FR2389127A1 - Appareil et procede pour normaliser les systemes utilises pour controler a l'aide de radiations des grandeurs physiques d'articles - Google Patents

Appareil et procede pour normaliser les systemes utilises pour controler a l'aide de radiations des grandeurs physiques d'articles

Info

Publication number
FR2389127A1
FR2389127A1 FR7812554A FR7812554A FR2389127A1 FR 2389127 A1 FR2389127 A1 FR 2389127A1 FR 7812554 A FR7812554 A FR 7812554A FR 7812554 A FR7812554 A FR 7812554A FR 2389127 A1 FR2389127 A1 FR 2389127A1
Authority
FR
France
Prior art keywords
articles
standardizing
radiation
check
systems used
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7812554A
Other languages
English (en)
Other versions
FR2389127B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bedford Engineering Corp
Original Assignee
Bedford Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bedford Engineering Corp filed Critical Bedford Engineering Corp
Publication of FR2389127A1 publication Critical patent/FR2389127A1/fr
Application granted granted Critical
Publication of FR2389127B1 publication Critical patent/FR2389127B1/fr
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/3416Sorting according to other particular properties according to radiation transmissivity, e.g. for light, x-rays, particle radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00Classifying, separating, and assorting solids
    • Y10S209/905Feeder conveyor holding item by suction

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

Dans le procédé et l'appareil selon l'invention, on obtient la normalisation du gain du système de contrôle en vérifiant périodiquement un objet de référence placé au point 10 en face de la source 14 et du détecteur 20 de la même manière que les articles de façon à engendrer un signal de stabilisation qui est comparé à un signal de référence. La différence éventuelle entre ces deux signaux est intégrée et le signal intégré est utilisé pour corriger le gain du système. Applications vérification de la charge des munitions.
FR7812554A 1977-04-28 1978-04-27 Appareil et procede pour normaliser les systemes utilises pour controler a l'aide de radiations des grandeurs physiques d'articles Granted FR2389127A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/792,061 US4154672A (en) 1977-04-28 1977-04-28 Standardization of penetrating radiation testing system

Publications (2)

Publication Number Publication Date
FR2389127A1 true FR2389127A1 (fr) 1978-11-24
FR2389127B1 FR2389127B1 (fr) 1984-08-24

Family

ID=25155674

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7812554A Granted FR2389127A1 (fr) 1977-04-28 1978-04-27 Appareil et procede pour normaliser les systemes utilises pour controler a l'aide de radiations des grandeurs physiques d'articles

Country Status (9)

Country Link
US (1) US4154672A (fr)
BE (1) BE866463A (fr)
CH (1) CH643359A5 (fr)
DE (1) DE2818876A1 (fr)
ES (1) ES469242A1 (fr)
FR (1) FR2389127A1 (fr)
GB (1) GB1584492A (fr)
IT (1) IT1102276B (fr)
NL (1) NL7804655A (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4331241A (en) * 1979-09-26 1982-05-25 Smirin Lev N Apparatus for thickness sorting of sheet materials
DE3330817A1 (de) * 1983-08-26 1985-03-14 Holstein Und Kappert Gmbh, 4600 Dortmund Vorrichtung zur bereitschaftsueberpruefung von inspektionsmaschinen
DE3508576C1 (de) * 1985-03-11 1986-04-30 Staudacher Horst Vorrichtung zur Objektkontrolle mittels Objektvergleich
IN165987B (fr) * 1985-09-30 1990-02-17 Cra Services
DE3624419A1 (de) * 1986-07-19 1988-01-28 Staudacher Horst Vorrichtung zur objektkontrolle
US5661249A (en) * 1994-08-11 1997-08-26 Walter Grassle Gmbh Apparatus and method for inspecting small articles
DE19511854A1 (de) * 1994-08-11 1996-02-15 Graessle Walter Gmbh Vorrichtung und Verfahren zum Prüfen von kleinen Gegenständen
JP3339390B2 (ja) * 1997-11-12 2002-10-28 株式会社村田製作所 電子部品の搬送装置
GB2337032B (en) * 1998-05-05 2002-11-06 Rapiscan Security Products Ltd Sorting apparatus
US6829055B1 (en) * 2003-08-07 2004-12-07 Delphi Technologies, Inc. Angular position sensor assembly for use with steering column
US7499821B2 (en) * 2006-01-20 2009-03-03 Airadvice, Inc. Sensor drift characteristic testing
DE202007005881U1 (de) 2007-04-24 2008-08-28 Puma Aktiengesellschaft Rudolf Dassler Sport Stollen für einen Schuh
US9002656B2 (en) * 2011-10-17 2015-04-07 Daxor Corporation Automated total body albumin analyzer
DK2802863T3 (da) * 2012-01-09 2024-02-12 Stevanato Group Denmark As Automatisk inspektion af standardobjekter
US10195647B2 (en) * 2016-01-15 2019-02-05 Key Technology, Inc Method and apparatus for sorting
CN107167300B (zh) * 2017-06-12 2019-06-28 中国科学院长春光学精密机械与物理研究所 一种led灯具寿命连续在线检测的立式转动机构

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2942113A (en) * 1958-03-18 1960-06-21 Industrial Nucleonics Corp Measuring system
DE1137565B (de) * 1958-03-03 1962-10-04 Siemens Ag Verfahren zur UEberwachung oder Regelung der Dicke oder Dichte eines an einem Messspalt vorbeigefuehrten Produktes mittels durchdringender Strahlen
FR1587501A (fr) * 1968-10-14 1970-03-20

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2885557A (en) * 1955-04-01 1959-05-05 Gen Electric Inspection apparatus
US2939960A (en) * 1955-11-21 1960-06-07 Exxon Research Engineering Co Method of quality control of catalysts by radiation scatter measurement
US3198944A (en) * 1961-11-06 1965-08-03 Gen Electric X-ray emission analyzer with standardizing system and novel switch means
US3361911A (en) * 1962-04-27 1968-01-02 Kowalczynski Jerzy Klemens System for measuring the mass of material by the detection of radiation scattered by the material
US3382975A (en) * 1966-08-24 1968-05-14 Mandrel Industries Apparatus for sorting comestible and other objects
US4009376A (en) * 1972-02-15 1977-02-22 Sangamo Weston, Inc. Method and apparatus for measuring material thickness
US3880750A (en) * 1974-06-06 1975-04-29 Owens Illinois Inc Sealing surface gauge
US4060726A (en) * 1976-10-18 1977-11-29 Beckman Instruments, Inc. Gamma counter calibration system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1137565B (de) * 1958-03-03 1962-10-04 Siemens Ag Verfahren zur UEberwachung oder Regelung der Dicke oder Dichte eines an einem Messspalt vorbeigefuehrten Produktes mittels durchdringender Strahlen
US2942113A (en) * 1958-03-18 1960-06-21 Industrial Nucleonics Corp Measuring system
FR1587501A (fr) * 1968-10-14 1970-03-20

Also Published As

Publication number Publication date
GB1584492A (en) 1981-02-11
US4154672A (en) 1979-05-15
NL7804655A (nl) 1978-10-31
BE866463A (fr) 1978-08-14
CH643359A5 (de) 1984-05-30
IT7849148A0 (it) 1978-04-28
IT1102276B (it) 1985-10-07
ES469242A1 (es) 1979-09-16
FR2389127B1 (fr) 1984-08-24
DE2818876A1 (de) 1978-11-09

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