FR2573864B1 - Mesure d'epaisseur de revetement - Google Patents

Mesure d'epaisseur de revetement

Info

Publication number
FR2573864B1
FR2573864B1 FR858517371A FR8517371A FR2573864B1 FR 2573864 B1 FR2573864 B1 FR 2573864B1 FR 858517371 A FR858517371 A FR 858517371A FR 8517371 A FR8517371 A FR 8517371A FR 2573864 B1 FR2573864 B1 FR 2573864B1
Authority
FR
France
Prior art keywords
coating thickness
thickness measurement
measurement
coating
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR858517371A
Other languages
English (en)
Other versions
FR2573864A1 (fr
Inventor
Thomas Edward Bantel
John Frank Halase Iii
David Frank Lahrman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of FR2573864A1 publication Critical patent/FR2573864A1/fr
Application granted granted Critical
Publication of FR2573864B1 publication Critical patent/FR2573864B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Radiation Pyrometers (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
FR858517371A 1984-11-26 1985-11-25 Mesure d'epaisseur de revetement Expired - Fee Related FR2573864B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/674,998 US4634291A (en) 1984-11-26 1984-11-26 Coating thickness measurement

Publications (2)

Publication Number Publication Date
FR2573864A1 FR2573864A1 (fr) 1986-05-30
FR2573864B1 true FR2573864B1 (fr) 1991-03-08

Family

ID=24708667

Family Applications (1)

Application Number Title Priority Date Filing Date
FR858517371A Expired - Fee Related FR2573864B1 (fr) 1984-11-26 1985-11-25 Mesure d'epaisseur de revetement

Country Status (6)

Country Link
US (1) US4634291A (fr)
JP (1) JPS61142413A (fr)
DE (1) DE3541405A1 (fr)
FR (1) FR2573864B1 (fr)
GB (1) GB2167855B (fr)
IT (1) IT1186392B (fr)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4818118A (en) * 1984-11-26 1989-04-04 General Electric Company Coating thickness measurement
US5015950A (en) * 1989-07-21 1991-05-14 Iowa State University Research Foundation, Inc. Method and apparatus for determining thermal resistance and structural integrity of coatings on conducting materials by monitoring electrical conductance of the underlying material upon localized heating of the overlying coating
DE4030801C2 (de) * 1990-09-28 1998-02-05 Siemens Ag Meßanordnung zur berührungslosen Bestimmung der Dicke und/oder thermischen Eigenschaften von Folien und dünnen Oberflächenbeschichtungen
DE4114671A1 (de) * 1991-05-06 1992-11-12 Hoechst Ag Verfahren und messanordnung zur beruehrungslosen on-line messung
DE4114672A1 (de) * 1991-05-06 1992-11-12 Hoechst Ag Verfahren und messanordnung zur beruehrungslosen on-line messung
US5281819A (en) * 1991-06-06 1994-01-25 Aluminum Company Of America Apparatus for nondestructively determining coating thickness on a metal object and associated method
DE4138157A1 (de) * 1991-11-21 1993-05-27 Krupp Ag Verfahren zum bestimmen der dicke einer beschichtung
US5228776A (en) * 1992-05-06 1993-07-20 Therma-Wave, Inc. Apparatus for evaluating thermal and electrical characteristics in a sample
AT407197B (de) * 1993-11-03 2001-01-25 Johann Gigerl Thermografisches messverfahren zur wandstärkemessung von schmelzwannen,-tiegeln, -kesseln oder -behältern unter beiziehung von hilfsmitteln bei vollem betrieb
US5843232A (en) * 1995-11-02 1998-12-01 General Electric Company Measuring deposit thickness in composite materials production
US5923174A (en) * 1997-05-30 1999-07-13 Northrop Grumman Corporation Device for measuring electromagnetic radiation absorption
ATE288076T1 (de) * 1997-11-27 2005-02-15 Christian Florin Verfahren zum prüfen der eigenschaft einer beschichtung
DE19837400C1 (de) * 1998-08-18 1999-11-18 Siemens Ag Verfahren und Vorrichtung zur Beschichtung von Hochtemperaturbauteilen mittels Plasmaspritzens
DE10001516B4 (de) * 2000-01-15 2014-05-08 Alstom Technology Ltd. Zerstörungsfreies Verfahren zur Bestimmung der Schichtdicke einer metallischen Schutzschicht auf einem metallischen Grundmaterial
KR20020073978A (ko) * 2001-03-19 2002-09-28 현대중공업 주식회사 적외선 열화상 장치를 이용한 박막 두께의 측정법
US6623158B2 (en) * 2001-06-15 2003-09-23 International Business Machines Corporation Method and apparatus for thermal proximity imaging using pulsed energy
DE10232746A1 (de) * 2002-07-19 2004-02-05 Leica Microsystems Semiconductor Gmbh Verfahren zur Automatischen Ermittlung optischer Parameter eines Schichtstapels
US7220966B2 (en) * 2003-07-29 2007-05-22 Toyota Motor Manufacturing North America, Inc. Systems and methods for inspecting coatings, surfaces and interfaces
US7129492B2 (en) * 2003-07-29 2006-10-31 Toyota Motor Manufacturing North America, Inc. Systems and methods for inspecting coatings
US7204639B1 (en) * 2003-09-26 2007-04-17 Lam Research Corporation Method and apparatus for thin metal film thickness measurement
US7064825B2 (en) * 2003-11-25 2006-06-20 General Electric Company Methods and apparatus for evaluating rotary machinery
US8315834B2 (en) * 2003-12-17 2012-11-20 Siemens Energy, Inc. System and method for measuring coating thickness
US7126329B2 (en) * 2004-01-21 2006-10-24 General Electric Company Methods for preparing and testing a thermal-spray coated substrate
US7064811B2 (en) * 2004-05-20 2006-06-20 Siemens Power Generation, Inc. Imaging rotating turbine blades in a gas turbine engine
KR100871974B1 (ko) * 2004-05-25 2008-12-08 현대중공업 주식회사 적외선 열화상 장치를 이용한 곡면 위 박막 두께 측정방법
US7632012B2 (en) * 2005-09-01 2009-12-15 Siemens Energy, Inc. Method of measuring in situ differential emissivity and temperature
US8300232B2 (en) * 2009-08-19 2012-10-30 Siemens Energy, Inc. Method of measuring coating thickness using infrared light
US8204294B2 (en) * 2009-11-25 2012-06-19 Toyota Motor Engineering & Manufacturing North America, Inc. Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch
US9897561B2 (en) 2014-03-12 2018-02-20 Agency For Science, Technology And Research Method of detecting defects in an object based on active thermography and a system thereof
JP7176356B2 (ja) * 2017-11-27 2022-11-22 株式会社豊田中央研究所 計測装置、計測方法、及びプログラム

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2264968A (en) * 1938-02-14 1941-12-02 Magnafiux Corp Apparatus for measuring wall thickness
US3016732A (en) * 1952-10-01 1962-01-16 Gen Motors Corp Measurement of coating thicknesses by thermal means
US3222917A (en) * 1962-03-07 1965-12-14 Gabb Special Products Inc Non-destructive testing of objects
US3413474A (en) * 1965-02-03 1968-11-26 Industrial Nucleonics Corp Coating thickness determination by means of measuring black-body radiation resultant from infrared irradiation
US3448268A (en) * 1966-02-10 1969-06-03 American Mach & Foundry Coating inspection method and apparatus using infrared radiation
JPS5031030B1 (fr) * 1968-06-15 1975-10-06
US3842277A (en) * 1973-06-25 1974-10-15 Western Electric Co Infrared scanning apparatus using a plurality of parallel detectors
US3994586A (en) * 1975-10-30 1976-11-30 Aluminum Company Of America Simultaneous determination of film uniformity and thickness
US4012691A (en) * 1976-04-08 1977-03-15 The United States Of America As Represented By The Secretary Of The Navy Determination of thermal impedances of bonding layers in infrared photoconductors
US4129781A (en) * 1976-05-17 1978-12-12 Doyle W Film thickness measuring apparatus and method
US4138878A (en) * 1976-12-03 1979-02-13 Rohrback Corporation Method and apparatus for detecting and measuring scale
FI64465C (fi) * 1982-03-15 1983-11-10 Mauri Luukkala Foerfarande och apparat foer att maeta ytornas egenskaper av fasta tillstaondets materialer
ATE28935T1 (de) * 1982-03-18 1987-08-15 Atomic Energy Authority Uk Thermographie von ausgleichvorgaengen.
US4513384A (en) * 1982-06-18 1985-04-23 Therma-Wave, Inc. Thin film thickness measurements and depth profiling utilizing a thermal wave detection system
JPS5899704A (ja) * 1982-08-18 1983-06-14 Haruo Nakagawa モルタル等の外装浮き上がり部の樹脂注入による補修工事の検査方法
JPS59151046A (ja) * 1983-02-18 1984-08-29 Mitsubishi Heavy Ind Ltd 内部欠陥検知方法
US4679946A (en) * 1984-05-21 1987-07-14 Therma-Wave, Inc. Evaluating both thickness and compositional variables in a thin film sample

Also Published As

Publication number Publication date
FR2573864A1 (fr) 1986-05-30
JPS61142413A (ja) 1986-06-30
IT8522971A0 (it) 1985-11-25
GB2167855B (en) 1988-08-24
DE3541405A1 (de) 1986-05-28
IT1186392B (it) 1987-11-26
GB2167855A (en) 1986-06-04
US4634291A (en) 1987-01-06
GB8526014D0 (en) 1985-11-27

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Legal Events

Date Code Title Description
ST Notification of lapse