FR2443745A1 - Localisateur d'impacts de particules ionisantes a l'etat solide et tube a image comportant un tel localisateur - Google Patents

Localisateur d'impacts de particules ionisantes a l'etat solide et tube a image comportant un tel localisateur

Info

Publication number
FR2443745A1
FR2443745A1 FR7834226A FR7834226A FR2443745A1 FR 2443745 A1 FR2443745 A1 FR 2443745A1 FR 7834226 A FR7834226 A FR 7834226A FR 7834226 A FR7834226 A FR 7834226A FR 2443745 A1 FR2443745 A1 FR 2443745A1
Authority
FR
France
Prior art keywords
localiser
substrate
layers
halves
opposite sides
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7834226A
Other languages
English (en)
Inventor
Guy Roziere
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR7834226A priority Critical patent/FR2443745A1/fr
Publication of FR2443745A1 publication Critical patent/FR2443745A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J31/00—Cathode ray tubes; Electron beam tubes
    • H01J31/02—Cathode ray tubes; Electron beam tubes having one or more output electrodes which may be impacted selectively by the ray or beam, and onto, from, or over which the ray or beam may be deflected or de-focused
    • H01J31/06—Cathode ray tubes; Electron beam tubes having one or more output electrodes which may be impacted selectively by the ray or beam, and onto, from, or over which the ray or beam may be deflected or de-focused with more than two output electrodes, e.g. for multiple switching or counting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
    • H01L31/117—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation of the bulk effect radiation detector type, e.g. Ge-Li compensated PIN gamma-ray detectors

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Vessels, Lead-In Wires, Accessory Apparatuses For Cathode-Ray Tubes (AREA)

Abstract

L'invention concerne un localisateur d'impacts ionisants à l'état solide et le tube qui l'incorpore. Sur les deux faces opposées parallèles d'un substrat semi-conducteur 1, sont implantées des couches de matériaux présentant des conductibilités de types opposés. La couche visible sur le dessin, exposée aux impacts ionisants, porte le repère 30. Des moyens assurent la polarisation en inverse de la diode ainsi formée Dans le localisateur de l'invention, ces couches sont sans résistance, mais divisée chacune en deux parties 36, 38, isolées électriquement l'une de l'autre par une ligne 33, 34, 35 traversant le champ utile, et disposée de façon telle que l'impact des particules ionisantes ait toujours certaines de ses portions dans l'une des parties et les autres dans l'autre. La position de l'impact est déterminée à partir des signaux de chacune des parties de chaque couche recueillis sur les contacts tels que 31 et 32. Application, dans un tube à image, à la radiologie médicale.
FR7834226A 1978-12-05 1978-12-05 Localisateur d'impacts de particules ionisantes a l'etat solide et tube a image comportant un tel localisateur Withdrawn FR2443745A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7834226A FR2443745A1 (fr) 1978-12-05 1978-12-05 Localisateur d'impacts de particules ionisantes a l'etat solide et tube a image comportant un tel localisateur

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7834226A FR2443745A1 (fr) 1978-12-05 1978-12-05 Localisateur d'impacts de particules ionisantes a l'etat solide et tube a image comportant un tel localisateur

Publications (1)

Publication Number Publication Date
FR2443745A1 true FR2443745A1 (fr) 1980-07-04

Family

ID=9215699

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7834226A Withdrawn FR2443745A1 (fr) 1978-12-05 1978-12-05 Localisateur d'impacts de particules ionisantes a l'etat solide et tube a image comportant un tel localisateur

Country Status (1)

Country Link
FR (1) FR2443745A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2495840A1 (fr) * 1980-09-02 1982-06-11 Thomson Csf Ensemble localisateur d'impacts ionisants a l'etat solide, a partage de charges, et tube a image muni d'un tel ensemble
EP0175369A2 (fr) * 1984-09-19 1986-03-26 Fuji Electric Co., Ltd. Détecteur de rayonnement à semi-conducteur

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2255702A1 (fr) * 1973-12-21 1975-07-18 Commissariat Energie Atomique
US3934143A (en) * 1972-11-10 1976-01-20 Siemens Aktiengesellschaft Detector for ionizing radiation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3934143A (en) * 1972-11-10 1976-01-20 Siemens Aktiengesellschaft Detector for ionizing radiation
FR2255702A1 (fr) * 1973-12-21 1975-07-18 Commissariat Energie Atomique

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2495840A1 (fr) * 1980-09-02 1982-06-11 Thomson Csf Ensemble localisateur d'impacts ionisants a l'etat solide, a partage de charges, et tube a image muni d'un tel ensemble
EP0175369A2 (fr) * 1984-09-19 1986-03-26 Fuji Electric Co., Ltd. Détecteur de rayonnement à semi-conducteur
EP0175369A3 (en) * 1984-09-19 1986-09-03 Fuji Electric Co., Ltd. Semiconductor radiation detector

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Legal Events

Date Code Title Description
ST Notification of lapse