FR2506019B1 - - Google Patents

Info

Publication number
FR2506019B1
FR2506019B1 FR8109613A FR8109613A FR2506019B1 FR 2506019 B1 FR2506019 B1 FR 2506019B1 FR 8109613 A FR8109613 A FR 8109613A FR 8109613 A FR8109613 A FR 8109613A FR 2506019 B1 FR2506019 B1 FR 2506019B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8109613A
Other languages
French (fr)
Other versions
FR2506019A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR8109613A priority Critical patent/FR2506019A1/fr
Priority to US06/373,240 priority patent/US4472634A/en
Priority to EP82400834A priority patent/EP0065456B1/fr
Priority to DE8282400834T priority patent/DE3272985D1/de
Publication of FR2506019A1 publication Critical patent/FR2506019A1/fr
Application granted granted Critical
Publication of FR2506019B1 publication Critical patent/FR2506019B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2254—Measuring cathodoluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0568—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction spectro-diffractometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/08—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring cathode luminescence (U.V.)

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR8109613A 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi Granted FR2506019A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR8109613A FR2506019A1 (fr) 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi
US06/373,240 US4472634A (en) 1981-05-14 1982-04-29 Apparatus for determining the density of unoccupied electronic states of a material
EP82400834A EP0065456B1 (fr) 1981-05-14 1982-05-06 Dispositif pour déterminer la densité des états électroniques inoccupés d'un matériau situés au-dessus du niveau de Fermi
DE8282400834T DE3272985D1 (en) 1981-05-14 1982-05-06 Device for the determination of the density of non-occupied electronic states of a material below the fermi level

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8109613A FR2506019A1 (fr) 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi

Publications (2)

Publication Number Publication Date
FR2506019A1 FR2506019A1 (fr) 1982-11-19
FR2506019B1 true FR2506019B1 (en, 2012) 1984-07-13

Family

ID=9258441

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8109613A Granted FR2506019A1 (fr) 1981-05-14 1981-05-14 Dispositif pour determiner la densite des etats electroniques inoccupes d'un materiau situes au-dessus du niveau de fermi

Country Status (4)

Country Link
US (1) US4472634A (en, 2012)
EP (1) EP0065456B1 (en, 2012)
DE (1) DE3272985D1 (en, 2012)
FR (1) FR2506019A1 (en, 2012)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3741675A1 (de) * 1987-12-09 1989-06-22 Kernforschungsanlage Juelich Detektor fuer bremsstrahlungs-isochromaten-spektroskopie
JP2982262B2 (ja) * 1990-09-10 1999-11-22 株式会社島津製作所 逆光電子分光装置
JP2636113B2 (ja) * 1992-03-26 1997-07-30 広島大学長 帯域フィルター型逆光電子分光検出装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4253765A (en) * 1978-02-22 1981-03-03 Hitachi, Ltd. Multi-wavelength spectrophotometer
NL7806330A (nl) * 1978-06-12 1979-12-14 Philips Nv Roentgenspektrometer.

Also Published As

Publication number Publication date
EP0065456A3 (en) 1983-08-03
EP0065456B1 (fr) 1986-09-03
US4472634A (en) 1984-09-18
DE3272985D1 (en) 1986-10-09
FR2506019A1 (fr) 1982-11-19
EP0065456A2 (fr) 1982-11-24

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Legal Events

Date Code Title Description
ST Notification of lapse