FR2531230B1 - - Google Patents

Info

Publication number
FR2531230B1
FR2531230B1 FR8213114A FR8213114A FR2531230B1 FR 2531230 B1 FR2531230 B1 FR 2531230B1 FR 8213114 A FR8213114 A FR 8213114A FR 8213114 A FR8213114 A FR 8213114A FR 2531230 B1 FR2531230 B1 FR 2531230B1
Authority
FR
France
Prior art keywords
card
tested
microprocessor
test
basic unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8213114A
Other languages
English (en)
Other versions
FR2531230A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xerox SAS
Original Assignee
Rank Xerox SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rank Xerox SA filed Critical Rank Xerox SA
Priority to FR8213114A priority Critical patent/FR2531230A1/fr
Priority to US06/516,261 priority patent/US4622647A/en
Publication of FR2531230A1 publication Critical patent/FR2531230A1/fr
Application granted granted Critical
Publication of FR2531230B1 publication Critical patent/FR2531230B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
FR8213114A 1982-07-27 1982-07-27 Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble Granted FR2531230A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR8213114A FR2531230A1 (fr) 1982-07-27 1982-07-27 Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble
US06/516,261 US4622647A (en) 1982-07-27 1983-07-22 System for the automatic testing of printed circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8213114A FR2531230A1 (fr) 1982-07-27 1982-07-27 Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble

Publications (2)

Publication Number Publication Date
FR2531230A1 FR2531230A1 (fr) 1984-02-03
FR2531230B1 true FR2531230B1 (fr) 1985-05-17

Family

ID=9276369

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8213114A Granted FR2531230A1 (fr) 1982-07-27 1982-07-27 Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble

Country Status (2)

Country Link
US (1) US4622647A (fr)
FR (1) FR2531230A1 (fr)

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JPS60263807A (ja) * 1984-06-12 1985-12-27 Dainippon Screen Mfg Co Ltd プリント配線板のパタ−ン欠陥検査装置
US4641254A (en) * 1984-06-14 1987-02-03 The United States Of America As Represented By The Secretary Of The Navy Test set for a navigational satellite receiver
FR2575847A1 (fr) * 1985-01-04 1986-07-11 Pragmadyne Sarl Dispositif et procede d'assistance d'une unite de traitement informatique
JPS61169941A (ja) * 1985-01-22 1986-07-31 Sony Corp 記憶装置
IE851998L (en) * 1985-08-14 1987-05-11 Francis Anthony Purcell Test apparatus for electronic equipment
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US4736374A (en) * 1986-05-14 1988-04-05 Grumman Aerospace Corporation Automated test apparatus for use with multiple equipment
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US5126966A (en) * 1986-06-25 1992-06-30 Ikos Systems, Inc. High speed logic simulation system with stimulus engine using independent event channels selectively driven by independent stimulus programs
US4841456A (en) * 1986-09-09 1989-06-20 The Boeing Company Test system and method using artificial intelligence control
FR2605112B1 (fr) * 1986-10-10 1989-04-07 Thomson Csf Dispositif et procede de generation de vecteurs de test et procede de test pour circuit integre
US4847795A (en) * 1987-08-24 1989-07-11 Hughes Aircraft Company System for diagnosing defects in electronic assemblies
DE3820728A1 (de) * 1988-06-18 1989-12-21 Philips Patentverwaltung Verfahren zum pruefen eines festwertspeichers und anordnung zur durchfuehrung des verfahrens
US4941115A (en) * 1988-06-20 1990-07-10 International Business Machines Corporation Hand-held tester for communications ports of a data processor
US4993027A (en) * 1988-09-09 1991-02-12 Pace, Incorporated Method and apparatus for determining microprocessor kernal faults
JPH0278330A (ja) * 1988-09-14 1990-03-19 Marantz Japan Inc Ｍｃａ無線機用ｉｄ・ｒｏｍエミュレータ
US4894800A (en) * 1988-09-23 1990-01-16 Honeywell, Inc. Reconfigurable register bit-slice for self-test
US4963824A (en) * 1988-11-04 1990-10-16 International Business Machines Corporation Diagnostics of a board containing a plurality of hybrid electronic components
US4958347A (en) * 1988-11-23 1990-09-18 John Fluke Mfg. Co., Inc. Apparatus, method and data structure for validation of kernel data bus
CN1045655A (zh) * 1988-11-23 1990-09-26 约翰弗兰克制造公司 系统自动诊断的内核测试接口和方法
US4989207A (en) * 1988-11-23 1991-01-29 John Fluke Mfg. Co., Inc. Automatic verification of kernel circuitry based on analysis of memory accesses
JPH02189476A (ja) * 1989-01-19 1990-07-25 Mitsubishi Electric Corp 電子回路の測定方法
IE80813B1 (en) * 1989-05-16 1999-03-10 Formia Limited Electronic test systems
US5369593A (en) * 1989-05-31 1994-11-29 Synopsys Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
US5046033A (en) * 1989-08-09 1991-09-03 Unisys Corporation System for transferring test program information
US5067129A (en) * 1989-08-16 1991-11-19 International Business Machines Corp. Service processor tester
US5068852A (en) * 1989-11-23 1991-11-26 John Fluke Mfg. Co., Inc. Hardware enhancements for improved performance of memory emulation method
US5086271A (en) * 1990-01-12 1992-02-04 Reliability Incorporated Driver system and distributed transmission line network for driving devices under test
US5581695A (en) * 1990-05-09 1996-12-03 Applied Microsystems Corporation Source-level run-time software code debugging instrument
US5122753A (en) * 1990-12-20 1992-06-16 Microelectronics And Computer Technology Corporation Method of testing electrical components for defects
US5101150A (en) * 1991-02-22 1992-03-31 Genrad, Inc. Automatic circuit tester with separate instrument and scanner buses
US5349539A (en) * 1991-10-28 1994-09-20 Zeelan Technology, Inc. Behavioral model parameter extractor
US5323108A (en) * 1992-01-23 1994-06-21 Hewlett-Packard Company Method for generating functional tests for printed circuit boards based on pattern matching of models
US5355320A (en) * 1992-03-06 1994-10-11 Vlsi Technology, Inc. System for controlling an integrated product process for semiconductor wafers and packages
US5359547A (en) * 1992-06-26 1994-10-25 Digital Equipment Corporation Method and apparatus for testing processor-based computer modules
US5390129A (en) * 1992-07-06 1995-02-14 Motay Electronics, Inc. Universal burn-in driver system and method therefor
DE69427640T2 (de) * 1993-08-11 2002-05-16 Strauss Levi & Co Mit Sprachausgabe ausgestattetes Prüfgerät FÜR COMPUTERGESTEUERTE GERÄTE
US5541862A (en) * 1994-04-28 1996-07-30 Wandel & Goltermann Ate Systems Ltd. Emulator and digital signal analyzer
US5590136A (en) * 1995-01-25 1996-12-31 Hewlett-Packard Co Method for creating an in-circuit test for an electronic device
IES81009B2 (en) * 1998-04-17 1999-09-22 Formia Ltd An electronic test system for microprocessor based boards
JP2000322283A (ja) * 1999-05-06 2000-11-24 Fujitsu Ltd 電子計算機の障害検出方法
US20020107678A1 (en) * 2001-02-07 2002-08-08 Chuan-Lin Wu Virtual computer verification platform
US6760680B2 (en) 2002-10-09 2004-07-06 Nyt Press Services Llc Testing system for printing press circuit board controllers
CN1856712A (zh) * 2003-07-23 2006-11-01 英特泰克公司 用于优化电子电路的测试和配置吞吐量的系统和方法
CN100529775C (zh) * 2005-01-10 2009-08-19 鸿富锦精密工业（深圳）有限公司 电源开关控制器
US7478281B2 (en) 2005-06-06 2009-01-13 Denniston William B System and methods for functional testing of embedded processor-based systems
CN100405313C (zh) * 2005-07-22 2008-07-23 鸿富锦精密工业（深圳）有限公司 链接控制卡测试系统及方法
CN100462935C (zh) * 2005-11-17 2009-02-18 鸿富锦精密工业（深圳）有限公司 链接控制卡测试系统及方法
CN101153889B (zh) * 2006-09-29 2010-09-22 英业达股份有限公司 故障检测系统及其方法
US11030370B2 (en) 2019-09-30 2021-06-08 International Business Machines Corporation Modular event-based performance monitoring in integrated circuit development

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US3961250A (en) * 1974-05-08 1976-06-01 International Business Machines Corporation Logic network test system with simulator oriented fault test generator
US4108358A (en) * 1977-03-22 1978-08-22 The Bendix Corporation Portable circuit tester
US4125763A (en) * 1977-07-15 1978-11-14 Fluke Trendar Corporation Automatic tester for microprocessor board
US4168527A (en) * 1978-02-17 1979-09-18 Winkler Dean A Analog and digital circuit tester
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
JPS5585264A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
FR2458850A1 (fr) * 1979-06-08 1981-01-02 Thomson Csf Moniteur de station de maintenance et station de maintenance le comprenant
US4308615A (en) * 1979-09-17 1981-12-29 Honeywell Information Systems Inc. Microprocessor based maintenance system
GB2059122B (en) * 1979-09-17 1983-11-30 Honeywell Inf Systems Microprocessor based maintenance system
US4380070A (en) * 1979-11-20 1983-04-12 Lockheed Corporation Automatic circuit identifier
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
US4500993A (en) * 1980-06-17 1985-02-19 Zehntel, Inc. In-circuit digital tester for testing microprocessor boards
FR2495350A1 (fr) * 1980-12-03 1982-06-04 Lazare Rene Testeur specifique a modules, automatise et portable
US4439858A (en) * 1981-05-28 1984-03-27 Zehntel, Inc. Digital in-circuit tester
US4455654B1 (en) * 1981-06-05 1991-04-30 Test apparatus for electronic assemblies employing a microprocessor
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices

Also Published As

Publication number Publication date
FR2531230A1 (fr) 1984-02-03
US4622647A (en) 1986-11-11

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Legal Events

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CL Concession to grant licences
TP Transmission of property
ST Notification of lapse