FR2506019A1 - Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi - Google Patents

Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi Download PDF

Info

Publication number
FR2506019A1
FR2506019A1 FR8109613A FR8109613A FR2506019A1 FR 2506019 A1 FR2506019 A1 FR 2506019A1 FR 8109613 A FR8109613 A FR 8109613A FR 8109613 A FR8109613 A FR 8109613A FR 2506019 A1 FR2506019 A1 FR 2506019A1
Authority
FR
France
Prior art keywords
energy
photons
sample
electrons
network
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8109613A
Other languages
English (en)
French (fr)
Other versions
FR2506019B1 (en, 2012
Inventor
Robert Baptist
Gerard Chauvet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR8109613A priority Critical patent/FR2506019A1/fr
Priority to US06/373,240 priority patent/US4472634A/en
Priority to EP82400834A priority patent/EP0065456B1/fr
Priority to DE8282400834T priority patent/DE3272985D1/de
Publication of FR2506019A1 publication Critical patent/FR2506019A1/fr
Application granted granted Critical
Publication of FR2506019B1 publication Critical patent/FR2506019B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2254—Measuring cathodoluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0568—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction spectro-diffractometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/08—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring cathode luminescence (U.V.)

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR8109613A 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi Granted FR2506019A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR8109613A FR2506019A1 (fr) 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi
US06/373,240 US4472634A (en) 1981-05-14 1982-04-29 Apparatus for determining the density of unoccupied electronic states of a material
EP82400834A EP0065456B1 (fr) 1981-05-14 1982-05-06 Dispositif pour déterminer la densité des états électroniques inoccupés d'un matériau situés au-dessus du niveau de Fermi
DE8282400834T DE3272985D1 (en) 1981-05-14 1982-05-06 Device for the determination of the density of non-occupied electronic states of a material below the fermi level

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8109613A FR2506019A1 (fr) 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi

Publications (2)

Publication Number Publication Date
FR2506019A1 true FR2506019A1 (fr) 1982-11-19
FR2506019B1 FR2506019B1 (en, 2012) 1984-07-13

Family

ID=9258441

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8109613A Granted FR2506019A1 (fr) 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi

Country Status (4)

Country Link
US (1) US4472634A (en, 2012)
EP (1) EP0065456B1 (en, 2012)
DE (1) DE3272985D1 (en, 2012)
FR (1) FR2506019A1 (en, 2012)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3741675A1 (de) * 1987-12-09 1989-06-22 Kernforschungsanlage Juelich Detektor fuer bremsstrahlungs-isochromaten-spektroskopie
JP2982262B2 (ja) * 1990-09-10 1999-11-22 株式会社島津製作所 逆光電子分光装置
JP2636113B2 (ja) * 1992-03-26 1997-07-30 広島大学長 帯域フィルター型逆光電子分光検出装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2428836A1 (fr) * 1978-06-12 1980-01-11 Philips Nv Spectrometre de rontgen

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4253765A (en) * 1978-02-22 1981-03-03 Hitachi, Ltd. Multi-wavelength spectrophotometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2428836A1 (fr) * 1978-06-12 1980-01-11 Philips Nv Spectrometre de rontgen

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
EXBK/79 *
EXRV/73 *

Also Published As

Publication number Publication date
EP0065456A3 (en) 1983-08-03
EP0065456B1 (fr) 1986-09-03
US4472634A (en) 1984-09-18
DE3272985D1 (en) 1986-10-09
EP0065456A2 (fr) 1982-11-24
FR2506019B1 (en, 2012) 1984-07-13

Similar Documents

Publication Publication Date Title
Wainfan et al. Preliminary results on photoelectric yields of Pt and Ta and on photoionization in O2 and N2 in the vacuum ultraviolet
Pardede et al. Spectrochemical analysis of metal elements electrodeposited from water samples by laser-induced shock wave plasma spectroscopy
FR2501373A1 (fr) Systeme d'analyse spectroscopique par absorption atomique
Kommandeur et al. Photoconductivity of Anthracene. IV. Bulk Photoconduction in Single Crystals
FR2506019A1 (fr) Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi
FR2605739A1 (fr) Procede de balayage en spirale par un faisceau de particules
FR3062925A1 (fr) Procede d'etalonnage d'un spectrometre gamma et dispositif permettant un tel etalonnage
EP0747729A1 (fr) Procédé de contrÔle en temps réel du débit de dose de rayonnements ionisants et dispositif pour sa mise en oeuvre
Butler et al. Emission spectral analysis with the glow discharge source and a resonance detector
JP2982262B2 (ja) 逆光電子分光装置
EP0107686B1 (fr) Procede et dispositif de production de photons dans la gamme des longueurs d'ondes ultraviolettes
JP3525674B2 (ja) 仕事関数またはイオン化ポテンシャル測定装置およびその方法
CA1245374A (fr) Generateur de rayon x
Fujikawa et al. In situ calibration of a flat-field grazing incidence spectrograph with an x-ray charge-coupled device camera using a transmission grating and a laser-produced plasma for x-ray laser research
Djulgerova et al. Laser-assisted photoelectric optogalvanic analysis of thin films and surfaces using a hollow-cathode glow discharge
FR2601778A1 (fr) Dispositif de dosage elementaire en milieu radioactif par fluorescence induite par laser dans un plasma haute frequence
Maeda et al. GaSb-growth study by realtime crystal-growth analysis system using synchrotron radiation photoelectron spectroscopy
Marrodán Undagoitia et al. Spectroscopy of electron-induced fluorescence in organic liquid scintillators
Salin et al. Performance of a time multiplex multiple slit multielement flame atomic absorption spectrometer
FR2549222A1 (fr) Spectrometre
FR2602058A1 (fr) Detecteur a gaz utilisant une anode a microbandes
FR2504264A1 (fr) Procede de balayage d'un spectre, appareil pour sa mise en oeuvre et son mode d'utilisation
JPH09113229A (ja) 膜厚管理装置及び膜厚検出方法
Wong et al. Measuring subnanosecond fluorescent lifetimes using photon counting
Wallace et al. Testing the optical components for the NIF time-resolved soft x-ray opacity spectrometer (OpSpecTR)

Legal Events

Date Code Title Description
ST Notification of lapse