FR2336738B3 - - Google Patents

Info

Publication number
FR2336738B3
FR2336738B3 FR7638964A FR7638964A FR2336738B3 FR 2336738 B3 FR2336738 B3 FR 2336738B3 FR 7638964 A FR7638964 A FR 7638964A FR 7638964 A FR7638964 A FR 7638964A FR 2336738 B3 FR2336738 B3 FR 2336738B3
Authority
FR
France
Prior art keywords
under test
unit under
pins
receive
shift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7638964A
Other languages
English (en)
French (fr)
Other versions
FR2336738A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of FR2336738A1 publication Critical patent/FR2336738A1/fr
Application granted granted Critical
Publication of FR2336738B3 publication Critical patent/FR2336738B3/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FR7638964A 1975-12-23 1976-12-23 Dispositif de formation de reception et d'essais de mots numeriques a fonction variable Granted FR2336738A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/643,746 US4102491A (en) 1975-12-23 1975-12-23 Variable function digital word generating, receiving and monitoring device

Publications (2)

Publication Number Publication Date
FR2336738A1 FR2336738A1 (fr) 1977-07-22
FR2336738B3 true FR2336738B3 (2) 1979-08-31

Family

ID=24582102

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7638964A Granted FR2336738A1 (fr) 1975-12-23 1976-12-23 Dispositif de formation de reception et d'essais de mots numeriques a fonction variable

Country Status (3)

Country Link
US (1) US4102491A (2)
DE (1) DE2658611A1 (2)
FR (1) FR2336738A1 (2)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
USRE31828E (en) * 1978-05-05 1985-02-05 Zehntel, Inc. In-circuit digital tester
US4236246A (en) * 1978-11-03 1980-11-25 Genrad, Inc. Method of and apparatus for testing electronic circuit assemblies and the like
US4404627A (en) * 1979-05-11 1983-09-13 Rca Corporation Interrupt signal generating means for data processor
US4335457A (en) * 1980-08-08 1982-06-15 Fairchild Camera & Instrument Corp. Method for semiconductor memory testing
FR2506045A1 (fr) * 1981-05-15 1982-11-19 Thomson Csf Procede et dispositif de selection de circuits integres a haute fiabilite
JPS58158566A (ja) * 1982-03-17 1983-09-20 Hitachi Ltd 検査装置
US4570262A (en) * 1983-06-22 1986-02-11 The Boeing Company Programmable universal logic driver
US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
US4727312A (en) * 1985-12-23 1988-02-23 Genrad, Inc. Circuit tester
US4791312A (en) * 1987-06-08 1988-12-13 Grumman Aerospace Corporation Programmable level shifting interface device
US4855681A (en) * 1987-06-08 1989-08-08 International Business Machines Corporation Timing generator for generating a multiplicty of timing signals having selectable pulse positions
US4814638A (en) * 1987-06-08 1989-03-21 Grumman Aerospace Corporation High speed digital driver with selectable level shifter
DE3832378C1 (2) * 1988-09-23 1989-12-07 Eurosil Electronic Gmbh, 8057 Eching, De
US5353243A (en) * 1989-05-31 1994-10-04 Synopsys Inc. Hardware modeling system and method of use
US5369593A (en) * 1989-05-31 1994-11-29 Synopsys Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
US5103169A (en) * 1989-11-15 1992-04-07 Texas Instruments Incorporated Relayless interconnections in high performance signal paths
JP2608167B2 (ja) * 1990-08-21 1997-05-07 三菱電機株式会社 Ｉｃテスタ
JP2608168B2 (ja) * 1990-08-31 1997-05-07 三菱電機株式会社 半導体試験装置
US5225772A (en) * 1990-09-05 1993-07-06 Schlumberger Technologies, Inc. Automatic test equipment system using pin slice architecture
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5321701A (en) * 1990-12-06 1994-06-14 Teradyne, Inc. Method and apparatus for a minimal memory in-circuit digital tester
US5673295A (en) * 1995-04-13 1997-09-30 Synopsis, Incorporated Method and apparatus for generating and synchronizing a plurality of digital signals
AUPN687095A0 (en) * 1995-11-30 1995-12-21 South East Queensland Electricity Corporation A switching selection device
US8295182B2 (en) * 2007-07-03 2012-10-23 Credence Systems Corporation Routed event test system and method
US8356200B2 (en) 2008-09-26 2013-01-15 Apple Inc. Negotiation between multiple processing units for switch mitigation
US8300056B2 (en) 2008-10-13 2012-10-30 Apple Inc. Seamless display migration
CN101727801B (zh) * 2008-10-31 2012-04-11 扬智科技股份有限公司 用共享接脚控制显示模块及第一电路模块运作的集成电路
US20100164966A1 (en) * 2008-12-31 2010-07-01 Apple Inc. Timing controller for graphics system
US9542914B2 (en) * 2008-12-31 2017-01-10 Apple Inc. Display system with improved graphics abilities while switching graphics processing units
US8508538B2 (en) * 2008-12-31 2013-08-13 Apple Inc. Timing controller capable of switching between graphics processing units
US8648868B2 (en) * 2010-01-06 2014-02-11 Apple Inc. Color correction to facilitate switching between graphics-processing units
US8797334B2 (en) * 2010-01-06 2014-08-05 Apple Inc. Facilitating efficient switching between graphics-processing units

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3764995A (en) * 1971-12-21 1973-10-09 Prd Electronics Inc Programmable test systems
US3832535A (en) * 1972-10-25 1974-08-27 Instrumentation Engineering Digital word generating and receiving apparatus
US3920973A (en) * 1973-01-09 1975-11-18 Westinghouse Electric Corp Method and system for testing signal transmission paths
US3916306A (en) * 1973-09-06 1975-10-28 Ibm Method and apparatus for testing high circuit density devices
US3922537A (en) * 1974-09-26 1975-11-25 Instrumentation Engineering Multiplex device for automatic test equipment
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester

Also Published As

Publication number Publication date
DE2658611A1 (de) 1977-07-14
FR2336738A1 (fr) 1977-07-22
US4102491A (en) 1978-07-25

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Legal Events

Date Code Title Description
ST Notification of lapse