Instruments, Inc. | Apparatus for measuring capacitance or resistance and for testing a capacitance responsive gaging system |
GB1542258A (en) * | 1976-09-29 | 1979-03-14 | Tait D | Ac bridges |
US4251767A (en) * | 1978-08-25 | 1981-02-17 | Montana Donald M | Dual channel capacitance measurement device |
FR2454083A1 (fr) * | 1979-04-09 | 1980-11-07 | Facom | Dispositif de mesure de la position relative de deux objets |
US4323972A (en) * | 1980-03-10 | 1982-04-06 | Sencore, Inc. | Ohm meter with automatic lead resistance compensation |
DE3027255A1 (de) * | 1980-07-18 | 1982-02-11 | Robert Bosch Gmbh, 7000 Stuttgart | Auswerteschaltung fuer kurzchluss-ringgeber |
US4458196A (en) * | 1981-08-05 | 1984-07-03 | John Fluke Mfg. Co., Inc. | Method and apparatus for high speed resistance, inductance and capacitance measurement |
CA1181256A (fr) * | 1981-10-05 | 1985-01-22 | Combustion Engineering, Inc. | Pont pour circuit de detection reactif |
GB2166555B (en) * | 1984-11-05 | 1988-07-20 | Fluke Mfg Co John | Impedance measuring method and apparatus |
-
1985
- 1985-06-11 US US06/743,622 patent/US4716361A/en not_active Expired - Fee Related
-
1986
- 1986-03-13 CN CN86101617.3A patent/CN1008133B/zh not_active Expired
- 1986-04-22 GB GB8609770A patent/GB2176617B/en not_active Expired
- 1986-06-10 JP JP61135880A patent/JPS61288168A/ja active Pending
- 1986-06-11 DE DE19863619558 patent/DE3619558A1/de not_active Withdrawn
- 1986-06-11 FR FR868608456A patent/FR2583169B1/fr not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1008133B (zh) | 1990-05-23 |
GB2176617A (en) | 1986-12-31 |
GB2176617B (en) | 1989-07-05 |
DE3619558A1 (de) | 1986-12-11 |
FR2583169A1 (fr) | 1986-12-12 |
US4716361A (en) | 1987-12-29 |
CN86101617A (zh) | 1987-01-21 |
GB8609770D0 (en) | 1986-05-29 |
JPS61288168A (ja) | 1986-12-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
FR2586925B1 (fr) | Procede et appareil de mesure du volume ventriculaire | |
ES553135A0 (es) | Aparato y metodo correspondiente para medir continuamente gastomasico | |
PT84365A (fr) | Procede et appareil d:extrusion | |
FR2551222B1 (fr) | Appareil et procede de diagraphie | |
FR2583183B1 (fr) | Procede et appareil de calcul rapide de fractals | |
FR2505501B1 (fr) | Appareil et procede perfectionnes d'inspection non destructrice | |
FR2498442B1 (fr) | Procede et appareil de radioscopie | |
FR2569270B1 (fr) | Procede et appareil de mesure de caracteristiques et de parametres de fluides dans des conduits | |
FR2507076B1 (fr) | Procede et appareil de myographie vaginale | |
FR2590682B1 (fr) | Procede et dispositif de mesure des distances. | |
FR2563531B3 (fr) | Procede et appareil de fermentation | |
KR880700248A (ko) | 측정자를 감지하기 위한 장치 및 방법 | |
BE881016A (fr) | Procede et appareil de calcination | |
FR2537272B1 (fr) | Appareil de mesure multi-sondes | |
FR2583169B1 (fr) | Procede et appareil de mesure de capacite | |
FR2566276B1 (fr) | Procede et appareil de stimulation diaphragmatique | |
BE861025A (fr) | Appareil et procede de mesure de l'enthalpie | |
FR2564609B1 (fr) | Procede et appareil de developpement | |
FR2575916B1 (fr) | Procede de mesure de qualites sensorielles et dispositif de realisation de ce procede | |
FR2454619B1 (fr) | Procede et dispositif de mesure continue de teneurs en elements | |
FR2559577B1 (fr) | Procede de mesure par trace polygonal et dispositif de mesure | |
BE890520A (fr) | Procede et appareil de revetement | |
FR2587191B1 (fr) | Procede et dispositif de mesure de la direction du regard | |
FR2530802B1 (fr) | Procede et appareil pour mesurer optiquement des distances lineaires | |
FR2586793B1 (fr) | Procede et appareil de refrigeration magnetique |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |