FR2373052A1 - Quantification method for crystalline structure - uses probes to analyse samples of solid bodies by exploration with electron scanning microscope - Google Patents

Quantification method for crystalline structure - uses probes to analyse samples of solid bodies by exploration with electron scanning microscope

Info

Publication number
FR2373052A1
FR2373052A1 FR7736724A FR7736724A FR2373052A1 FR 2373052 A1 FR2373052 A1 FR 2373052A1 FR 7736724 A FR7736724 A FR 7736724A FR 7736724 A FR7736724 A FR 7736724A FR 2373052 A1 FR2373052 A1 FR 2373052A1
Authority
FR
France
Prior art keywords
scanning microscope
electron scanning
pictures
exploration
crystalline structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7736724A
Other languages
French (fr)
Other versions
FR2373052B1 (en
Inventor
Georgy Rakhmenovich Mirkin
Nadezhda Alexeevna Rumyantseva
Vyacheslav Nikolaevich Sokolov
Viktor Ivanovich Osipov
Mikhail Dmitrievich Tolkachev
Evgeny Solomonovich Romm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
V NEFTYANOI GEOLOGORAZ
Original Assignee
V NEFTYANOI GEOLOGORAZ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SU762428752A external-priority patent/SU729601A1/en
Priority claimed from SU762429770A external-priority patent/SU728056A1/en
Application filed by V NEFTYANOI GEOLOGORAZ filed Critical V NEFTYANOI GEOLOGORAZ
Publication of FR2373052A1 publication Critical patent/FR2373052A1/en
Application granted granted Critical
Publication of FR2373052B1 publication Critical patent/FR2373052B1/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The boundary lines of pictures of sectioned samples are tested with the electron scanning microscope and the resulting pictures added to give a summation which is used to analyse for porosity. The summation is done with a positive and negative picture of the granular structure of the sample and converted to give a view of the crystalline contour. The pairs of pictures are taken in increasing magnification and marked using characteristic morphological features. The unit consists of an electron scanning microscope (1), a picture taking block (3) whose output signals are connected to light supervision units (2, 4) a brightness control (4) and a light writing pen (5). The output signals are passed to a calculator (9) for analysis with the results stored in a data scratch pad (6).
FR7736724A 1976-12-06 1977-12-06 PROCESS FOR QUANTITATIVE ASSESSMENT OF THE STRUCTURE OF SOLID BODIES AND DEVICE FOR IMPLEMENTING SAME Expired FR2373052B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SU762428752A SU729601A1 (en) 1976-12-06 1976-12-06 Method of selection of characteristic features of objects
SU762429770A SU728056A1 (en) 1976-12-14 1976-12-14 Device for determining the value of porosity and quantitative evaluating of structure of threshold space of solid bodies
SU2454838 1977-02-20

Publications (2)

Publication Number Publication Date
FR2373052A1 true FR2373052A1 (en) 1978-06-30
FR2373052B1 FR2373052B1 (en) 1980-10-17

Family

ID=27356305

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7736724A Expired FR2373052B1 (en) 1976-12-06 1977-12-06 PROCESS FOR QUANTITATIVE ASSESSMENT OF THE STRUCTURE OF SOLID BODIES AND DEVICE FOR IMPLEMENTING SAME

Country Status (4)

Country Link
JP (1) JPS5391566A (en)
CS (1) CS196165B1 (en)
DE (1) DE2754237C2 (en)
FR (1) FR2373052B1 (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3940557A (en) * 1974-02-20 1976-02-24 Image Analysing Computers Limited Subtractive image analysis

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ADVANCES IN INSTRUMENTATION, volume 29, 1974, page 751, 1-4 (Pittsburgh), V.R. MATRICARDI: 'Applications of the scanning electron microscope to forensic sciences' *
JOURNAL OF PHYSICS D.: Applied Physics, volume 9, (1976), pages 175 - 181 (Letchworth GB). W.Krakow et al.: 'Image processing of dark-field electron micrographs' *

Also Published As

Publication number Publication date
DE2754237A1 (en) 1978-06-08
DE2754237C2 (en) 1982-05-06
CS196165B1 (en) 1980-03-31
FR2373052B1 (en) 1980-10-17
JPS5391566A (en) 1978-08-11

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