FR2402303B1 - - Google Patents
Info
- Publication number
- FR2402303B1 FR2402303B1 FR7824993A FR7824993A FR2402303B1 FR 2402303 B1 FR2402303 B1 FR 2402303B1 FR 7824993 A FR7824993 A FR 7824993A FR 7824993 A FR7824993 A FR 7824993A FR 2402303 B1 FR2402303 B1 FR 2402303B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/134—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being in grooves in the semiconductor body
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/147—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being multilayered
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6304—Formation by oxidation, e.g. oxidation of the substrate
- H10P14/6306—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6322—Formation by thermal treatments
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6928—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing silicon and at least one metal element, e.g. metal silicate based insulators or metal silicon oxynitrides
- H10P14/6929—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing silicon and at least one metal element, e.g. metal silicate based insulators or metal silicon oxynitrides the material containing aluminium, e.g. AlSiOx
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2739762A DE2739762C2 (de) | 1977-09-03 | 1977-09-03 | Verfahren zur Passivierung von Halbleiterkörpern |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2402303A1 FR2402303A1 (fr) | 1979-03-30 |
| FR2402303B1 true FR2402303B1 (enExample) | 1984-06-01 |
Family
ID=6018047
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7824993A Granted FR2402303A1 (fr) | 1977-09-03 | 1978-08-30 | Traitement de surface de stabilisation de corps semi-conducteurs |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US4202916A (enExample) |
| JP (1) | JPS5444476A (enExample) |
| BR (1) | BR7805571A (enExample) |
| CH (1) | CH631291A5 (enExample) |
| DE (1) | DE2739762C2 (enExample) |
| FR (1) | FR2402303A1 (enExample) |
| GB (1) | GB2003662B (enExample) |
| IT (1) | IT1098444B (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2071411B (en) * | 1980-03-07 | 1983-12-21 | Philips Electronic Associated | Passivating p-n junction devices |
| IN154896B (enExample) * | 1980-07-10 | 1984-12-22 | Westinghouse Electric Corp | |
| JPS57120341A (en) * | 1981-01-17 | 1982-07-27 | Toshiba Corp | Glass passivation semiconductor device |
| US4506435A (en) * | 1981-07-27 | 1985-03-26 | International Business Machines Corporation | Method for forming recessed isolated regions |
| US4544576A (en) * | 1981-07-27 | 1985-10-01 | International Business Machines Corporation | Deep dielectric isolation by fused glass |
| DE3247938A1 (de) * | 1982-12-24 | 1984-07-05 | SEMIKRON Gesellschaft für Gleichrichterbau u. Elektronik mbH, 8500 Nürnberg | Halbleiterbauelement hoher sperrspannungsbelastbarkeit |
| US4515668A (en) * | 1984-04-25 | 1985-05-07 | Honeywell Inc. | Method of forming a dielectric layer comprising a gettering material |
| FR2631488B1 (fr) * | 1988-05-10 | 1990-07-27 | Thomson Hybrides Microondes | Circuit integre hyperfrequence de type planar, comportant au moins un composant mesa, et son procede de fabrication |
| US5176771A (en) * | 1991-12-23 | 1993-01-05 | Hughes Aircraft Company | Multilayer ceramic tape substrate having cavities formed in the upper layer thereof and method of fabricating the same by printing and delamination |
| US5882986A (en) * | 1998-03-30 | 1999-03-16 | General Semiconductor, Inc. | Semiconductor chips having a mesa structure provided by sawing |
| WO2003025982A1 (en) * | 2001-09-17 | 2003-03-27 | Advion Biosciences, Inc. | Uniform patterning for deep reactive ion etching |
| DE102006013076A1 (de) * | 2006-03-22 | 2007-09-27 | Semikron Elektronik Gmbh & Co. Kg | Leistungshalbleiterbauelement mit Passivierungsschicht und zugehöriges Herstellungsverfahren |
| US20100025809A1 (en) | 2008-07-30 | 2010-02-04 | Trion Technology, Inc. | Integrated Circuit and Method of Forming Sealed Trench Junction Termination |
| US8163624B2 (en) * | 2008-07-30 | 2012-04-24 | Bowman Ronald R | Discrete semiconductor device and method of forming sealed trench junction termination |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1522201A (fr) * | 1961-07-06 | 1968-04-26 | Procédé de fabrication de dispositifs semi-conducteurs à jonction | |
| US3212921A (en) * | 1961-09-29 | 1965-10-19 | Ibm | Method of forming a glass film on an object and the product produced thereby |
| US3303399A (en) * | 1964-01-30 | 1967-02-07 | Ibm | Glasses for encapsulating semiconductor devices and resultant devices |
| US3546013A (en) * | 1961-09-29 | 1970-12-08 | Ibm | Method of providing protective coverings for semiconductors |
| DE1260574B (de) * | 1966-03-30 | 1968-02-08 | Telefunken Patent | Verfahren zur Herstellung von Glasschichten oder anderen Isolierschichten auf Substratoberflaechen |
| US3542572A (en) * | 1968-06-24 | 1970-11-24 | Corning Glass Works | Germania-silica glasses |
| GB1283769A (en) * | 1968-10-09 | 1972-08-02 | Hitachi Ltd | Semiconductor device having a passivation film and insulating films on a semiconductor substrate and method of making the same |
| US3967310A (en) * | 1968-10-09 | 1976-06-29 | Hitachi, Ltd. | Semiconductor device having controlled surface charges by passivation films formed thereon |
| US3632434A (en) * | 1969-01-21 | 1972-01-04 | Jerald L Hutson | Process for glass passivating silicon semiconductor junctions |
| GB1250099A (enExample) * | 1969-04-14 | 1971-10-20 | ||
| US3752701A (en) * | 1970-07-27 | 1973-08-14 | Gen Instrument Corp | Glass for coating semiconductors, and semiconductor coated therewith |
| US3895127A (en) * | 1974-04-19 | 1975-07-15 | Rca Corp | Method of selectively depositing glass on semiconductor devices |
| DE2548736C3 (de) * | 1975-10-31 | 1978-05-18 | Jenaer Glaswerk Schott & Gen., 6500 Mainz | Composit-Passivierungsglas auf der Basis PbO-B2 Okskö-ab O3) m't einem thermischen Ausdehnungskoeffizienten (200-300 Grad C) zwischen 40 und 60 mal 10"7 / Grad C für Silicium-Halbleiterbauelemente mit Aufschmelztemperaturen von höchstens 600 Grad C |
| JPS5263160A (en) * | 1975-11-20 | 1977-05-25 | Toshitaka Yamagata | Forming device for arc and annulus |
| FR2335951A1 (fr) * | 1975-12-19 | 1977-07-15 | Radiotechnique Compelec | Dispositif semiconducteur a surface passivee et procede d'obtention de la structure de passivation |
| JPS535971A (en) * | 1976-07-06 | 1978-01-19 | Mitsubishi Electric Corp | Semiconductor device |
-
1977
- 1977-09-03 DE DE2739762A patent/DE2739762C2/de not_active Expired
-
1978
- 1978-08-04 CH CH833578A patent/CH631291A5/de not_active IP Right Cessation
- 1978-08-23 JP JP10192278A patent/JPS5444476A/ja active Granted
- 1978-08-25 US US05/936,885 patent/US4202916A/en not_active Expired - Lifetime
- 1978-08-28 BR BR7805571A patent/BR7805571A/pt unknown
- 1978-08-30 FR FR7824993A patent/FR2402303A1/fr active Granted
- 1978-09-01 IT IT27273/78A patent/IT1098444B/it active
- 1978-09-02 GB GB7835420A patent/GB2003662B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB2003662A (en) | 1979-03-14 |
| JPS5444476A (en) | 1979-04-07 |
| IT1098444B (it) | 1985-09-07 |
| CH631291A5 (de) | 1982-07-30 |
| US4202916A (en) | 1980-05-13 |
| BR7805571A (pt) | 1979-04-10 |
| FR2402303A1 (fr) | 1979-03-30 |
| DE2739762C2 (de) | 1982-12-02 |
| IT7827273A0 (it) | 1978-09-01 |
| GB2003662B (en) | 1982-02-24 |
| DE2739762A1 (de) | 1979-03-15 |
| JPS6120132B2 (enExample) | 1986-05-21 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |