FR2533794B1 - Dispositif de correction automatique de rayons x - Google Patents

Dispositif de correction automatique de rayons x

Info

Publication number
FR2533794B1
FR2533794B1 FR8315076A FR8315076A FR2533794B1 FR 2533794 B1 FR2533794 B1 FR 2533794B1 FR 8315076 A FR8315076 A FR 8315076A FR 8315076 A FR8315076 A FR 8315076A FR 2533794 B1 FR2533794 B1 FR 2533794B1
Authority
FR
France
Prior art keywords
automatic
correction device
ray correction
ray
correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8315076A
Other languages
English (en)
French (fr)
Other versions
FR2533794A1 (fr
Inventor
Toshiyuki Koga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Publication of FR2533794A1 publication Critical patent/FR2533794A1/fr
Application granted granted Critical
Publication of FR2533794B1 publication Critical patent/FR2533794B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR8315076A 1982-09-24 1983-09-22 Dispositif de correction automatique de rayons x Expired FR2533794B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16626982A JPS5967449A (ja) 1982-09-24 1982-09-24 Ｘ線自動較正装置

Publications (2)

Publication Number Publication Date
FR2533794A1 FR2533794A1 (fr) 1984-03-30
FR2533794B1 true FR2533794B1 (fr) 1988-06-03

Family

ID=15828248

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8315076A Expired FR2533794B1 (fr) 1982-09-24 1983-09-22 Dispositif de correction automatique de rayons x

Country Status (5)

Country Link
JP (1) JPS5967449A (enrdf_load_stackoverflow)
DE (1) DE3334458A1 (enrdf_load_stackoverflow)
FR (1) FR2533794B1 (enrdf_load_stackoverflow)
GB (1) GB2127538B (enrdf_load_stackoverflow)
NL (1) NL8302740A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03158581A (ja) * 1989-11-15 1991-07-08 Fujita Corp 鍵保管函の解錠装置
WO2000026649A2 (en) * 1998-10-29 2000-05-11 Koninklijke Philips Electronics N.V. X-ray diffraction apparatus with an x-ray optical reference channel
JP6305247B2 (ja) * 2014-06-13 2018-04-04 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers
US3983397A (en) * 1972-05-08 1976-09-28 Albert Richard D Selectable wavelength X-ray source
JPS5139188A (en) * 1974-09-30 1976-04-01 Horiba Ltd Hibunsangatakeikoxsenbunsekisochi
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
FI73083C (fi) * 1979-02-09 1987-08-10 Martin Marietta Corp Portabel anordning foer elementaranalys.
JPS5758300U (enrdf_load_stackoverflow) * 1980-09-22 1982-04-06

Also Published As

Publication number Publication date
GB2127538A (en) 1984-04-11
GB8323706D0 (en) 1983-10-05
DE3334458A1 (de) 1984-06-07
NL8302740A (nl) 1984-04-16
FR2533794A1 (fr) 1984-03-30
JPS5967449A (ja) 1984-04-17
JPS6259258B2 (enrdf_load_stackoverflow) 1987-12-10
GB2127538B (en) 1986-06-25

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Legal Events

Date Code Title Description
ST Notification of lapse