FR2478421B1 - - Google Patents

Info

Publication number
FR2478421B1
FR2478421B1 FR8102254A FR8102254A FR2478421B1 FR 2478421 B1 FR2478421 B1 FR 2478421B1 FR 8102254 A FR8102254 A FR 8102254A FR 8102254 A FR8102254 A FR 8102254A FR 2478421 B1 FR2478421 B1 FR 2478421B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8102254A
Other languages
French (fr)
Other versions
FR2478421A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of FR2478421A1 publication Critical patent/FR2478421A1/fr
Application granted granted Critical
Publication of FR2478421B1 publication Critical patent/FR2478421B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/20Dry etching; Plasma etching; Reactive-ion etching
    • H10P50/26Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials
    • H10P50/264Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means
    • H10P50/266Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only
    • H10P50/267Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only using plasmas
    • H10P50/268Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only using plasmas of silicon-containing layers
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/53After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone involving the removal of at least part of the materials of the treated article, e.g. etching, drying of hardened concrete
    • C04B41/5338Etching
    • C04B41/5346Dry etching
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/20Dry etching; Plasma etching; Reactive-ion etching
    • H10P50/24Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials
    • H10P50/242Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials of Group IV materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Materials Engineering (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
FR8102254A 1980-02-06 1981-02-05 Procede de fabrication de dispositifs microminiatures par attaque reactive du silicium avec bombardement Granted FR2478421A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11910380A 1980-02-06 1980-02-06

Publications (2)

Publication Number Publication Date
FR2478421A1 FR2478421A1 (fr) 1981-09-18
FR2478421B1 true FR2478421B1 (enExample) 1983-12-23

Family

ID=22382565

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8102254A Granted FR2478421A1 (fr) 1980-02-06 1981-02-05 Procede de fabrication de dispositifs microminiatures par attaque reactive du silicium avec bombardement

Country Status (6)

Country Link
JP (1) JPS56130928A (enExample)
CA (1) CA1148895A (enExample)
DE (1) DE3104024A1 (enExample)
FR (1) FR2478421A1 (enExample)
GB (1) GB2068286B (enExample)
NL (1) NL190592C (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3606959A1 (de) * 1986-03-04 1987-09-10 Leybold Heraeus Gmbh & Co Kg Vorrichtung zur plasmabehandlung von substraten in einer durch hochfrequenz angeregten plasmaentladung
JPH0831439B2 (ja) * 1986-03-05 1996-03-27 株式会社東芝 反応性イオンエッチング方法
DE3935189A1 (de) * 1989-10-23 1991-05-08 Leybold Ag Verfahren und vorrichtung zur behandlung von werkstuecken durch reaktives ionenaetzen
KR930008580B1 (ko) * 1990-06-22 1993-09-09 현대전자산업 주식회사 표면적이 극대화된 실리콘층 및 그 제조방법

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4104086A (en) * 1977-08-15 1978-08-01 International Business Machines Corporation Method for forming isolated regions of silicon utilizing reactive ion etching
US4226665A (en) * 1978-07-31 1980-10-07 Bell Telephone Laboratories, Incorporated Device fabrication by plasma etching

Also Published As

Publication number Publication date
FR2478421A1 (fr) 1981-09-18
NL190592C (nl) 1994-05-02
DE3104024A1 (de) 1981-12-17
DE3104024C2 (enExample) 1988-08-18
NL190592B (nl) 1993-12-01
JPS56130928A (en) 1981-10-14
GB2068286B (en) 1984-07-11
CA1148895A (en) 1983-06-28
NL8100560A (nl) 1981-09-01
GB2068286A (en) 1981-08-12

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