FR2383428A1 - Procede et appareil pour mesurer avec precision le gradient de courbure d'une surface continue - Google Patents
Procede et appareil pour mesurer avec precision le gradient de courbure d'une surface continueInfo
- Publication number
- FR2383428A1 FR2383428A1 FR7806709A FR7806709A FR2383428A1 FR 2383428 A1 FR2383428 A1 FR 2383428A1 FR 7806709 A FR7806709 A FR 7806709A FR 7806709 A FR7806709 A FR 7806709A FR 2383428 A1 FR2383428 A1 FR 2383428A1
- Authority
- FR
- France
- Prior art keywords
- gradient
- continuous surface
- accurately measuring
- curvature
- beam trace
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
a. Procédé et appareil pour mesurer avec précision le gradient d'une surface continue. b. Appareil caractérisé par un moyen de déplacement du photodedecteur pour suivre la trace du faisceau jusqu'à ce que le photodédecteur et la trace du faisceau coïncident, un moyen de lecture pour lire le signal correspondant à la position de la trace du faisceau sur le plan, le déplacement entre les traces des faisceaux par rapport au point de référence et au point choisi étant transformé en la mesure du gradient du point choisi par rapport au point de référence
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2513777A JPS53110553A (en) | 1977-03-08 | 1977-03-08 | Measurement apparatus of gradients of curved faces |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2383428A1 true FR2383428A1 (fr) | 1978-10-06 |
FR2383428B1 FR2383428B1 (fr) | 1982-06-04 |
Family
ID=12157572
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7806709A Granted FR2383428A1 (fr) | 1977-03-08 | 1978-03-08 | Procede et appareil pour mesurer avec precision le gradient de courbure d'une surface continue |
Country Status (7)
Country | Link |
---|---|
US (1) | US4289400A (fr) |
JP (1) | JPS53110553A (fr) |
AU (1) | AU513414B2 (fr) |
CA (1) | CA1130554A (fr) |
DE (1) | DE2810025A1 (fr) |
FR (1) | FR2383428A1 (fr) |
GB (1) | GB1588085A (fr) |
Families Citing this family (52)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5654307A (en) * | 1979-10-09 | 1981-05-14 | Inoue Japax Res Inc | Measuring instrument for work precision |
US4390277A (en) * | 1980-07-31 | 1983-06-28 | Mcdonnell Douglas Corporation | Flat sheet scatterometer |
JPS58202751A (ja) * | 1982-05-20 | 1983-11-26 | Agency Of Ind Science & Technol | 大口径金属鏡の超精密切削加工法 |
US5293211A (en) * | 1983-10-06 | 1994-03-08 | The United States Of America As Represented By The Secretary Of The Air Force | Microreflectometer system |
JPS60218016A (ja) * | 1984-04-13 | 1985-10-31 | Kajima Corp | 掘削面形状の計測装置 |
JPH064418B2 (ja) * | 1985-10-02 | 1994-01-19 | 株式会社豊田自動織機製作所 | 低温環境で使用される車両用のパワーステアリング装置 |
JPS62138585U (fr) * | 1986-02-21 | 1987-09-01 | ||
JPS62161522U (fr) * | 1986-03-31 | 1987-10-14 | ||
US4837449A (en) * | 1988-05-16 | 1989-06-06 | Maltby Jr Robert E | Inspecting for matching of paired sheets of transparent material |
JPH01295109A (ja) * | 1988-05-23 | 1989-11-28 | Mitsubishi Electric Corp | 光学式変位測定装置 |
WO1992008104A1 (fr) * | 1990-10-24 | 1992-05-14 | Therma-Wave, Inc. | Appareil destine a produire des images topographiques de surfaces |
GB9205655D0 (en) * | 1992-03-14 | 1992-04-29 | Roke Manor Research | Improvements in or relating to surface curvature measurement |
DE69314829T2 (de) * | 1992-03-14 | 1998-03-05 | Roke Manor Research | Krümmungsmessung einer Oberfläche |
US5742383A (en) * | 1996-11-26 | 1998-04-21 | Samsung Electronics Co., Ltd. | Apparatus for measuring degree of inclination of objective lens for optical pickup |
JPH1130508A (ja) * | 1997-07-11 | 1999-02-02 | Bridgestone Sports Co Ltd | ゴルフボールの表面形状測定方法及び装置 |
US6075604A (en) * | 1998-11-10 | 2000-06-13 | International Business Machines Corporation | Apparatus for measuring curvature of magnetic read/write head sliders |
US7433027B2 (en) * | 2004-12-22 | 2008-10-07 | Novartis Ag | Apparatus and method for detecting lens thickness |
US9057595B2 (en) | 2011-11-30 | 2015-06-16 | Novartis Ag | Combination of mirror images to improve signal quality for contact lenses |
US9542016B2 (en) | 2012-09-13 | 2017-01-10 | Apple Inc. | Optical sensing mechanisms for input devices |
US9086738B2 (en) * | 2013-03-12 | 2015-07-21 | Apple Inc. | Multi-surface optical tracking system |
US9753436B2 (en) | 2013-06-11 | 2017-09-05 | Apple Inc. | Rotary input mechanism for an electronic device |
US9627163B2 (en) | 2013-08-09 | 2017-04-18 | Apple Inc. | Tactile switch for an electronic device |
JP6284372B2 (ja) * | 2014-01-21 | 2018-02-28 | オリンパス株式会社 | 走査型レーザ顕微鏡および超解像画像生成方法 |
WO2015122885A1 (fr) | 2014-02-12 | 2015-08-20 | Bodhi Technology Ventures Llc | Rejet de mauvaises rotations d'entrées rotatives de dispositifs électroniques |
CN105093802A (zh) * | 2014-05-06 | 2015-11-25 | 宁波舜宇光电信息有限公司 | 一种转光三维成像装置及其投射装置和方法 |
US9797752B1 (en) | 2014-07-16 | 2017-10-24 | Apple Inc. | Optical encoder with axially aligned sensor |
US10190891B1 (en) | 2014-07-16 | 2019-01-29 | Apple Inc. | Optical encoder for detecting rotational and axial movement |
US9797753B1 (en) | 2014-08-27 | 2017-10-24 | Apple Inc. | Spatial phase estimation for optical encoders |
US10066970B2 (en) | 2014-08-27 | 2018-09-04 | Apple Inc. | Dynamic range control for optical encoders |
US10599101B2 (en) | 2014-09-02 | 2020-03-24 | Apple Inc. | Wearable electronic device |
JP6515185B2 (ja) | 2015-03-05 | 2019-05-15 | アップル インコーポレイテッドApple Inc. | 方向依存光学特性を有する光学エンコーダを有する時計、手首装着型電子デバイス及びウェラブル電子デバイス |
KR102163612B1 (ko) | 2015-03-08 | 2020-10-08 | 애플 인크. | 회전 및 병진 가능한 입력 메커니즘을 갖는 시계 |
US9952682B2 (en) | 2015-04-15 | 2018-04-24 | Apple Inc. | Depressible keys with decoupled electrical and mechanical functionality |
US10018966B2 (en) | 2015-04-24 | 2018-07-10 | Apple Inc. | Cover member for an input mechanism of an electronic device |
US9891651B2 (en) | 2016-02-27 | 2018-02-13 | Apple Inc. | Rotatable input mechanism having adjustable output |
US10551798B1 (en) | 2016-05-17 | 2020-02-04 | Apple Inc. | Rotatable crown for an electronic device |
US10061399B2 (en) | 2016-07-15 | 2018-08-28 | Apple Inc. | Capacitive gap sensor ring for an input device |
US10019097B2 (en) | 2016-07-25 | 2018-07-10 | Apple Inc. | Force-detecting input structure |
US10664074B2 (en) | 2017-06-19 | 2020-05-26 | Apple Inc. | Contact-sensitive crown for an electronic watch |
US10962935B1 (en) | 2017-07-18 | 2021-03-30 | Apple Inc. | Tri-axis force sensor |
US11360440B2 (en) | 2018-06-25 | 2022-06-14 | Apple Inc. | Crown for an electronic watch |
US11561515B2 (en) | 2018-08-02 | 2023-01-24 | Apple Inc. | Crown for an electronic watch |
US11181863B2 (en) | 2018-08-24 | 2021-11-23 | Apple Inc. | Conductive cap for watch crown |
CN211293787U (zh) | 2018-08-24 | 2020-08-18 | 苹果公司 | 电子表 |
US11194298B2 (en) | 2018-08-30 | 2021-12-07 | Apple Inc. | Crown assembly for an electronic watch |
CN209625187U (zh) | 2018-08-30 | 2019-11-12 | 苹果公司 | 电子手表和电子设备 |
US11194299B1 (en) | 2019-02-12 | 2021-12-07 | Apple Inc. | Variable frictional feedback device for a digital crown of an electronic watch |
US11550268B2 (en) | 2020-06-02 | 2023-01-10 | Apple Inc. | Switch module for electronic crown assembly |
US11269376B2 (en) | 2020-06-11 | 2022-03-08 | Apple Inc. | Electronic device |
CN112325808B (zh) * | 2020-11-03 | 2022-05-13 | 北京石油化工学院 | 一种基于多psd的平面度实时校准补偿测量方法 |
CN113532276B (zh) * | 2021-09-13 | 2021-12-17 | 南通泰胜蓝岛海洋工程有限公司 | 一种激光曲面测量仪及其测量方法 |
CN117367309B (zh) * | 2023-12-08 | 2024-02-13 | 中国飞机强度研究所 | 一种大展弦机翼薄壁管梁突风弯曲变形测量系统及方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2111700A1 (de) * | 1971-03-11 | 1972-09-14 | Spindler & Hoyer Kg | Vorrichtung zum Messen planparalleler durchsichtiger Platten,Prismen od.dgl.auf Winkelfehler |
DE2211860A1 (de) * | 1971-03-15 | 1972-09-28 | Sira Institute | Positionierungs-Anzeigevorrichtung für eine optische Linse |
FR2310550A1 (fr) * | 1975-05-08 | 1976-12-03 | United Technologies Corp | Systeme pour relever le contour de surfaces |
US4057347A (en) * | 1975-03-26 | 1977-11-08 | Hitachi, Ltd. | Optical exposure apparatus |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3614238A (en) * | 1968-01-05 | 1971-10-19 | Itek Corp | Bright line reticle apparatus and optical alignment methods |
FR2106824A5 (fr) * | 1970-09-25 | 1972-05-05 | Cilas | |
US3857637A (en) * | 1973-01-10 | 1974-12-31 | Ppg Industries Inc | Surface distortion analyzer |
US3909131A (en) * | 1974-02-12 | 1975-09-30 | United Technologies Corp | Surface gauging by remote image tracking |
-
1977
- 1977-03-08 JP JP2513777A patent/JPS53110553A/ja active Granted
-
1978
- 1978-02-28 GB GB7908/78A patent/GB1588085A/en not_active Expired
- 1978-03-03 AU AU33817/78A patent/AU513414B2/en not_active Expired
- 1978-03-06 CA CA298,259A patent/CA1130554A/fr not_active Expired
- 1978-03-08 FR FR7806709A patent/FR2383428A1/fr active Granted
- 1978-03-08 DE DE19782810025 patent/DE2810025A1/de active Granted
-
1980
- 1980-02-07 US US06/119,354 patent/US4289400A/en not_active Expired - Lifetime
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2111700A1 (de) * | 1971-03-11 | 1972-09-14 | Spindler & Hoyer Kg | Vorrichtung zum Messen planparalleler durchsichtiger Platten,Prismen od.dgl.auf Winkelfehler |
DE2211860A1 (de) * | 1971-03-15 | 1972-09-28 | Sira Institute | Positionierungs-Anzeigevorrichtung für eine optische Linse |
US4057347A (en) * | 1975-03-26 | 1977-11-08 | Hitachi, Ltd. | Optical exposure apparatus |
FR2310550A1 (fr) * | 1975-05-08 | 1976-12-03 | United Technologies Corp | Systeme pour relever le contour de surfaces |
Non-Patent Citations (1)
Title |
---|
EXBK/73 * |
Also Published As
Publication number | Publication date |
---|---|
DE2810025C2 (fr) | 1989-02-09 |
JPS6127682B2 (fr) | 1986-06-26 |
DE2810025A1 (de) | 1978-09-21 |
CA1130554A (fr) | 1982-08-31 |
GB1588085A (en) | 1981-04-15 |
AU3381778A (en) | 1979-09-06 |
JPS53110553A (en) | 1978-09-27 |
FR2383428B1 (fr) | 1982-06-04 |
US4289400A (en) | 1981-09-15 |
AU513414B2 (en) | 1980-11-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |