FR2425148A1 - - Google Patents
Info
- Publication number
- FR2425148A1 FR2425148A1 FR7902318A FR7902318A FR2425148A1 FR 2425148 A1 FR2425148 A1 FR 2425148A1 FR 7902318 A FR7902318 A FR 7902318A FR 7902318 A FR7902318 A FR 7902318A FR 2425148 A1 FR2425148 A1 FR 2425148A1
- Authority
- FR
- France
- Prior art keywords
- contact
- probe
- arm
- piezo
- glued
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002305 electric material Substances 0.000 abstract 1
- 239000000523 sample Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/16—Measuring force or stress, in general using properties of piezoelectric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
L'INVENTION CONCERNE UN PROCEDE ET UN APPAREIL DE DETERMINATION DU CONTACT D'UNE SONDE AVEC UNE SURFACE. LA SONDE COMPORTE UNE AIGUILLE DE CONTACT FIXEE SUR UN BRAS REGLABLE. UNE MATIERE PIEZO-ELECTRIQUE EST COLLEE SUR LE BRAS ET DELIVRE UN SIGNAL AU MOMENT OU LA POINTE DE L'AIGUILLE ENTRE EN CONTACT AVEC UNE SURFACE. UN DETECTEUR A PLUSIEURS CANAUX RECOIT LES SIGNAUX DE PLUSIEURS SONDES ET PERMET DE DETERMINER SI ELLES SONT TOUTES EN CONTACT AVEC LA SURFACE. L'INVENTION S'APPLIQUE NOTAMMENT AU CONTROLE DES PLAQUETTES SEMI-CONDUCTRICES SUR LESQUELLES SONT FORMEES DES PASTILLES DE CIRCUITS INTEGRES.THE INVENTION CONCERNS A METHOD AND AN APPARATUS FOR DETERMINING THE CONTACT OF A PROBE WITH A SURFACE. THE PROBE CONTAINS A CONTACT NEEDLE ATTACHED TO AN ADJUSTABLE ARM. A PIEZO-ELECTRIC MATERIAL IS GLUED TO THE ARM AND DELIVERS A SIGNAL WHEN THE NEEDLE TIP COMES INTO CONTACT WITH A SURFACE. A MULTI-CHANNEL DETECTOR RECEIVES SIGNALS FROM SEVERAL PROBES AND DETERMINES IF THEY ARE ALL IN CONTACT WITH THE SURFACE. THE INVENTION APPLIES IN PARTICULAR TO THE CONTROL OF SEMICONDUCTOR PLATES ON WHICH ARE FORMED INTEGRATED CIRCUIT PADS.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US87356478A | 1978-01-30 | 1978-01-30 | |
US05/893,118 US4195259A (en) | 1978-04-04 | 1978-04-04 | Multiprobe test system and method of using same |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2425148A1 true FR2425148A1 (en) | 1979-11-30 |
FR2425148B1 FR2425148B1 (en) | 1985-06-28 |
Family
ID=27128303
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7902318A Expired FR2425148B1 (en) | 1978-01-30 | 1979-01-30 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS54145482A (en) |
DE (1) | DE2903517A1 (en) |
FR (1) | FR2425148B1 (en) |
GB (2) | GB2014315B (en) |
IT (1) | IT1113297B (en) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3068052D1 (en) * | 1979-11-05 | 1984-07-05 | Texas Instruments Inc | Probe assembly for testing integrated circuits |
JPS58164236U (en) * | 1982-04-27 | 1983-11-01 | 日本電気ホームエレクトロニクス株式会社 | Semiconductor wafer characteristic measurement equipment |
IL79820A0 (en) * | 1985-09-26 | 1986-11-30 | Tektronix Inc | Wafer probe head,and method of assembling same |
US4758785A (en) * | 1986-09-03 | 1988-07-19 | Tektronix, Inc. | Pressure control apparatus for use in an integrated circuit testing station |
US4673839A (en) * | 1986-09-08 | 1987-06-16 | Tektronix, Inc. | Piezoelectric pressure sensing apparatus for integrated circuit testing stations |
US5012186A (en) * | 1990-06-08 | 1991-04-30 | Cascade Microtech, Inc. | Electrical probe with contact force protection |
EP0547251A1 (en) * | 1991-12-14 | 1993-06-23 | International Business Machines Corporation | A method for testing a micro circuit |
DE19952943C2 (en) * | 1999-11-03 | 2003-07-03 | Infineon Technologies Ag | Needle card adjustment device for the planarization of needle sets of a needle card |
DE20114544U1 (en) | 2000-12-04 | 2002-02-21 | Cascade Microtech Inc | wafer probe |
US7633306B2 (en) | 2003-03-14 | 2009-12-15 | Rudolph Technologies, Inc. | System and method of measuring probe float |
US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
JP2008512680A (en) | 2004-09-13 | 2008-04-24 | カスケード マイクロテック インコーポレイテッド | Double-sided probing structure |
US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
CN107015137B (en) * | 2017-05-26 | 2023-12-08 | 深圳市赛伦北斗科技有限责任公司 | Circuit board detection device, system and method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1063381A (en) * | 1963-01-18 | 1967-03-30 | Wilmot Breeden Ltd | Improvements in or relating to surface testing apparatus |
FR2040836A5 (en) * | 1965-08-11 | 1971-01-22 | Transistor Automation | |
US3810017A (en) * | 1972-05-15 | 1974-05-07 | Teledyne Inc | Precision probe for testing micro-electronic units |
US3849728A (en) * | 1973-08-21 | 1974-11-19 | Wentworth Labor Inc | Fixed point probe card and an assembly and repair fixture therefor |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5178692A (en) * | 1974-12-29 | 1976-07-08 | Sony Corp |
-
1979
- 1979-01-29 GB GB7903073A patent/GB2014315B/en not_active Expired
- 1979-01-29 IT IT47813/79A patent/IT1113297B/en active
- 1979-01-29 GB GB8127051A patent/GB2094479B/en not_active Expired
- 1979-01-30 FR FR7902318A patent/FR2425148B1/fr not_active Expired
- 1979-01-30 DE DE19792903517 patent/DE2903517A1/en not_active Withdrawn
- 1979-01-30 JP JP961479A patent/JPS54145482A/en active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1063381A (en) * | 1963-01-18 | 1967-03-30 | Wilmot Breeden Ltd | Improvements in or relating to surface testing apparatus |
FR2040836A5 (en) * | 1965-08-11 | 1971-01-22 | Transistor Automation | |
US3810017A (en) * | 1972-05-15 | 1974-05-07 | Teledyne Inc | Precision probe for testing micro-electronic units |
US3849728A (en) * | 1973-08-21 | 1974-11-19 | Wentworth Labor Inc | Fixed point probe card and an assembly and repair fixture therefor |
Non-Patent Citations (1)
Title |
---|
EXBK/77 * |
Also Published As
Publication number | Publication date |
---|---|
JPS54145482A (en) | 1979-11-13 |
IT1113297B (en) | 1986-01-20 |
GB2014315B (en) | 1983-02-02 |
DE2903517A1 (en) | 1979-08-02 |
GB2014315A (en) | 1979-08-22 |
JPH039425B2 (en) | 1991-02-08 |
IT7947813A0 (en) | 1979-01-29 |
GB2094479B (en) | 1983-03-16 |
FR2425148B1 (en) | 1985-06-28 |
GB2094479A (en) | 1982-09-15 |
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