FR2352279A1 - Procede de mesure interferometrique des intervalles, epaisseurs ou planeites - Google Patents
Procede de mesure interferometrique des intervalles, epaisseurs ou planeitesInfo
- Publication number
- FR2352279A1 FR2352279A1 FR7712636A FR7712636A FR2352279A1 FR 2352279 A1 FR2352279 A1 FR 2352279A1 FR 7712636 A FR7712636 A FR 7712636A FR 7712636 A FR7712636 A FR 7712636A FR 2352279 A1 FR2352279 A1 FR 2352279A1
- Authority
- FR
- France
- Prior art keywords
- measurement system
- operates
- constant
- time period
- object area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19762622787 DE2622787C2 (de) | 1976-05-21 | 1976-05-21 | Verfahren zur interferometrischen Abstands-, Dicken- oder Ebenheitsmessung |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2352279A1 true FR2352279A1 (fr) | 1977-12-16 |
FR2352279B1 FR2352279B1 (fr) | 1979-03-09 |
Family
ID=5978663
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7712636A Granted FR2352279A1 (fr) | 1976-05-21 | 1977-04-19 | Procede de mesure interferometrique des intervalles, epaisseurs ou planeites |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPS52143052A (fr) |
DE (1) | DE2622787C2 (fr) |
FR (1) | FR2352279A1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2851750B1 (de) * | 1978-11-30 | 1980-03-06 | Ibm Deutschland | Verfahren und Vorrichtung zur Messung der Ebenheit der Rauhigkeit oder des Kruemmungsradius einer Messflaeche |
EP0066030B1 (fr) * | 1981-05-29 | 1986-08-27 | Ibm Deutschland Gmbh | Dispositif et procédé pour la mesure interférométrique de planéité |
US4560280A (en) * | 1982-08-31 | 1985-12-24 | Tokyo Shibaura Denki Kabushiki Kaisha | Apparatus for optically measuring the distance between two grating-like structures and the size of periodic pattern elements forming one of the grating-like structures |
JPS6121391A (ja) * | 1984-06-30 | 1986-01-30 | 日産車体株式会社 | 真空給液装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5533001B2 (fr) * | 1972-09-20 | 1980-08-28 |
-
1976
- 1976-05-21 DE DE19762622787 patent/DE2622787C2/de not_active Expired
-
1977
- 1977-04-19 FR FR7712636A patent/FR2352279A1/fr active Granted
- 1977-05-10 JP JP5274677A patent/JPS52143052A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
DE2622787B1 (de) | 1977-09-22 |
JPS6151241B2 (fr) | 1986-11-07 |
JPS52143052A (en) | 1977-11-29 |
DE2622787C2 (de) | 1978-05-18 |
FR2352279B1 (fr) | 1979-03-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |